Open Area Test Sites
test objects to 30MHz to 3000 MHz frequency range.
See Also: OATS, Comb Generators
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Product
VNA & SWR Site Analyzers
6050
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SWR Site Analyzer with VSWR, Return Loss and FDR (Frequency Domain Reflectometer) measurements. VNA Site Analyzer with full Vector Network Analyzer measurement suite S11 and S21 ports, Spectrum Analyzer, Power Meter and FDR (Frequency Domain Reflectometer) measurements. Quickly shift between VNA and SWR/Return Loss only.
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
Test Port Cable
The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
Area Scan Camera
Genie Nano-CXP
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Introducing Genie Nano-CXP, a camera designed for full-throttle performance. Genie Nano-CXP builds on Nano's proven, industry leading reputation and leverages a CoaXPress 6Gbps interface to deliver the maximum throughput from leading edge high resolution CMOS image sensors.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Dust Caps, Opens
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These coaxial dust caps are used for protective purposes, both from the environment & contaminants. Note: SMA, 2.92, 3.5mm dust caps are the same, as the threads are the same. Likewise, 2.4mm & 1.85mm dust caps are the same, the threads being the same. Some people use opens for calibration purposes at low frequencies, but these opens are not VNA rated, we don't measure fringing capacitance etc.
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Product
RF Testing Platform for ATx05
AT118
Test Platform
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
Test System
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
Area Scanners
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Leuze electronic GmbH + Co. KG
These devices scan their environment using a quickly-rotating laser measurement beam. This allows them to detect objects even at long distances. With an opening angle of 190° and a measurement distance of up to 65 m, the laser scanner can monitor an area of one hectare. Object detection occurs in parallel in up to 4 detection fields. Convenient configuration software RODsoft permits the parameterization of 8 detection field pairs and 4 detection fields. The status output takes place via a serial interface and an optional warning output. Should service be necessary, the device can be swapped out and put back into operation extremely quickly thanks to the ConfigPlug configuration memory.
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Product
Open Circuit Locator
A994
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The A994 is an open circuit locator for electric and telephone cables wind on the reel; it gives the position of the fault from the inside or outside end of the cable, in percentage to the total cable length. The instrument measures the ratio of the capacitances of the two sections of failed conductor using two high precision i/v converters. The advantage of this method is due to the fact that the measurement error depends almost exclusively on the dimensional inhomogeneity of the cable. The A994 has the unique feature to permit the location of fault in cables with all broken wires. This instrument locates breaks in cables with a total capacity between 2 nF and 5 uF. The distance to fault is displayed on a large LCD display.
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Product
Tabletop Single Site Test Handler
3111
Test Handler
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
Area Meter
LI-3100C
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The LI-3100C Area Meter is designed for efficient, exacting measurements of both large and small objects. User-selectable area resolution of either 1 mm2 or 0.1 mm2 is available without having to change optics. This versatility provides the flexibility necessary for diverse project requirements.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
Test Port Adapter
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Antenna Test System
ATS1000
Test System
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
Open Source Oscilloscope
Smartscope
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Everything you need to boost the development of your own electronics devices is included in this package:the SmartScope with 1M sample buffer2 analog probesthe digital probe cablea miniB USB cable to connect to your pc or laptop
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Product
Area Scan 3D Camera
3D-A5000 Series
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Cognex’s 3D-A5000 series is an area scan 3D camera designed to capture high-resolution 3D images. It features 3D LightBurst technology which rapidly acquires images to maximize throughput. High-resolution 3D images combined with industry-leading Cognex 3D vision tools enable reliable and accurate solutions to applications such as assembly verification, in-line measurement, and robotic guidance.
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Product
Area Scan Camera
Genie Nano-CL
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Introducing Genie Nano, a CMOS area scan camera that redefines low cost performance. Genie Nano starts with industry leading CMOS sensors and adds proprietary camera technology for breakthrough speed, a robust build quality for wide operating temperature, and an unmatched feature set--all at an incredible price.
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Product
Test Platforms
Test Platform
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
Memory Test Systems
T5503HS2
Test System
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
Modular Functional Test Platform
LX-OTP2
Test Platform
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Product
Xineos Large Area Detectors
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As a leader in CMOS innovation, Teledyne DALSA developed the Xineos to deliver three times more sensitivity and five times more signal-to-noise performance than other standard technologies at equal X-ray dose conditions. CMOS image detectors offer numerous advantages including the ability to record smaller image details with higher resolutions – allowing for the diagnostics of medical anomalies at earlier stages, and significantly increasing the probability of early intervention, patient recovery, and reduced treatment costs.
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Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
Hold Open Rods
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TRIUMPH is a recognized provider of telescoping hold open rods as well as fixed-length struts. These products range from simple rods to complex assemblies with single- or dual-action release collars, hydraulic damping in one or both directions, and fixed mono balls, or universal joint fittings. These products are mainly used to keep fan cowls, radomes, doors, thrust reversers, and maintenance panels in the open position.
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Product
PXI Functional Test System
U8989A
Functional Test
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
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Product
Surface Area and Porosity Analyzer
TriStar II Plus
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Micromeritics' TriStar II Plus is a state-of-the-art instrument suited for use in both quality control and research environments. Intended for laboratories that require high throughput and the highest quality data, it contains all the capabilities of the TriStar II with additional hardware and software features.
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Product
Test Instruments
Test Instrument
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
