Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
HTOL Test Systems
Test System
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Product
Electrification Testing Solutions
Test System
When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.
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Product
Environmental Control System Test Platform
Test Platform
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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Product
Digital I/O Switch Card - 96 Open Collector Channels in 12 Groups of 8 Bits Each
1260-14/14C
Switch Card
The Astronics 1260-14 Digital I/O Switch Card provides 96 open collector channels in 12 groups of eight bits each. With the open collector version each independent group can utilize a separate internal or external pull-up supply up to 32VDC.Each channel can be configured as an input or an output and individually controlled in the asynchronous mode, or be synchronous with other channels.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
Desktop PCB Test System
BOARDWALKER 9627
Test System
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
Test System
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
ARINC PC/104-Plus Interface Card
PC104P-A429
Interface Card
Alta Data Technologies’ PC104P-A429 interface module offer a variety of ARINC-419/429/575/573/717 channel configurations with software selectable RX/Tx channels, baud rates, bit encoding and word configurations (Start/Sync/Stop length, Parity, bits/word, MSB/LSB). Encode or decode almost any ARINC-429 physical layer signal.
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Product
EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Test System
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Product
Digital/Pattern/PE Card
PE32H
Interface Card
The PE32H represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE32, the PE32H offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (8 boards). The PE32H also supports deep pattern memory by offering 32M of on-board vector memory with dynamic per pin direction control and with test rates up to 66 MHz. With new 32M log memory, PE32H can capture 32 channels data or fail log.
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Product
Smart Card Reader
UTC-100P-S
Card Reader
International Standard: Comply with PC/SC 1.0 standard and EMV L1. CPU Card: Comply with ISO7816-1,2,3,T=1 and T=0 protocol. Memory Card: Synchronous 2-line, 3-line and I2C interface.
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Product
Quad Port Fiber 10GbE Ethernet PCI Express Server Adapter With Intel® XL710-BM1. Ideal For Enterprise Network Infrastructure.
PCIE-2230NP
Network Interface Card (NIC)
Intel® XL710 Controller4 10GbE SFP+ portsPCIe Gen.3 x8 host interfaceLow profile (half length) form factorsSupports 10GBASE-SR and 10GBASE-LR modulesSupports SR-IOV based virtualization
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Product
Quad Port Fiber 25GbE Ethernet PCI Express Server Adapter With Intel E810-CAM1. Ideal For Data Center Networking And Storage Area Networks.
PCIE-2531NP
Network Interface Card (NIC)
Intel E810 Controller4 25GbE SFP28 portsPCIe Gen. 4 x16 host interfaceLow profile (half length) form factorsSupports SR-IOV based virtualization
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Product
Quad Port Copper 10GBase-T Ethernet PCI Express Server Adapter With Intel® XL710-BM1. Ideal For Enterprise Network Infrastructure.
PCIE-2231NP
Network Interface Card (NIC)
Intel® XL710 Controller4 10GbE Base-T (RJ45) portsPCIe Gen.3 x8 host interfaceLow profile (half length) form factorsSupports SR-IOV based virtualization
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Product
1553 Avionics Interface 3U CPCI Card
QCP-1553 Series
Interface Card
The QCP-1553 module is a rugged, reliable, full featured, Compact PCI module designed to provide a stand-alone, MIL-STD-1553A/B interface for avionics applications. Up to four independent dual redundant MIL-STD-1553 databus streams are supported by the 3U QCP-1553 module. Additionally, the module offers full functional test, simulation, monitoring and databus analyzer functions for MILSTD-1553A/B applications. An onboard IRIG-B time code decoder and generator allows users to accurately synchronize single or multiple QCP-1553 modules to a common time source. The QCP-1553 module is available in dual or full function (RT simulation, monitoring, and bus controller) configurations.
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Product
PXI Functional Test System
U8989A
Functional Test
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
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Product
VR/AR/MR Calibration Platform
Test Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Single Site Test Handler
3210
Test Handler
Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
Smart Card Reader
UTC-300P-S
Card Reader
Dual color LED indicator. Memory Card: Synchronous 2-line, 3-line and I2C interface. CPU Card: Comply with ISO7816-1,2,3,T=1 and T=0 protocol. USB connection to UTC.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
Digital/Pattern/PE Card
PEMU32
Interface Card
The PEMU32 represents a new level of MULTIFUNCTION for PXI-based instrumentation. Based on the proven architecture of the PE32, the PEMU32 offers high voltage PMU/DPS and pin electronics in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (8 boards). The PEMU32 also supports deep pattern memory by offering 32 M of on-board vector memory with dynamic per pin direction control and with test rates up to 10 MHz.
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Product
6TL19 Off-Line Base Test Platform
H71001900
Test Platform
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Product
EOL/Functional Testing
Functional Test
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
