HTOL Test Systems

IOL & Power Cycling Test Systems

Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.

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H(3)TRB & HTGB Test Systems

SET GmbH

SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.

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Dynamic Test Systems

H3TRB | HTGB (HTGS) | RTGB (RTGS) - SET GmbH

Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.

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