Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
-
Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
Test Port Cable
The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
-
Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
-
Product
In-Line RF Test Platform
AR925
Test Platform
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
-
Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
-
Product
Embedded MXM GPU Modules with NVIDIA® Quadro® Embedded P2000
EGX-MXM-P2000
Graphics Card
The EGX-MXM-P2000 features advanced NVIDIA Quadro GPU with NVIDIA Pascal™ Architecture technology in MXM 3.1 Type A form factor. The EGX-MXM-P2000 has 768 NVIDIA CUDA cores and a peak single-precision floating-point performance of 2.3 TFLOPS. The EGX-MXM-P2000 has 4GB of GDDR5 memory and supports NVIDIA GPUDirect™ RDMA which helps increase data throughput by up to 80% and consequently system responsiveness by up to 60%*. Additionally, 4 UHD display outputs and an extended operating temperature range of -40°C to 85°C are supported. The embedded graphics product is suitable for mission-critical harshenvironment edge computing applications with size, weight, and power (SWaP) and network connectivity constraints.
-
Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
-
Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
-
Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
-
Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
-
Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Test Platform
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
-
Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
-
Product
PXI Digital Test Instrument
PXIe-6943
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
-
Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
-
Product
NFC Conformance Test System
T3111S
Test System
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
-
Product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
Test Platform
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
-
Product
Configurable Functional Test System
ATS-5000
Test System
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
-
Product
250kS/s, 16-Bit, 16-Ch Multi-Function PCI Card
PCI-1716
PCI Card
16 single-ended or 8 differential or a combination of analog inputs16-bit A/D converter, with up to 250 kHz sampling rateFIFO memory (8,192 samples)2 analog output channels16-ch digital input and 16-ch digital outputAuto-calibrationBoardID™ switch
-
Product
Embedded MXM GPU Module with NVIDIA® Quadro® Embedded RTX5000
EGX-MXM-RTX5000
Graphics Card
The EGX-MXM-RTX5000 module features advanced NVIDIA® Turing™ GPU technology in MXM 3.1 Type B+ form factor. It’s compact, slim and reliable design makes it suitable for mission critical environment. EGX-MXM-RTX5000 supports 4 DP 1.4b displays offering a flexible and easy solution for medical and gaming applications.
-
Product
Embedded MXM GPU Module with Embedded NVIDIA RTX™ A500
EGX-MXM-A500
Graphics Card
- NVIDIA Ampere Architecture- Standard MXM 3.1 Type A (82 x 70 mm)- PCIe Gen 4 x4 interface- 2048 CUDA® cores, 16 RT Cores, and 64 Tensor Cores- 6.54 TFLOPS Peak FP32 performance
-
Product
High Temperature Component Test Fixture
16194A
Test Fixture
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
-
Product
FEC Accelerator Based On Intel® VRAN Dedicated Accelerator ACC100
PCIe-ACC100
Interface Card
ADLINK’s PCIe-ACC100 is a PCIe interface accelerator adapter developed based on Intel's vRAN Dedicated Accelerator ACC100 eASIC chip. It supports 4G and 5G codec acceleration, checksum rate matching, onboard 4G ECC memory, and hybrid automatic repeat request technology (HARQ). The PCIe form factor HHHL (half-height, half-length) can meet the needs of most application scenarios.
-
Product
Headlamp Test Platform
Test Platform
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
-
Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
-
Product
High Density DPDT Plug-In Switch Card
1260-112
Switch Card
The Astronics 1260-112 is a 96-channel, high-density, double-pole, double-throw (DPDT), switch for the Adapt-a-SwitchTM platform.
-
Product
Back Plane Tester
-
This machine is used to test back planes used in telecommunications central stations. An operator loads a completed point to point wired back plane onto a retractable shelf on the front of the tester. Table continues and the disk falls through a hole into the bin. The shelf is pushed back into the machine where it is held in place by pneumatic operated clamps. Then a series of pneumatic cylinders sequentially insert a test card into each location in the back plane. A remote instrument performs a complete point to point continuity, short and hi pot test on all connections in the back plane.
-
Product
Multichannel Memory-Mapped ARINC 708/453 Interface Card
EXC-708mPCIe
Interface Card
The EXC-708mPCIe is a multichannel, memory-mapped ARINC 708/453 interface card that supports two ARINC 708/453 channels, each programmable as transmit or receive. Each channel implements a 64K x 16 FIFO and supports polling and/or interrupt driven operation. The card complies with the PCI ExpressTM Mini Card standard. It’s small size and suitability for Mini Card compatible computers make it a complete solution for developing, testing, integrating 708 interfaces and for performing system simulation of the ARINC 708/453 Weather Radar Display databuses, both in the lab and in the field. In Transmit mode, each ARINC 708 word is written to the FIFO as a block of 100 16-bit words. In Receive mode, each ARINC 708 word is stored in the FIFO as a block of 103 16-bit words. The first two words comprise the 32-bit Time Tag, indicating the word’s time stamp. The next 100 words comprise the 1600 bits of the ARINC 708 word, which are followed by the Status Word.The EXC-708mPCIe card comes complete with C drivers including source code.
-
Product
ARINC PCI Express 4 Lane Interface Cards
PCIE4L-A429
Interface Card
Alta Data Technologies’ PCIE4L-A429 interface module offers a variety of ARINC-419/429/575/573/717 channel configurations with software selectable RX/Tx channels, baud rates, bit encoding and word configurations (Start/Sync/Stop length, Parity, bits/word, MSB/LSB). Encode or decode almost any ARINC-429 physical layer signal. The 4 lane card (PCIE4L) is normal 1/2 height common for most desktop and larger server systems.
-
Product
Fixture Kit In-Line 6TL35 455x600mm
AH500
Test Fixture
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 3000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
-
Product
RSE Wireless EMC Spurious Emission
TS8996
Test System
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
-
Product
2m BNC Test Cable
16048D
Test Port Cable
The 16048D test leads extend the measurement port with a 4-terminal pair configuration. It provides a BNC female connector board to allow attachment of user-fabricated test fixtures.
