Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
High Density SPDT Plug-In Switch Card
1260-116
Switch Card
The Astronics 1260-116 is a 24-channel, Form C, single-pole double-throw (SPDT) switch card for use in either the 1260-100 VXI Carrier or the 1256 GPIB/RS-232 Switching Mainframe.
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Product
Network Interface Card
NIC10GFT
Interface Card
The NIC10GFT is a dual port 10GBase-T XMC module that brings 10GbE expandability to new and existing embedded systems with available XMC slots.
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Product
Interface Card
XMC-1553
Interface Card
The XMC-1553 Interface Card and AltaAPI Represent the Latest MIL-STD-1553 32-bit FPGA Protocol Engine Technology with Multi-Layer Software. Ideal for SBCs or carriers for VPX, VME and cPCI (Compact PCI/PCIe or PXI) - Commercial or Rugged/Conduction Cooled Systems.
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Product
PXI Functional Test System
U8989A
Functional Test
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
2-CH PCI ExpressR IEEE 1394b Frame Grabber
PCIe-FIW62
Interface Card
The PCIe-FIW62 is an IEEE 1394b (FireWire 800) interface card which provides two high-speed FireWire 800 ports with data transfer rates up to 800 Mb/s on a PCI ExpressR x1 lane. The PCIe-FIW62 provides two direct-connect IEEE 1394b bilingual connectors with a screw-lock mechanism. These screw-lock connectors provide a reliable connection between the PCIe-FIW62 and up to two IEEE 1394b cameras. A 4-pin ATX power connector on the PCIe-FIW62 supports IEEE 1394b cameras that draw power directly from the frame grabber. Each port has a green LED on the front panel that will illuminate when the PCIe-FIW62 is connected to a IEEE 1394b camera for convenient identification of channel connection status.
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Product
Network Interface Card
NIC10G
Interface Card
Featuring the Intel 82599ES dual 10GbE controller, the NIC10G supports flow control, integrated IPsec security engines, optimized queues, IPv6 offloading, advanced filtering capabilities, and Tx/Rx IP, TCP and UDP checksum offloading capability. Also has integrated a PCI Express Gen 2 interface supporting up to 8 lanes.
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Product
cPCI Card
EXC-4000cPCI/xx
cPCI Card
The EXC-4000cPCI/xx card for Compact PCI computers supports up to four dual redundant 1553 channels using the M4K1553Px(S) module and is compatible with all common variations of MIL-STD-1553 (A, B).
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Product
3-Axis Non-Robotic Automated Testing System
AT3
Test Instrument
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
Edge Card Adapter, Universal, for .062 PCB
111107138
Edge Card Adapter
VPC provides two types of Edge Card Adapter Kits for 10, 25 and 50 Module ITA Enclosures. Both kits are designed for various sized cards.The Universal Edge Card Adapter Kit’s card guides are hinged and can be folded for storage by releasing the holding latches on either side of the card.
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Product
Dielectric Material Test Fixture
16453A
Test Fixture
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
Test Platform
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
Interface Board for Conduction Cooled PCI Mezzanine Card Systems
EXC-708ccPMC
Interface Card
The EXC-708ccPMC is an ARINC-708 /453 interface board for conduction cooled PCI Mezzanine Card systems. The board supports two or four ARINC-708 /453 channels. Each of the channels can be programmed either as transmit or receive. Each channel implements an 8K×16 FIFO and supports polling and / or interrupt driven operation.The EXC-708ccPMC comes complete with C-driver software library including the source code.
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Product
MIL-STD-1553 CompactPCI Interface Card
CPCIC3/6-1553-PXI
Interface Card
The CPCIC-1553/PXI Interface Card and AltaAPI Represent the Latest MIL-STD-1553 32-bit FPGA Protocol Engine Technology with Multi-Layer Software. Our Card and Software Packages are Designed for Fast, Portable Integrations. The CPCIC-1553 is the Only Commercial Off the Shelf (COTS) Card that Passes and Executes the SAE AS4111/4112 Protocol Tests.
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Product
Electronic Control Unit Functional Test
Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
EV Power Components End of Line Test Platform
Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Embedded MXM GPU Module with Embedded NVIDIA RTX™ A4500
EGX-MXM-A4500
Graphics Card
- NVIDIA Ampere Architecture- Standard MXM 3.1 Type B (82x105 mm)- PCIe Gen 4 x16 interface- 5888 CUDA® cores, 46 RT Cores, and 184 Tensor Cores- 17.66 TFLOPS peak FP32 performance
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Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
Modular Functional Test Platform
LX-OTP2
Test Platform
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
Other Test Systems
Test System
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
