Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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16-Bit Multi-Function With A/D, D/A And Digital I/O Channels CPCI Cards
GX3232 Series
The GX3232 is a multi-channel 16-bit, analog input and output cPCI module, supporting 32 single-ended or 16 differential input channels and four analog output channels. The inputs can be software configured for differential or single-end operation and are sequentially scanned with a maximum aggregate scan rate of 300 kS/s. Three input ranges are software-selectable: ±10 V, ±5 V or ±2.5 V. Optionally, the GX3232 is available with a high voltage input configuration and supports three ranges: ±60 V, ±30 V and ±15 V. The high voltage configuration supports 16 single-ended or 8 differential input channels for high voltage and 16 single-ended or 8 differential inputs for low voltage measurement. Four analog output channels provide software-selectable output ranges of ±2.5 V, ±5 V or ±10 V. The outputs can be updated either synchronously or asynchronously and support waveform generation. Each output can be clocked at rates up to 300 kS/s. A 16-bit digital I/O port is also provided, which supports 16 bidirectional data lines. Note that when used with a TS-700 system only 8 of these digital I/O lines are available at the test system's receiver interface.
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Embedded MXM GPU Module With NVIDIA RTX™ ADA 3500
EGX-MXM-AD3500
- NVIDIA Ada Lovelace Architecture- Standard MXM 3.1 Type B (82x105 mm)- PCIe Gen 4 x16 Interface- 5120 CUDA® Cores, 40 RT Cores, and 160 Tensor Cores- 23 TFLOPS peak FP32 performance
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Embedded MXM GPU Module with Embedded NVIDIA RTX™ A1000
EGX-MXM-A1000
- NVIDIA Ampere Architecture- Standard MXM 3.1 Type A (82 x 70 mm)- PCIe Gen 4 x8 interface- 2048 CUDA® cores, 16 RT Cores, and 64 Tensor Cores- 6.66TFLOPS peak FP32 performance- 4GB GDDR6 memory, 128-bit- 192GB/s maximal memory bandwidth- 5-year availability
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Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Portable, Integrated O-Level Test Platform
Guardian™
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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6TL23 Off-Line seat operation Base Test Platform w/o Table
H71002301
- 18U height 19inch rack space (580mm depth)- VPC G12 or G12X interface- Man Machine interface H73000301 (not included)- stand-up operation
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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USB Graphics Adapter, Internal Mount, DB-15 connector
DB-UVGA16
- Mounts in DB9 cutout on chassis or in PCI slot- Uses internal USB pin header- Display resolutions up to: 1600 x 1200 (4:3), 1680 x 1050 (16:10)- Supports multiple display modes: Primary, Extended, Mirr
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Display Driver Test System
T6391
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Digital/Pattern/PE Card
PE32H
The PE32H represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE32, the PE32H offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (8 boards). The PE32H also supports deep pattern memory by offering 32M of on-board vector memory with dynamic per pin direction control and with test rates up to 66 MHz. With new 32M log memory, PE32H can capture 32 channels data or fail log.
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6TL23 Off-Line Seat Operation Base Test Platform
H71002300
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Infotainment Test for Automotive Applications
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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AINC 429 Multichannel Interface with Additional ARINC-717 Receive & Transmit Channels
DAS-429UNET/RT8-717
The DAS-429UNET/RT8-717 is an ARINC 429, multichannel interface card with additional ARINC-717 receive and transmit channels. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the ARINC 429 & ARINC-717 bus, both in the lab and in the field.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.The EXC-429UNET/RT8-717 adapter is supplied with C drivers, including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application (only versions 8.1 or higher).
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Embedded MXM GPU Module with Embedded NVIDIA RTX™ A500
EGX-MXM-A500
- NVIDIA Ampere Architecture- Standard MXM 3.1 Type A (82 x 70 mm)- PCIe Gen 4 x4 interface- 2048 CUDA® cores, 16 RT Cores, and 64 Tensor Cores- 6.54 TFLOPS Peak FP32 performance
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ARINC 429 Multichannel Interface Card for Mini PCI Systems
DAS-429mPCI/RTx
The DAS-429mPCI/RTx is an ARINC 429, multichannel interface card for Mini PCI systems. The card’s small size and suitability for Mini PCI notebook computers, make them a complete solution for developing and testing ARINC 429 interfaces and for performing system simulation of the ARINC-429 bus, both in the lab and in the field.The DAS-429mPCI/RTx is supplied with C drivers, including source code and Mystic application program.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Batterie Inspektor
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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Embedded MXM GPU Module with NVIDIA RTX™ A2000
EGX-MXM-A2000
- NVIDIA Ampere Architecture- Standard MXM 3.1 Type A (82x70mm)- PCIe Gen 4 x8 interface- 2560 CUDA® cores, 20 RT Cores, and 80 Tensor Cores- 8.25 TFLOPS peak FP32 performance
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PCMCIA/PCCARD & PCI ExpressCard 54mm Cards
PCCD-A429 and ECD54-A429
Alta Data Technologies’ PCCD-A429 & ECD54-A429 interface modules offer a variety of ARINC-419/429/575/573/717 channel configurations with software selectable RX/Tx channels, baud rates, bit encoding and word configurations (Start/Sync/Stop length, Parity, bits/word, MSB/LSB). Encode or decode almost any ARINC-429 physical layer signal.
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Embedded MXM GPU Module with Embedded NVIDIA RTX™ A4500
EGX-MXM-A4500
- NVIDIA Ampere Architecture- Standard MXM 3.1 Type B (82x105 mm)- PCIe Gen 4 x16 interface- 5888 CUDA® cores, 46 RT Cores, and 184 Tensor Cores- 17.66 TFLOPS peak FP32 performance
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
