Diode Test
See Also: Diode, Laser Diode, Zener Diode, Photodiode, Diode Testers
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Laser Diode Burn-In Testing
Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
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Modular Functional Testing Platform
OTP2
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Component Test Fixture For N1413 With B2980 Series
N1428A
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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PCIe 2.0 Test Platform
PXP-100B
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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SiC Diodes
ST’s silicon carbide diodes range from 600 to 1200 V – as single and dual diodes – and feature unbeatable reverse recovery characteristics and improved VF. Available in a wide variety of packages, from D²PAK to TO-247 and the insulated TO-220AB/AC, they offer great flexibility to designers looking for efficiency, robustness and fast time-to-market. ST’s SiC Schottky diodes show a significant power-loss reduction and are commonly used in hard-switching applications such as high-end-server and telecom power supplies, while also intended for solar inverters, motor drives and uninterruptible power supplies (UPS). ST’s automotive-grade 650 and 1200 V SiC diodes – AEC-Q101-qualified and PPAP capable – feature the lowest forward voltage drop (VF) on the market, for optimal efficiency in electric vehicle (EV) applications.
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Automotive-grade Diodes
ST's portfolio of automotive diodes is qualified to the AEC-Q101 standard and is intended for DC-DC converters used in numerous automotive functions. Most of these dedicated diodes are guaranteed in operation at junction temperatures as low as -40 °C and as high as +175 °C. The automotive-grade diodes belong to our STPOWER family.
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ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Mini In-Circuit Test System
U9403A
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Diode Lasers
The large spectral coverage of our diode lasers combined with the compact form factor, direct modulation capability (up to 150 MHz), true off during modulation (>70 dB aspect ratio), and integrated spectral clean-up filters make them ideal for applications in high resolution bioimaging, flow cytometry, optogenetics and quantum technologies.
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Diode Lasers
Laser Diode Micro-Modules
Advanced Photonic Sciences LLC
Advanced Photonic Sciences (APS) has introduced a new product line of Laser Diode Micro-Modules (LDMM’s) that address the need for a simple, robust, reliable, and cost-effective platform on which to mount, provide heatsinking for, collimate, and power semiconductor laser diodes. The use of laser diodes in scores of applications has become ubiquitous, and our new products make mounting, collimating, heatsinking, and providing power leads for such applications easier than ever.
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Automotive Ethernet Test Fixture
AE6941A
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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.13u ESD diode
Impulse TSMC
The Impulse TSMC .13u ESD diode was made to provide ESD discharge paths when integrating third party IP in an integrated circuit design for total ESD protection. The Impulse ESD diode has been successfully used with Dolphin Technologies, Artisan/ARM, TriCN/Synopsis I/O libraries, as well as popular IP blocks from RAMBUS, Chip Idea and other quality IP vendors. A 5.5 volt reverse bias anode to cathode operational specification enables the Impulse TSMC .13u ESD diode to be the device of choice for 5 volt tolerant designs.
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Rack based antenna test system
R&S®ATS800R CATR
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Diode Tester
FEC200E
Frothingham Electronics Corporation
The FEC200E is an automatic computer- controlled diode and rectifier tester. It is controlled by a standard PC-compatible computer running FreeDOS.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Test Fixture
16047E
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Compact EMS/EMI Test Platform
CEMS100
Setting up an EMS/EMI test system is a very complex process requiring significant investment. The steps involved include custom planning, design, installation and configuration of various components and standalone instruments as well as the RF shielded anechoic chamber. Rohde & Schwarz offers the standardized R&S®CEMS100 test platform that is the company's first flexible, reliable and cost-effective off-the-shelf solution for radiated EMS measurements in line with IEC/EN 61000-4-3.
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Ethernet and Fibre Channel Test Platform
SierraNet M1288
The SierraNet M1288 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M1288 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M1288 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Test Systems
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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Eagle Test Systems
ETS-200T
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Limiter Diodes
The SemiGen SLP7100 series of Limiter Diodes are processed with a high-resistivity epi that have thin intrinsic layers. These devices are typically in the 2 to 20 micron range of epi thickness and can be gold doped to achieve specific performance goals. These diodes are used in passive or active limiter designs in the 100 MHz to 30 GHz frequency ranges. They are ideal for use in high-power applications and can be supplied in chip form or in your choice of packages below.
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Lens Module Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Laser Diode Drivers
Arroyo Instruments offers a broad range of laser drivers to meet your exact test needs. From 100 milliamps to 100 Amps, all of Arroyo Instruments' LaserSource benchtop laser drivers include unique features not found on competing products such as optically isolated photodiode and modulation inputs, programmable PD bias, and both RS232 and USB computer interfaces. The LaserSource also has laser diode protection circuits such as interlock, ESD protection, and hardware limits for current and voltage.
