Diode Test
See Also: Diode, Laser Diode, Zener Diode, Photodiode, Diode Testers
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
6TL19 Off-Line Base Test Platform
H71001900
Test Platform
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Millimeter Wave Zero Bias GaAs Schottky Diode
HSCH-9162
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The HSCH-9162 is suitable for medium-low barrier, zero bias detector applications. The HSCH-9162 is functional through W-band (110 GHz) and can be mounted in microstrip, finline, and coplanar circuits.
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Product
Broadband Planar Tunnel Diode Detectors
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KRYTAR Broadband Planar Tunnel Diode Detectors are specifically designed for use in today's high-performance microwave instrumentation and systems. KRYTAR detectors are designed for such applications as power measurements, analyzing radar performance, leveling pulsed signal sources, AM noise measurements, system monitoring and pulsed RF measurements in ultra-broadband and mm-Wave applications.
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Product
Current Pulsers and Laser Diode Drivers (Pulsed Current)
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These instruments generate current pulses whose amplitude is largely independent of the load voltage. This makes them ideal for pulsing device whose voltage may vary with time (for instance, the voltage drop of laser diodes may vary with temperature, or explosive squibs which change impedance during ignition). This voltage independence is a trade-off with speed. If faster rise times are required, consider using pulsed voltage instruments instead.
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Product
Diode Arrays
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a silicon diode with minimal packaging overhead. The small signal 0603, 1005 and 1206 Chip Diodes are lead free with Cu/Ni/Au plated terminations while the other packages (SMA, SMB, SMC, 1408, 1607, 2010, 2419, 8L NSOIC, 16L NSOIC, SOT23, SOT23-6, 16L WSOIC) use 100 % Tin terminations. All Bourns® diodes are compatible with lead free manufacturing processes, conforming to many industry and government regulations on lead free components.
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Product
Steering Diodes
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ProTek's low capacitance Steering Diode Arrays provide high-speed data line and I/O port protection from transients caused by Electrostatic Discharge (ESD), Electrical Fast Transients (EFT), Tertiary Lightning and other induced voltages. Steering diodes divert the transient to the power-bus or ground and away from sensitive IC components.
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Product
Dielectric Material Test Fixture
16453A
Test Fixture
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Product
Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
Test System
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Diode Power probe
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The COMM-connect 3026 Diode based temperature compensated probe is designed for use with the COMM-connect range of Power Monitors. The probe will handle from 50µW to 100mW . Used with external couplers and the our measurement system application from 1W to 1MW, a high dynamic range can be configured. The 3026 Diode based probe gives excellent stable results along with the COMM-connect Power Monitor variants. This gives our customers a number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
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Product
USHIO Blue Violet Laser Diodes (375nm - 405nm)
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The Optoelectronics Company Ltd
The USHIO HL40071MG is a single transverse mode 405nm laser diode which offers 300mW optical output power in a 5.6mm package with typical optical and electrical characteristics, (Tc=25 degrees C, cw), of 50mA threshold current, operating current of 280mA, operating voltage 6.0V, 6 degrees beam divergence parallel to the junction, 15 degrees beam divergence perpendicular to the junction, laser diode reverse voltage of 2V and operating temperature of 0 to +70 degrees C.
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
Test Platform
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Product
Functional Test
UTS
Functional Test
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
.13u ESD diode
Impulse TSMC
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The Impulse TSMC .13u ESD diode was made to provide ESD discharge paths when integrating third party IP in an integrated circuit design for total ESD protection. The Impulse ESD diode has been successfully used with Dolphin Technologies, Artisan/ARM, TriCN/Synopsis I/O libraries, as well as popular IP blocks from RAMBUS, Chip Idea and other quality IP vendors. A 5.5 volt reverse bias anode to cathode operational specification enables the Impulse TSMC .13u ESD diode to be the device of choice for 5 volt tolerant designs.
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Product
HV Test System up to 20000 Volt
Test System
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
PIN Diodes
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PIN photodiodes convert light to current – without a bias voltage having to be applied. Silicon is commonly used as an inexpensive detector material in the Vis range. For higher demands, InGaAs is used; it covers the widest spectral range from the Vis to the NIR. We offer silicon carbide as a “solar-blind” detector specifically for the UV range.
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Product
SP8T RF Pin Diode Switches To 12 GHz
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Pulsar Microwave manufactures 8-way absorptive and reflective RF switches in single-pole 8-throw configuration. They fulfill broadband and narrowband requirements from 40 MHz to 12 GHz and handle 200 milliwatts input power. The SP8T switches have an isolation of 60 dB and switching time of 100 ns. Most models specify 1.6:1 or better VSWR at all ports. The SP8T switches operate on a power supply of +/- 5VDC and switching control is 0-5 TTL logic. The unit comes standard with SMA female connectors. Options for control are line drivers and decoders.
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Product
SMD Test Fixture
16034G
Test Fixture
Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
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Product
Bridge Rectifier Diodes
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ST’s portfolio of bridge rectifier diodes is intended for primary bridges. In input primary bridge applications, ST's 1200V bridge diodes achieve very low conduction losses thanks to very low forward voltage characteristics. They can operate at up to +175 °C junction temperature, as a result of reduced leakage currents. Bridge rectifier diodes are belonging to the STPOWER family.
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Product
USHIO Infrared Laser Diodes (705nm - 852nm)
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The Optoelectronics Company Ltd
USHIO OPTO's new 705nm, 40mW laser diodes, HL7001MG and HL7002MG are the first ever 705nm semiconductor lasers and are suitable for biomedical light sources. For more information, see HL7001MG/7002MG overview.
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Product
Osram Direct Emission Green Laser Diodes (510 - 530nm)
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The Optoelectronics Company Ltd
The PLT3 520D laser diode can deliver 140mW pulses at 520nm with 8% efficiency, driven at 300mA at 50% duty cycle – OSRAM's previous limit was 80mW with the PL 520B. This new diode has been developed to work in MEMS-based scanners.
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Product
Planar-Doped Barrier Diode Detector, 0.01 to 50 GHz
8474E
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The Keysight 8474E is a high-performance detector using a gallium arsenide, planar-doped barrier detecting element. It features extremely flat frequency response over its entire band of operation and very good frequency response stability versus temperature. The Keysight 8474E is also very rugged with high resistance to ESD damage. The Keysight 8474E detector is available with a 2.4-mm (0.01 to 50 GHz) connector. This detector offers the options for optimal square-law loads (Option 102) and for positive polarity output (Option 103). Because the unit-to-unit frequency response tracking of this device is typically better than plus or minus 0.3 dB, no matched response option is offered.
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Product
Physical Testing Test
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Physical Testing by Aero Nav: mechanical, weathering, environmental, immersion, electrical, luminance, thermal analysis, thermal conductivity, water exposure, saltwater exposure, etc.
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Product
10G DFB Laser Diode Chips
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Guilin GLsun Science and Tech Group Co., LTD
10G DFB Laser Diode Chips by GLSN
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Product
Tunable Diode Laser
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Tunable diode laser absorption spectroscopy (TDLAS) is a fast, accurate, non-contact gas analysis technique that responds quickly to changing analyte concentrations. It is a proven technology free of interferences from other sample stream components.
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Product
Manual Tunable Littman/Metcalf Diode Laser System
Lion
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Littman / Metcalf Tunable External Cavity Diode Laser, 630nm .. 1770nm, up to 100mW, patented technology, hands-off operation, large mode-hop free piezo tuning range, narrow linewidth, free space and fiber coupled versions. Check our ar-coated diode stock list for availability.
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Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Diode Power Sensor
8487D
Power Sensor
Excellent SWR for reducing mismatch uncertainty Accurate calibration and traceability to US National Institute of Standards and Technology (NIST) millimeter-wave sensor calibration Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters, plus the E1416A VXI and discontinued 70100A and 43X power meter Accurate average power measurements over -70 to -20 dBm Frequency range 50 MHz to 50 GHzDiode power sensing element
