Diode Test
See Also: Diode, Laser Diode, Zener Diode, Photodiode, Diode Testers
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Product
Laser Diode Drivers For Automotive
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Automotive Head-Up Displays (HUDs) are benefiting from big innovations in MEMS projection systems and are central to ADAS and safety. The latest laser scanned-MEMS projection systems can provide higher resolution images and at a lower cost. Renesas' highly integrated laser diode driver enables automotive head-up displays (HUDs) with high resolution, high color-depth and high frame-rate projections.
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Product
Tunable Diode Laser Absorption Spectroscopy
5100HD TDLAS
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Using tunable diode laser absorption spectroscopy (TDLAS) technology, the 5100HD can be configured with one or two absorption cells, providing dual stream analysis and/or the measurement of multiple analytes at the same time.
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Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
Automotive Test Platform
ETS-800
Test Platform
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
EMS Test System
TS9982
Test System
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
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Product
Vegas Data Diode
01-09838
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Non-ruggedized module that addresses concerns regarding use of untrusted, commercial-off-the-shelf (COTS) bus logging on aircraft with a MIL-STD-1553 or ARINC-429 bus interface.
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Product
Three-Path Diode
NRPxxS/SN/SN-V
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The R&S®NRPxxS/SN power sensors use three separate diode paths, each operated in the optimum detector range. As a result, the average power can be determined with high accuracy independent of the modulation type. Measurement results are hardly affected by interfering signals or harmonics.
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Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Product
Millimeter-wave and Microwave GaAs Diodes
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Keysight Technologies provides MMIC diodes ideal for microwave radio, aerospace and defense, and instrumentation applications.
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Product
Laser Diodes
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Our laser diode portfolio is broad, extending from cw laser diodes to pulsed laser diodes to high-power laser diodes. For special areas of application VCSELs and quantum cascade lasers are also included in our range of products.
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Product
Silicon Carbide Diodes
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In addition to ensuring compliance with today's most stringent energy efficiency regulations (Energy Star, 80Plus, and European Efficiency), ST's silicon-carbide diodes show four times better dynamic characteristics with 15% less forward voltage (VF) than standard silicon diodes. Silicon-carbide diodes belong to our STPOWER family.
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Product
Laser Diode Source Product Family
LDS-7200
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5 nanometers tuning range• 10 picometer setpoint accuracy• 0.1 picometer resolution• 20mW output power• 0.005 dB power stability• Built-in coherence control• Integrated function generator• USB remote interface• Application program with source code
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Product
Diode Tester
FEC200E
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Frothingham Electronics Corporation
The FEC200E is an automatic computer- controlled diode and rectifier tester. It is controlled by a standard PC-compatible computer running FreeDOS.
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Product
KATANA & PILAS Pulsed Diode Lasers
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With external trigger functionality, nano- to picosecond pulse duration, and a wide range of wavelengths, the KATANA & PILAS series are our most versatile offering.
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Product
PIN Diode Switches
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After producing quality PIN diode switches in-house for many years, K&L Microwave is pleased to offer packaged options for customer applications. The offerings below are intended to highlight standard products; however, with our extensive in-house capabilities, custom parts are also available.
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
Active Alignment Assembly & Test Platform
Test Platform
Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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Product
PCIe 4.0 Test Platform
PXP-400A
Test Platform
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
5G Carrier Acceptance Test System
NetOp
Test System
R&S®NetOp is the leading platform for network operator device acceptance test, covering all leading tier 1 operators.As one-stop shop for Protocol, IMS, Data Performance, E911 GNSS the supported carriers include:North America: AT&T, Verizon Wireless, T-Mobile USLatin America: America MovilChina: China Mobile, China Unicom, China TelecomJapan: NTT DoCoMo, Softbank, KDDI
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Product
Test Handler
M4841
Test Handler
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Product
Memory Test System
T5830/T5830ES
Test System
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
Fast Recovery Diodes
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We offer high-performance products with low forward voltage (VF) and high-speed reverse recovery time (trr) for increasing device efficiency.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Diode Tester
FEC VF40CM
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Frothingham Electronics Corporation
The VF40CM is intended for testing VF, HALF CYCLE SURGE, and THERMAL RESPONSE/RESISTANCE on small- and medium-power diodes and rectifiers. It can also measure THERMAL RESPONSE/RESISTANCE on NPN and PNP bipolar transistors using an external user-supplied VCB supply.The VF40CM also is sometimes used to measure VZ of low-voltage zener diodes up to the compliance voltage limit of the tester. 20V at 20A is possible.
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Product
Laser Diode Driver
LDD100
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Artifex Engineering GmbH & Co. KG
The LDD100 employs a digitally programmable analogue end stage for flexible and accurate current control. Currents of up to 600A with pulse durations of 50ns to 3s are generated with rise and fall times of 70ns (F-version) or 600ns (XL-version) – essentially without overshoot. Due to the flexibility in setup and control, the LDD100 is practical for many laboratory applications. For automated measurements, the unit may be directly controlled via the USB interface. Alternatively, all parameters may be input via the graphical software or via the integrated keypad and OLED display.
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
USHIO Red Laser Diodes (633nm - 690nm)
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The Optoelectronics Company Ltd
Features: 5.6 mm CAN package, Optical output power: 80 mW (CW), 300 mW (pulsed – pulse width: 10 ns, duty: 10%), Lasing wavelength: 658 nm, Wall-plug efficiency*: 33%, Operating temperature: -10° – +60° C (CW); -10° – +75° C (pulsed), Single transverse mode, TE mode oscillation, MTTF >10,000 hours
