Diode Test
See Also: Diode, Laser Diode, Zener Diode, Photodiode, Diode Testers
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Schottky Mixer Diodes
Teledyne Lincoln Microwave GaAs beam lead Schottky diodes for the up/down conversion of millimetre wave detected signals are designed for applications which demand ultimate performance. The device is easily assembled onto a wide variety of surface mount substrates using thermo-compression, thermo-sonic or epoxy bonding techniques.
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Steering Diodes
ProTek's low capacitance Steering Diode Arrays provide high-speed data line and I/O port protection from transients caused by Electrostatic Discharge (ESD), Electrical Fast Transients (EFT), Tertiary Lightning and other induced voltages. Steering diodes divert the transient to the power-bus or ground and away from sensitive IC components.
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Laser Diode Drivers For Automotive
Automotive Head-Up Displays (HUDs) are benefiting from big innovations in MEMS projection systems and are central to ADAS and safety. The latest laser scanned-MEMS projection systems can provide higher resolution images and at a lower cost. Renesas' highly integrated laser diode driver enables automotive head-up displays (HUDs) with high resolution, high color-depth and high frame-rate projections.
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Repair of Six Diode Bridge Assemblies, P/N 5989C
CEHCO is specialist in repair of various rectifier assemblies. One such assembly is shown below:Specifications:- Six Diode Bridge Assembly, P/N 5989C- AC input terminals: (3, 4 , 5)- DC output terminals: (1), POSITIVE and (2), NEGATIVE
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Laser Diode Source Product Family
LDS-7200
5 nanometers tuning range• 10 picometer setpoint accuracy• 0.1 picometer resolution• 20mW output power• 0.005 dB power stability• Built-in coherence control• Integrated function generator• USB remote interface• Application program with source code
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Current Pulsers and Laser Diode Drivers (Pulsed Current)
These instruments generate current pulses whose amplitude is largely independent of the load voltage. This makes them ideal for pulsing device whose voltage may vary with time (for instance, the voltage drop of laser diodes may vary with temperature, or explosive squibs which change impedance during ignition). This voltage independence is a trade-off with speed. If faster rise times are required, consider using pulsed voltage instruments instead.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Simulation Models for Passive Components, Transistors, Diodes, etc.
An indispensable collection of the industry''s most advanced simulation models for passive components, transistors, diodes and more. These reliable, measurement-based models maximize the RF/MW electronic design automation (EDA) process, reduce design cycle times, and lower product development cost. With a few EASY steps, the Modelithics Model Libraries are ready to use in EDA tools.
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Millimeter Wave Zero Bias GaAs Schottky Diode
HSCH-9162
The HSCH-9162 is suitable for medium-low barrier, zero bias detector applications. The HSCH-9162 is functional through W-band (110 GHz) and can be mounted in microstrip, finline, and coplanar circuits.
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Tunable Diode Laser Absorption Spectroscopy
5100 TDLAS
The feature-rich 5100 TDLAS offers high-sensitivity, analyte-specific, fast-response measurements for critical industrial applications. It features a single absorption cell and integrated sample system in a compact, cost-effective package.
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SoC/Analog Test System
3650-S2
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Compact Laser Diode Modules: 635nm-639nm Visible Wavelength, 11mm Diameter
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide complete cost-effective laser solutions.
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Diode Arrays
a silicon diode with minimal packaging overhead. The small signal 0603, 1005 and 1206 Chip Diodes are lead free with Cu/Ni/Au plated terminations while the other packages (SMA, SMB, SMC, 1408, 1607, 2010, 2419, 8L NSOIC, 16L NSOIC, SOT23, SOT23-6, 16L WSOIC) use 100 % Tin terminations. All Bourns® diodes are compatible with lead free manufacturing processes, conforming to many industry and government regulations on lead free components.
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Laser Diodes
With over 30 years of considerable experience in photonics industry, USHIO offers a wide range of high-quality Laser Diodes. They are available in different intensities and sizes, suitable for each and any application. These are industrial quality, reliable laser diodes offering high powers and low operating currents, long lifetimes and energy efficiency. All USHIO laser diodes are RoHS compliant. It is also possible to produce Laser Diodes to customer specifications. We offer technical support helping you select the ideal laser diode to get the most from your application. For laser diodes we are offering both test data and wavelengths selection on request. Please feel free to contact us (link) – we will be happy to help you.
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Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Test Sets For Diagnostic Testing
Test Sets For Diagnostic Testing are designed to test Oil Resistivity, Tan Delta, High Voltage Surge Comparison, etc. These test sets are automated instruments used to measure electrical features to insulate transformer oil, liquids and varied other insulating materials. They are ideal for revealing different localized problems and varied weak spots in the insulation. These modern testing sets are designed to provide high accuracy in results. In addition to this, they are easy to maintain testing sets available to ensure accurate readings.
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12 Pulse Diode Bridge Rectifiers Inside Fiberglass Plenums, P/N 5872C4-2
- 12 Pulse Diode Bridge Rectifier, P/N 5872C4-2- Each diode is rated for 60 Amps, 1800 Volts peak- Dimensions: 50″L x 40″W x 20″H approximately- Four 10″ fans are used for coolingFour 10″ fans will force cool from the bottom of the Plenum. 12 diode assemblies (each diode consists of nine diodes in series are integrated together inside the Plenum). The output is rated for 3000 VDC, 80 Amps.
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Positioning Test System
TS-LBS
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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10G DFB Laser Diode Chips
Guilin GLsun Science and Tech Group Co., LTD
10G DFB Laser Diode Chips by GLSN
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Rotating Diode Assembly, P/N 6118CA
CEHCO is a specialist in the repair of Rotating Diode Assemblies.
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HV Test System up to 20000 Volt
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Solid State PIN Diode Transfer Switch, 100 MHz to 18 GHz
P9400C
The Keysight P9400C solid state PIN diode transfer switch offers outstanding performance in terms of port-to-port isolation, switching speed and low insertion loss over a broad operating frequency range of 100 MHz to 18 GHz. The P9400C is particularly well suited for ultra-fast RF and microwave switching applications in instrumentation, communications, radar, switch matrices and various other test systems where high isolation, speed and lifetime of a switch is critical.
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Test Automation System for Emission Testing
STARS VETS
STARS VETS is a Vehicle Emission Test System application available with the STARS Automation platform for chassis, engine and powertrain dynamometers. The application provides test cycle execution, emissions equipment control, results calculation and reporting in compliance with the different legislative standards throughout the global regions. Its flexible design offers a wide range a customization, and it addresses the various requirements for R&D, COP and certification testing.
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Leak Testing
T SERIES
The new T series marks the evolution of the leak testers for the industry. A touch of innovation that fosters man-machine interaction thanks to the innovative tempered glass touch capacitive panel and other technological innovations that make the range, the natural evolution of the previous M series, the new benchmark for testing and proof brought.
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Modular Testing
Modular testing requirements come in all shapes and sizes. It is therefore important that we are able to match your requirement with a suitable ATE System. At ATE Solutions, we have a range of modular test and test automation products to choose from, with a tester to suit every situation.
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Test Automation
TetraMAX®
The Synopsys TestMAX™ family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The Synopsys TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
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Testing Services
DTB is the largest independent testing laboratory in the United States with a full spectrum of testing services all under one roof. We provide a wide range of environmental, dynamics and vibration, EMI/EMC, ballistics, optical, ordnance release, and safety and survival testing.
