Laser Diode Reliability Burn-In / Life-Test System

Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.

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Package Level Test

Chroma ATE Inc.

Applicable for burn-in, reliability andlife testingACC and APC control modesIndividual channel driving and measurementDriving current 500mA per channel

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Photonics Module Test System

58625 - Chroma ATE Inc.

Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.

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Photodiode Burn-in Reliability Test System

58606 - Chroma ATE Inc.

The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.

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Laser Diode Burn-in Reliability Test System

58604 - Chroma ATE Inc.

The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.

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Laser Diode Characterization System

58620 - Chroma ATE Inc.

The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.

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TO-CAN Package Inspection System

7925 - Chroma ATE Inc.

Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.

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Laser Diode Reliability Burn-In / Life-Test System

Topics

Package Level Test

Photonics Module Test System

Photodiode Burn-in Reliability Test System

Laser Diode Burn-in Reliability Test System

Laser Diode Characterization System

TO-CAN Package Inspection System