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Full Wafer Contact Test System
Fox 1
Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
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Test System
DA-2 ATS
The DA-2 ATS is an economical Commercial-Off-The Shelf (COTS) build-to-print tester. The test station is compliant with the published drawing package. The system does not include software.
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Jetting System
IntelliJet®
The IntelliJet® Jetting System with patented ReadiSet® Jet Cartridge delivers cutting-edge reliability and micro dot dispensing for manufacturing advanced semiconductor and mobile electronics packages
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Digital Closed Loop Control Thermal and Mechanical Testing System
3800 System
The Gleeble 3800 is a fully integrated digital closed loop control thermal and mechanical testing system. Easy-to-use Windows based computer software, combined with an array of powerful processors, provides an extremely user-friendly interface to create, run and analyze data from thermal-mechanical tests and physical simulation programs.The result is a system unequaled for physical simulation and thermal-mechanical materials testing.
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H+W (Pylon) 1280 Point Test System
H+W (Pylon) 1280 Point Test SystemUp to eight positions for 160 Point Wiring Blocks.
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Lamp Cap Temperature Rise Test System
CX-T1
Shenzhen Chuangxin Instruments Co., Ltd.
Lamp Cap Temperature Rise Test System is according to IEC60360-1998 and GB2512-2001(Standard method of measurement of lampcap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards
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G3 System
Dragonfly
Unique 2D imaging technology provides fast, reliable inspection for sub-micron defects to meet today's R&D needs and tomorrow's production demands. Onto Innovation's patented Truebump® Technology combines multiple 3D metrology techniques to deliver accurate 100% bump height metrology and coplanarity.
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Camera Barrel Test System
BK8612
We designed the BK8612 2 Channel Noise Test System to provide noise and vibration testing for your digital camera barrel DC Motors. Because it is based on the BaKo BK2120B DAQ, it is capable of monitoring a microphone and an accelerometer concurrently to obtain data from the motor. Because you can change the parameters of functions and limits, it is versatile but still quick and easy to set up. In addition, you can look at data in real time and also store it for future analysis. Easy to use and set up, fast and accurate; if you need to maintain the quality of your camera barrel motors, this is the tester you want.
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Data Converter ICs
We offer a complete range of high-performance, low-power,and small-size data converter integrated circuits (ICs) for demanding industrial, automotive and consumer applications. Whether you need an Analog-to-Digital Converter (ADC), Digital-to-Analog Converter (DAC), digital potentiometer, AC and DC power and energy measurement device, voltage reference or a combinationof data converter ICs, we have the right solution for your application and world-class support to make sure you meet your design goals.
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Test Systems Inspection Systems
Different requirements demand flexibility. ELABO boasts a modular product portfolio permitting the economical creation of bespoke solutions for every client. These solutions range from individual testing devices through tabletop workstations with integrated testing equipment all the way to automated systems with ERP connections for mass production.
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Automated Test Systems
Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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MB Millenium Dynamic Test Control System
MB Millenium
The MB Millenium™ from MB Dynamics is a multiple-input, multiple-output (MIMO) and/or a multiple-input, single-output (MISO) dynamic test control system.
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Cable Fault and Test System Vans
Whether you are working on-site, in the countryside or an urban environment, having the right equipment available when conducting fault location operations is vital. When the correct tools can be accessed easily, fault-location time speeds up dramatically, and faults can be dealt with more efficiently. Megger’s range of cable test vans offer solutions to the challenges of fault location in the real world, no matter the environment. Our test van systems have been developed in collaboration with end users to ensure that they live up to the standards of daily fieldwork. Our vans are designed to be adaptable to the end users needs so that the most appropriate tests may be carried out for the cable in question, regardless of whether it is low, medium or high voltage.
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Electronic Transformer Test System
UI2000-ET
• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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Radar Systems
A radar system utilizing electronic-computer techniques whereby raw data is used to track an assigned target, compute target velocity, and predict its future position without interfering with the scanning rate.
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Tan Delta Test System
Diagnostic test that indicates the degree of cable insulation degradation. Rather than using only a VLF instrument to perform a go/no-go proof test, the Tan Delta, used in conjunction with a VLF hipot, permits the user to grade the deterioration level of many cables in order to prioritize replacement, rejuvenation, or to determine what additional tests may be useful.
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Optics Test Stations For Single Lenses And Optical Systems
OTS
Optik Elektronik Gerätetechnik GmbH
The optics test stations of the OTS series enable the computer-based, software-controlled measurement of optical parameters of individual lenses (including cylindrical lenses) and optical systems. Measured variables are, for example, focal length, MTF, focal length, radius, contact dimension, centering, wedge angle and deflection angle. The optional software module LensTest enables the measurement of the center thickness of lenses and air gaps in complete lenses as well as the measurement of the centering error of individual surfaces.
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Monitoring Systems
Sensors alone do not provide the complete answer to measuring vibration and using the data to better understand machine health. Monitran offers a short range of monitoring systems that can be used not only to measure vibration but to display values, constantly watch the levels and take action in case of excess and dangerous vibrations.
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Fully-automated Test Systems
Special mechanical systems/solutions
Foerster Instruments, Incorporated
Alongside individual test instruments, we collaborate closely with our customers to develop and produce customized test systems for their application. Following a consultation with our product and sales specialists, we develop a concept to suit you. For the production process that follows, we enter into product-specific collaborations with professional mechanical system manufacturers to achieve the best possible solution. We are also happy to work with mechanical system suppliers proposed by our customers. These suppliers are often familiar with the peculiarities of the component and know how to handle them. Even after the production stage, we assist you with commissioning the test system and are are on hand to answer any questions afterwards.
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Discrete Devices High-speed Testing System
QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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Pulsed-DC Systems
Extend process innovation with Advanced Energy’s comprehensive pulsed-DC suite. Minimize arcing, enhance deposition rate, improve film flatness and packing density.
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DC Hysteresis Graph Test System
DX-2012H
Automatic measurement of the demagnetization curve of permanent magnetic material such as ferrite, AlNiCo, NdFeB, SmCo, etc. Accurate measurement of the magnetic characteristic parameters of remanence Br, coercive force HcB, intrinsic coercive force HcJ and maximum magnetic energy product (BH)max.
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Training Systems
TESCO’s Training Systems are built to your specifications to simulate various field conditions and aid in the training of field personnel in a full range of conditions and faults.
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Profiling Systems
ICK profiling systems measure, detect, classify, count, and check vehicles in 3D. They determine the number of axles on heavy goods trucks for vehicle classification and measure vehicle dimensions to rectify loading errors. The systems recognize overheated vehicles approaching tunnels and other entrances and activate diversions. They also monitor external train contours. If a limit value is exceeded, the system triggers an alarm. All this contributes to safety on roads and railroads.
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Combination Board Functional Test System
QT 4256 ATE
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Communication Systems
Communications systems provide ultimate convenience for all tactical and administrative communication tasks, custom-made for naval vessels of any size – from submarine to destroyer.
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Rad-Hard Analog ICs
ST's wide range of rad-hard QML-V qualified analog ICs covers analog-to-digital converters (ADC) and digital-to-analog converters (DAC) for telemetry, instrumentation and imaging applications. Our portfolio also includes rad-hard op amps, high-speed differential amplifiers up to 1 GHz, shunt voltage references and comparators to ensure a complete solution for signal conditioning, referencing and data conversion.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
