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Cobot Testing System
CT6
The CT6 cobot testing system introduces the benefits of automation to the testing of biomedical devices and components. This system pairs a collaborative robot with a 5900 or 6800 Series universal testing system to increase the efficiency of small to mid-sized testing labs that require a high degree of flexibility in their testing systems. The CT6 is designed to handle a wide range of medical components, including drug delivery, sample collection, and wound closure products.
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GSP-2B Test System Interface Probe
GSP-2B
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 125Full Travel (mm): 3.18Recommended Travel (mil): 125Recommended Travel (mm): 3.18Overall Length (mil): 845Overall Length (mm): 21.46
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Stationary Drive Test System
ACTAS CF80
Stationary test system for sequential final factory tests and function tests on up to 8 drives. The drive test system is operated and controlled with the ACTAS operating software. The test position is selected using the multiplex method. The test system can reproduce drive control with the aid of a logic module. This makes it possible to test any drive even if there is no control unit.
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Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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Rotor Test Systems
Automation Technology's RTS-3800 Rotor Test Systems offer an unparalleled ability to test the quality of die cast or PM rotors. The RTS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems; the RTS-3800 is backed by ATI's industry leading two-year limited warranty.
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AC / DC Electronic Loads – Benchtop Testing to Automated Test Systems
Chroma Systems Solutions, Inc.
Chroma is the global leader in Electronic Load manufacturing. Chroma’s AC Electronic Loads are designed for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources, and other power devices such as switches, circuit breakers, fuses and connectors. Chroma’s DC Electronic Loads are used for power testing in all markets including automatic test systems, LED, power supply testing, battery testing, and fuel cell testing. Chroma loads can do it all including full current down to 0.4VDC, CZ mode, user defined waveforms, timing measurements, and 3 current ranges per load. Chroma’s electronic loads come standard with either USB or RS232 ports for control and can be configured for GPIB (IEEE-488) control as well.
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Test Systems
As new products emerge and change, the requirements for the industry also increase becoming more and more challenging. Complex products require demanding and versatile test systems, capable of performing complex test cycles. The ultimate goal is to ensure the validation of the final product during the different stages of the production process.
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Scienlab Battery Test System – Cell Level
SL113XA | SL100XA Series
The cell is the basis of any battery system and directly influences its function, performance and safety. Therefore, it is essential to test and characterize the cell at an early development stage. For this purpose, Keysight offers reliable test systems for precise and reproducible measurement results. The Cell Level Series (SL1002A, SL1004A, SL1007A, SL1132A and SL1133A) — also known as Battery Cell Tester — emulates sink and source for battery cells for automotive and industrial applications.
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NFC Physical Layer Test System
IQnfc+
LitePoint provides turn-key software that facilitates test coil calibration, executes test plan and provides detailed waveform analysis and flexible APIs to customize test flow in the labs.
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System Level Test
SLT
As technology nodes continue to evolve and with a more aggressive time to market to bring devices to their end applications, full test coverage of such chips is possible only with System Level Testing.
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Flight Line Armament Test System
SST
The Stores System Tester (SST) is a ruggedized flight line armament test system that enables real-time diagnostic analysis. U.S forces need to perform alternate mission equipment (AME) troubleshooting and diagnostic analysis on the flight line. BAE Systems' SST provides this capability in a one-person portable package.
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Portable System for High-Boltage Solid Dielectrics Testing
HVTS-70/50
Portable system HVTS-70/50 is designed for carrying out high-voltage withstand testing of cable insulation and other solid dielectrics with DC (rectified) voltage up to 70 kV and AC voltage up to 50 kV RMS at industrial frequency (f = 50 Hz).
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Test Tables / System Solutions
WEETECH, as a manufacturer of test equipment, offers its customers also a "Ready To Use" test system solution. It consists of the test table, the customer-specific adaptation as well as the test device, and is very quickly ready for use at the customer's site. According to the customer's requirements, the set-up is designed as a system with permanently installed adaptations for the production of constant cable harnesses in large quantities or with interchangeable adapters for the flexible production of different cable harnesses. Depending on the application, a larger table version or a smaller desk version is available. Various interfaces are available for integrating these solutions into a complete production automation system.
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Battery PACK (500v-1000v)Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
PACK test equipment adopts sinexcel, firstly adopts three-level AC scheme, and the detection process supports multi-gear switching. The device integrates voltage, temperature, pressure and other auxiliary channels, and CAN also integrate various communication protocols such as temperature box, water cooler, mainstream CAN CANFD 485, etc. It supports a variety of practical and innovative functions such as data one-click automatic export, which meets all aspects of PACK battery electrical performance testing.
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High Power Laboratory Testing System
FTF-HP
Drive simulations with standard Electric Vehicle tests: FUDS, SFUDS, GSFUDS, DST and ECE-15LDrive Cycle TestingIntegration with motor test benchesCycle testing of EV/HEV Battery PacksBi-directional DC power supply
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Flammability Test System
COMP0804CAP
Active flammability test system according to IEC 60384-14 Ed4. For testing X & Ycapacitors up to 1uF. The test system includes control of the nominal AC supply via an integrated variac up to 1800V. Impulse amplitudes are programmable up to 8kV which covers all requirements. X1 capacitors are stressed up to 4kV, X2 and Y4 capacitors up to 2.5kV and Y2 capacitors up to 5kV.
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Power ICs - VRPower® (DrMOS) - Power Stage
The Next Generation VRPower® Power Stage, Vishay’s family of VRPower modules offers an integrated MOSFET and driver power stage with unsurpassed performance. The flagship device, SiC620R is capable of 70 A and achieves more than 95 % efficiency in a typical multiphase buck converter design. The device has several package enhancements that enable it to offer superior MOSFET dynamic performance. Combined with Vishay’s state-of-the-art Gen IV MOSFET technology, these enhancements enable 3 % better efficiency and over 50 °C lower operating temperatures compared to previous generation DrMOS devices while shrinking the footprint by 33 %.
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Application Software for Electronic Test & Instrumentation
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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High Impact Shock Test System
KRD16 series
High impact shock test system meets MIL-S-901D standard which covers shock testing requirements for ship board machinery, equipment, systems, and structures, excluding submarine pressure hull penetrations. The purpose of these requirements is to verify the ability of shipboard installations to withstand shock loadings which may be incurred during wartime service due to the effects of nuclear or conventional weapons.
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Phase Noise Test System
PN9000 System
Noise eXtended Technologies S.A.S.
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a NIST tested instrument.
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Cogging Test System
CTS
Magtrol’s Cogging Test System is a stand-alone test system designed to control and measure Detent Torque, Cogging Torque and Friction Torque. The test System includes a precision geared motor, a TS Series Torque Sensor integrating a 5 000 pulses encoder. CTS 100 to CTS 102 have a built-in security clutches to avoid system overload by mishandling when not in use. The geared motor drives the MUT (Motor Under Test) at a low speed from 1 to 10 rpm (respectively 8 rpm for CTS 103 and CTS 104), while acquiring its cogging torque related to angle position.
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Electrolyzer Test Systems
Advanced Test System for Research & Development of PEM Electrolyzers
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Traveling Wave Tube Test System
Yelo has a wealth of experience in developing and customizing test systems for the Travelling Wave Tube (TWT) market. TWT testers feature specialized power supplies, measurement equipment, and comprehensive control and safety systems.A rugged PLC is used to control all voltages and perform all monitoring functions. User interface and datalogging functions are provided by a supervisory PC that is electrically isolated from the PLC. Power Supplies are solid state with optical fibre barriers to ensure that all control/monitoring is carried out at safe voltages, and with maximum noise immunity. All safety interlocks are hardwired, and the testers are equipped with emergency shutdown features for added security.
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VFTLP+ Test System
4012
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Low Frequency Test Systems
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Our imaging low-frequency inspection systems are excellently suited to displaying internal defects with high resolution and high dynamics.
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Ultrasonic Testing Systems
Matec Instrument Companies, Inc.
Matec designs and constructs a wide range of ultrasonic testing systems, from small laboratory systems designed for simple scanning applications to complex multi-axis systems capable of scanning large parts and complex contour geometries. Click on the links below to learn more about our systems.
