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Suspension Component Test Systems
Acoustic quality, vehicle dynamics and stability, and driver comfort play an increasingly important role in the development of new chassis and suspension systems – both passive and active. Noises in suspension components can cause customer dissatisfaction and lead to high warranty costs and are difficult to diagnose especially on historically-used, noisy hydraulic test rigs. The MB Suspension Component Test Rig (SCTR) enables dynamic simulation of real road excitations and synthesized waveforms, performing industry-standard Force-Velocity and Force-Displacement tests and low speed friction tests, and assessing other NVH and structure-borne noises for comprehensive performance characterization and sound and vibration analyses on a wide variety of chassis components.
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Compact Professional IC Tester
ChipMaster
The ABI ChipMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The ChipMaster is designed for testing digital ICs with up to 40 pins through a ZIF socket (see LinearMaster for analogue devices). A range of adapters is also available for SOIC and PLCC devices.
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EMC Compliance Test Systems
ECTS2
Now in its second generation, the ADAPTIVE POWER EMC Compliance Test Systems use a greatly enhanced harmonics and flicker measurement system and newly designed flicker impedance options to support single and three phase AC harmonics, flicker and AC and DC immunity compliance testing up to the maximum required current of 75A per phase.
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Pneumatic Horizontal Shock Test System
KRD12 series
The KRD12 series shock test system is used to measure and determine the horizontal impact resistance of a product or package, and to evaluate the reliability and structural integrity of the test unit in a horizontal impact environment. The system can perform conventional half-sine wave, post-peak sawtooth wave, or trapezoid wave shock test to realize the shock energy that the product is subjected to in the actual environment, thereby improving the product or packaging structure.
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Electrical Equipment Test System
C8900
Chroma Systems Solutions, Inc.
The 8900 electrical equipment ATS can complete measurement and test procedures simultaneously and automatically. This automated functionality decreases the risk of errors due to improperly written tests. Chroma 8900 solves the Electrical Safety Test and special FUNCTION test solution.
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Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Mobile Measuring & Testing Systems
Individual testing tasks for technical plants and large machines often require the use of a large number of measuring instruments on site, which are difficult to network with each other and which, in the case of complex measurements, require a lot of experience and time in operating the measuring equipment and analysing the recorded measured values. The applications and possible uses can be quite different:
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Belt Starter Generator Test Systems
D&V has developed 12 V, 48 V and higher voltage BSG and ISG testing systems for performance, endurance and production testing, complete with thermal chambers, chillers and assembly lines.
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EST-200 Emission Safety Test System For Toys
Hangzhou Everfine Photo-E-Info Co., LTD
The system can test the radiation intensity, irradiance, light color expansion angle, peak wavelength, dominant wavelength, bandwidth, etc. of various toy light emitting devices. The measurement conditions meet the CIE127 standard, and the test report meets the ENIEC62115:2020 standa
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IC Measurement Technology
Emission
is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins.
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Fully-automated Test Systems
Special mechanical systems/solutions
Foerster Instruments, Incorporated
Alongside individual test instruments, we collaborate closely with our customers to develop and produce customized test systems for their application. Following a consultation with our product and sales specialists, we develop a concept to suit you. For the production process that follows, we enter into product-specific collaborations with professional mechanical system manufacturers to achieve the best possible solution. We are also happy to work with mechanical system suppliers proposed by our customers. These suppliers are often familiar with the peculiarities of the component and know how to handle them. Even after the production stage, we assist you with commissioning the test system and are are on hand to answer any questions afterwards.
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802.11be Test System
IQxel-MX
Next generation wireless devices Access Points, CPEs and client devices like smartphones or tablets based on the IEEE 802.11be EHT (Extremely High Throughput) standard require stringent RF performance to meet the latest standard requirements.
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MB Millenium Dynamic Test Control System
MB Millenium
The MB Millenium™ from MB Dynamics is a multiple-input, multiple-output (MIMO) and/or a multiple-input, single-output (MISO) dynamic test control system.
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Electronic Transformer Test System
UI2000-ET
• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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RF TEST AND MEASUREMENT SYSTEM
OE8000
RF Test Measurement System (TMS) utilizes microwave photonics techniques for automated measurement of ultra-low phase noise oscillators.
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Portable Test System
MT786
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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PCI / PMC / CompactPCI Test System
PCITS
The CPCI850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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Electrical Protective Equipment Test Systems
СВС-50М (СВС-100М)
CBC-M-series systems are designed for high-voltage testing of electrical protective equipment and insulated hand tools. Withstand tests are carried out with AC voltage (CBC-50M: UAC ≤ 50 kVRMS; CBC-100M: UAC ≤ 100 kVRMS) at industrial frequency (f = 50 Hz).
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IC Side Channel Analysis
These probes allow you to couple fast, transient magnetic field, E-field, and current pulses into ICs.
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Power ICs
Vishay Siliconix Power ICs include switching regulators, drivers, battery management ICs, and bus interface devices, as well as single-package microBUCK® converter and DrMOS solutions.
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Autoinjector Testing System
Instron’s Autoinjector Testing System is designed to perform full functionality testing on a wide variety of drug delivery devices, including safety syringes and both needle shield and button-activated formats. Developed in collaboration with pharmaceutical manufacturers and CDMOs, the system captures essential performance requirements such as activation force, injection time, dose accuracy, needle depth, and click detection. It supports compliance with international standards like ISO 11608 and can be configured for integration with collaborative robots to enhance automation and throughput.
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Memory Test System
T5830/T5830ES
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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3-Phase Relay Testing System
TRES
With high power outputs packaged in an extremely compact and rugged system, the TRES has a tremendous power-to-weight ratio. The design incorporates the latest in modern digital microprocessor technology to achieve unbeatable output characteristics in terms of power, accuracy, low distortion, and dynamic capability. This hi-tech solution enables the testing of many different functions required in relay testing without the need of additional accessories.
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In-Circuit Test Systems
TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.
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Test Systems Integration
Highly flexible test solutions that are cost effective offering basic tests that easily adapts to high product volumes and complicated tests. Mobile computer based test stations provide a wide variety of test solutions at efficient costs.
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Dynamic and Fatigue Testing Systems
Instron offers an extensive range of fully-integrated dynamic and fatigue testing systems from 1000 N up to 5000 kN. Incorporating servohydraulic, servo-electric and linear motor technologies, these test instruments cover a broad range of fatigue, dynamic, and static testing applications. These applications include high-cycle fatigue, low-cycle fatigue, thermo-mechanical fatigue, fracture mechanics, crack propagation and growth studies, fracture toughness, bi-axial, axial-torsional, multi-axial, high strain rate, quasi-static, creep, stress-relaxation, and other types of dynamic and static tests.
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Various Types of Automatic Hardness Testing System
Various Types of Automatic Hardness Testing System
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HSI System Test Panel
TA-500
This panel was designed to test primarily the NSD360 series of HSI systems. Panel allows running the complete system on the bench. Included is a panel mounted TA-902 API which can also be used for testing external instruments via a panel mounted switch. The API and standard meter drives allow testing many different instruments.
