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Mixed Signal Test Systems
MTS1020i
The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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IC Test Services
With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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Leak Test System
NorCom 2020
The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.
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Electrodynamic Vibration Test Systems
CV-series
CV-series is suitable for transportation tests. The lateral support stiffness and maximum displacement of the CV-series are large enough to be accommodate vibration tests of the specimens with high center of gravity.
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TDR Test System
GATS-310
The GATS-310 TDR test system provides you with the ability to test nets as down to less than 1/2" in length using Industry Standard Techniques.
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VLF test system
BAUR PHG 80 portable
Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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Portable Test System
MT786
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Air Data Test Set System
B511
The BRAT Option B511 is an option to the BRAT Test System utilizing Commercial-Off-The-Shelf (COTS) equipment. The system is used to augment the existing BRAT capabilities to test rate of change of altitude or pressure.
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Autoinjector Testing System
Instron’s Autoinjector Testing System is designed to perform full functionality testing on a wide variety of drug delivery devices, including safety syringes and both needle shield and button-activated formats. Developed in collaboration with pharmaceutical manufacturers and CDMOs, the system captures essential performance requirements such as activation force, injection time, dose accuracy, needle depth, and click detection. It supports compliance with international standards like ISO 11608 and can be configured for integration with collaborative robots to enhance automation and throughput.
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Digital Logic ICs
Renesas' general-purpose logic devices support the information equipment and computer fields, which demand small size and high performance. With a variety of power supply voltages, functions, and capabilities, these logic devices provide strong support for specialized applications such as bus switching, level conversion, and clock-related applications.
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Keypad Test system
Mistral
Engineering Solutions Inc. (ESi)
The Mistral Keypad Test System has been designed to be the least expensive, easiest to use full featured tester for membrane switch assemblies. The idea is to combine a small, smart "pod" with a PC running software that makes full use of the Windows® graphical interface. Make it as easy to set up and use as possible yet include all the features you need.
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Advanced Test Systems
ATS
The commercial version of the RTS-503, this one is not built with the rugged qualifications of the RTS-503. The case is plastic and fuses are used. Otherwise, the internal components and software capabilities are very similar.
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300mm Single Touchdown Burn-in and Test System
FOX-15
Up to 15 wafers at a time Known Good Die solution Lowers production cost
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Test Systems & Sub-systems Development and Integration
Research, development and the production of electronic test equipment, systems and subsystems for the industrial, scientific, and defense markets.
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±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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Modular Laser Diode Test System (PXI/PXIe)
LTS8620
The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
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IC Pick & Place Handlers
Chroma's IC test and handler solutions assure that IC packaging meets the original design specifications and verify the performance of the IC before it is assembled into the electronic product.
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AC Hysteresis Graph Test System
DX-2012M
Automatic measurement of the dynamic magnetic hysteresis loop of oriented and non-oriented silicon steel under the condition of 50 Hz, 60 Hz, 400 Hz and 1 kHz, accurate measurement of the static magnetic characteristic parameters such as amplitude permeability μa, loss angle δ, specific total loss Ps, remanence Br and coercivity Hc. With special testing fixture, it can directly measure the iron core and stator core of the transformer.
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Benchtop/Portable Cable/Harness Wiring Test System
CKT1175-10
Designed for wiring testing requirements requiring up to 2,000 test points, the CKT1175-10 is ideal as a benchtop or portable test system. The system is packaged in an enclosure specifically designed to be used in rugged environments. The basic 500 test point system is 20.5 in. (521 mm) wide X 12.0 in. (305 mm) high X 16.05 in. (408 mm) deep; the 500 test point expansion units are 20.5 in. (521 mm) wide X 6.00 in. (153 mm) high X 16.05 in. (408 mm) deep.
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Special leak test, pressure testing machines and systems from TQC
Leak Testing
TQC have supplied automatic leak test / pressure test equipment for over 25 years. The supply has included simple manually connected leak test fixtures to fully automatic, high speed production leak test facility. TQC supply leak testing equipment to meet the customers requirements.
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Haptic Testing System
The Air Ventilator Haptic Test System performs automatic functional tests on air ventilation components to measure the force necessary for the execution of movements in the different components of the part. The movements are performed by a 6-axis robot that forces the components of the part to follow the desired routes while storing data on the force expended. This particular machine tests movable fins and knurled wheels by performing four test motions on each fin and two on each wheel.
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Multi-Purpose RF Test System
SPA1241
The S - Series multi-purpose RF test system can be used in many applications such as R&D lab, ATE factory testing, EMC testing, field testing, and general purpose RF design. The S - Series is a flexible alternative to expensive and bulky RF test equipment. As shown in the setup in the upper right the S-Series system can be utilized to simultaneously provide all RF functions using its 7 inch front panel display or can be connected to a larger monitor for ease of viewing multiple windows at the same time
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PXI Instrumentation Modules For Automated Test Systems
PXI-based test systems often require a variety of general-purpose instrumentation such as digital I/O, waveform generators, voltage & current sources and DUT power supplies.
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Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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Test Program Sets & Custom System Level Software
WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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Ethernet and Fibre Channel Test Platform
SierraNet M648
The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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HV AC Voltage Test Systems
Fivestar HV Testing Equipment Co., Ltd.
FSHV offers three different types of AC voltage test systems, the conventional type is AC test transformer design, mainly for testing objects of medium & low capacitance products, particularly for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load is inductive (like inductive voltage transformers). Another is AC resonant test systems, according to series resonance circuit XL=XC (2πfL=1/2πfC), by setting F frequency of power supply or L inductance of reactor, generate a pure sinusoidal waveform of the test voltage, and the required input power is only 1/Q. Variable frequency type operates in a frequency range from 20Hz to 300Hz, ideal for field commissioning test of power cables and GIS/GIL. Variable inductance type outputs continuous AC voltage of power frequency (50/60Hz), mainly for factory testing of high and ultra-high voltage cables, power transformers, GIS, etc.
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High Energy Shock Test System
KRD13 series
KRD13 series high energy shock test system is specially designed to meet the requirements of military and automotive testing. The system adopts the principle of pneumatic energy storage expansion. By adjusting the inflation pressure, various high-level acceleration tests can be easily implemented in a short stroke.For the high-G classic shock test, it’s equipped with the corresponding shock amplifier to complete high-peak shock test.
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ICE 3000 Series
ICE3006
The ICE3006 is an agile filter/amplifier cascade for the UHF frequency band with a VHF bypass. It enables simultaneous operation of multiple transceivers in the cosite environment. This filter/amplifier provides multiple poles of RF selectivity to reduce broadband noise, harmonics, and spurious signals while still providing full output power in transmit mode and excellent selectivity to interfering signals at the transceiver’s RF input in receive mode. All transmit, receive, and bypass switching is incorporated into the three-port design (LOS and SATCOM). The ICE3006 incorporates extensive Built-in-Test capability and is qualified for airborne applications. A mounting tray is available as an option for easy incorporation on your platform. Cost-effective modifications are available on the ICE3006. Please contact your sales representative at 513.870.9060 or Support@PoleZero.com for details.
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Memory Test System
T5221
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
