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Weapon Control System Test Set
MS 1102
- Provides serviceability checks on armament system- Portable instrument- Check the Bomb release sequence, practice bomb release sequence, rocket release sequence, fuzing, and jettison of aircraft stores- Helps to identify faults of conventional armament- Microprocessor based design
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Automatic Transformer Test System
TH2840AX
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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Wireless System For Test And Measurement
TM400 Compact
The TM400 system was designed to provide the ideal link between calibrated test microphones and measurement equipment such as SIM®, SIA SMAART Live®, TEF® or other systems. By using a radio link, long cables can be eliminated thus saving time and providing opportunities for additional measurements to increase accuracy. The microphone can even be moved around in the venue while the audience is present – something that is impossible with a cabled measurement microphone.
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Voltage Protection ICs
ST’s voltage protection devices prevent external overvoltage (or undervoltage) peaks from damaging circuitry. They are commonly implemented on the power charging patch of portable devices to prevent USB or AC charger power failure. ST’s devices offer the advantage of very precise voltage thresholds, so that the protection is activated accurately, and without fail.
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Transducer Test System
TTS-030
For the generation of unique bond links the use of high-quality components is an essential precondition. Despite all care in the production of ultrasonic transducers again and again unexpected effects occur, which only manifest themselves in the use of those transducers and which also have the reason in the transducer itself.
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Resonant Testing System
Originally designed to precrack specimens for fracture mechanics, the current versions offer much more possibilities due to a modular concept:*Bending up to 160 Nm*Tension/Compression up to 8 kN*Torsion
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Optics Test Systems
WAS 160: Wedge Angle Sensor
Optik Elektronik Gerätetechnik GmbH
Portable measuring head for wedge errors and radius of curvature, eg of car windshields, airplanes and helicopters. It can be used for any other glass panes.
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Portable System for High-Boltage Solid Dielectrics Testing
HVTS-70/50
Portable system HVTS-70/50 is designed for carrying out high-voltage withstand testing of cable insulation and other solid dielectrics with DC (rectified) voltage up to 70 kV and AC voltage up to 50 kV RMS at industrial frequency (f = 50 Hz).
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Projectile Speed Measurement Test System
This test equipment will help manufacturers, trading standards, consumer bodies, CPSC, CPSIA laboratories and regulatory authorities to check that they meet the requirements of ASTM F963 - 08 Standard Consumer Safety Specification for Toy Safety and ISO 8124-1:2009 projectile Safety of Toys –Part 1:Safety aspects related to mechanical and physical properties. It may also be valuable for certain sports equipment and related tests.
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Triple IC Optic Node
OX 733
Converts even weak Optic Signals to a high quality RF Signal. LED BAR Optic Level Display has been provided for ease of system maintenance. They are best suitable for Analog as well as Digital transmission to maintain BER, MER Characteristics. Green Tecnology incorporated - Aluminium Housing for maximum heat dissipation.- Frequency 40 ~ 1000 MHz- Optical Wavelength : 1290 ~ 1600 nm- Flatness ±0.75 dB- LED Bar Display for Optic Signal Level- High C/N, CSO & CTB Characteristics- Inward Extruded Aluminium Channels for Maximum Heat Dissipation- High Voltage Surge Protection- -13 dBm Sensitivity- RF O/P at 0 dBm : 113 dBµV
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Automotive & Industrial Cycle Testing System
CV
The CV is Bitrode's economical cycle life test equipment for the network based line of battery laboratory equipment. Designed to work with VisuaLCN Lab Client software, the CV provides standard or fully customized charge, discharge and rest cycles for automotive and industrial batteries. The Model CV is also useful for reserve capacity and charge acceptance testing with recharge.
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Pneumatic Horizontal Shock Response Spectrum Test System
KRD15 series
KRD15 series is the state-of-the-art shock response spectrum tester that adopts compressed gas energy to provide impact energy, push the shock hammer to impact the resonance plate, and generate high energy shock. Comparing to traditional pendulum shock response spectrum tester, this machine has the advantages of high energy, stable performance, high reliability, good repeatability, easy adjustment, safety and environmental protection. It is mainly applied in the industries of aerospace, aviation and ships.
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Universal Testing Systems (Up To 300 KN)
6800 Series
Instron’s 6800 Series universal testing systems deliver high-performance mechanical testing up to 300 kN. Designed for precision and durability, these systems offer exceptional measurement accuracy (±0.5% down to 1/1000th of load cell capacity) and fast data acquisition rates up to 5 kHz. Ideal for tensile, compression, flexure, torsion, peel, lap shear, and many other test types, the 6800 Series provides the flexibility and control needed to handle everything from delicate specimens to high-strength materials, making it a trusted solution for demanding testing environments.
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PCIe® Gen5 NVMe SBExpress Test System
SBExpress-RM5
The SANBlaze SBExpress-RM5 is a complete turnkey PCIe® Gen5 NVMe SSD Drive validation test system. The SBExpress-RM5 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen5 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM5 hardware provides a rackmount chassis with sixteen dual or single port front-accessible drives.
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Accelerated Life Test Systems
Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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Interface ICs
Easy to use, flexible, and reliable. Allegro’s sensor interface ICs offer accurate and fast output for signal conditioning in a wide range of applications, from electric vehicle HVAC systems to transmission oil pressure. Our innovative algorithms deliver robust EMC performance and provide critical diagnosticsthat support automotive safety.
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Modular Test System
DMT
The DMT Tester is a modular test system that allows rapid measurement of electrical and non-electrical parameters of functional units. The system also allows basic ICT measurement with optional accessories. It is conceived as modular, with the possibility of integrating a wide range of own and external instruments. The DMT tester is controlled by its own SCADUS software.
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ICE 3000 Series
ICE3009
The ICE3009 subsystem is an agile filter for the VHF-L, VHF-H and UHF frequency bands. It allows operation of a number of transceivers in a cosite environment. The VHF/UHF Filter provides multiple poles of RF selectivity to reduce broadband noise in transmit mode of operation and to reduce interfering signals at the transceiver’s RF input in receive mode at Have Quick II/IIa and SATURN tuning speeds. This design incorporates a flexible control scheme that can be configured at the factory for various radio interfaces (ARC-210, ARC-231, ARINC 429, etc.). The design is highly integrated and includes all filters, amplifiers, power supply, transmit and receive switching (including a bypass mode), and Built-in-Test (BIT). A mounting tray is available as an option for easy incorporation on your platform. This system is qualified for military applications. Cost-effective modifications are available on the ICE3009. Please contact your sales representative at 513.870.9060 or Support@PoleZero.com for details.
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Memory Test System
T5221
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Compression, Paper And Pulp Test Systems
From basic tension and compression testing to advanced materials testing
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Incircuit and Functional Test Systems
REINHARDT System- und Messelectronic GmbH
We offer test systems which vary in their expansion and can be used for different ranges of automatic testing.
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Standards Reference for Test Systems PXI Card
GX1034
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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AC / DC Electronic Loads – Benchtop Testing to Automated Test Systems
Chroma Systems Solutions, Inc.
Chroma is the global leader in Electronic Load manufacturing. Chroma’s AC Electronic Loads are designed for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources, and other power devices such as switches, circuit breakers, fuses and connectors. Chroma’s DC Electronic Loads are used for power testing in all markets including automatic test systems, LED, power supply testing, battery testing, and fuel cell testing. Chroma loads can do it all including full current down to 0.4VDC, CZ mode, user defined waveforms, timing measurements, and 3 current ranges per load. Chroma’s electronic loads come standard with either USB or RS232 ports for control and can be configured for GPIB (IEEE-488) control as well.
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High Voltage DC Cable Test Systems
We can offer from ±18kVdc to ±30kVdc units which all have automatic earthing for discharging capacitive loads. They are designed to perform tests on installed cables and jointing systems.
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Lamp Cap Temperature Rise Test System
TMP-L
TMP-L is according to IEC60360-1998 and GB2512-2001 (Standard method of measurement of lamp cap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards.
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Small IC Adapter for ZD Differential Probe Qty 2
PACC-ZD006
Small IC adapter for ZD differential probeQty 2
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Test System
UltraFLEX
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Hign Speed Bare Board Test System By Non-Contact Test Technologies
SX-750SUPERⅣ
Suitable for a wide range of applications. Can be connected to a wide range of machines: from hand press to reel mechanism and in-line mechanism. We offer docking with our customers own machines. Compact main tester simplifies integration via installation inside a mechanism. If requested, we will perform a study to decide which functions should be added.
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Resilient Modulus and Asphalt Testing System
The Resilient Modulus software features built and test sequences, and the capability to specify user defined sequences. Contact stress is automatically adjusted according to the above procedures as selected. Available waveforms include haver sine, sine, square and triangular, along with a user defined waveform selection. Optional peak & valley compensation ensures proper and quick matching of the load parameters. Real time displays of the prescribed versus actual dynamic load or the dynamic deformation measurements by each sensor are always present. Deformation ratio of the two sensors, Rv (to ensure that the two deformation sensors are in agreement) and Mr are also calculated in real time. During export, curve fitting is done to fit the results to models that predict Mr as a function of σm, σd, and CP (cell pressure). Four different functions are calculated automatically
