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Product
LabVIEW Professional Development System
System
ntegrate hardware from a variety of measurement instruments and devicesIntuitive graphical programming syntax to simplify automationBuild custom user interfaces for engineering applicationsBuilt-in algorithms for signal processing, analysis, math, and PID controlSoftware engineering tools to debug, validate, and deploy codeOne-year SSP membership for technical support, online training, and software upgrades
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Product
D-Mic Testing System
BK3012V2
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Easy to use and faster than human testers can load, the new BK3012V2 is the upgrade of our popular BK3012 D-Mic tester. Setup is even easier than for the BK3012 and you can enter specifications and be ready for testing in a few minutes. As well as testing, the BK3012V2 can be connected to a computer, so you can keep your results and analyze them for current quality and trends over time.
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Product
Modular Test System
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The GS-X modular system is used for functional testing of medical devices and for testing the electrical safety of medical and general portable devices.
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Product
Portable Ruggedized Test System
BADGER
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Badger systems utilize NI's CompactRIO (cRIO), Single Board RIO (sbRIO), and/or CompactDAQ (cDAQ) hardware. The Badger product line offers high speed data acquisition/control and flexibility in an industrial package. Badger chassis and instrumentation have a 50 g shock ratings and a wide -40 to 70 °C operating temperature. These systems are ideal for automotive, industrial automation, remote monitoring, field service, and advanced control applications.
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Product
Automatic Test Equipment for Electronic Systems
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BAE Systems has designed and manufactured comprehensive test solutions for both military and commercial applications for more than 40 years. During this time, we have kept pace with the rapidly evolving market to deliver integrated, commercial-off-the-shelf solutions to our customers. Our test equipment consists of an open architecture, adaptable core that can easily integrate with additional instrumentation. This enables the development of unique configurations that support the full spectrum of avionics and electronics in use today.
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Product
In-line vacuum test systems
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Ensuring that products meet the highest quality standards is absolutely essential in the manufacture of food, pharmaceutical and cosmetic products in particular.Leak-tight product containers have a major role to play here. Leak-tight product containers have a major role to play here. Leakages allow the contents of a container to get out, but more importantly they also allow germs to get in, rendering the contents unusable.INDEC vacuum test systems monitor containers for leak tightness fully automatically within the production process. A wide range of containers, including bottles, jars and cans as well as tubs and trays, are tested for leak tightness by means of a non-contact inspection.The means to this end is a pre-existing vacuum or a vacuum created in the container expressly for the purpose of leakage testing. Containers which are not leak-tight are reliably identified and automatically rejected.These processor-controlled test systems are highly reliable and extremely easy to use, qualities which have played no small part in making them the first choice already for many companies throughout the world.
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Test System
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Product
Electrodynamic Vibration Test Systems
i-series
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Vibration tests have become diversified and specifications have become increasingly strict.i-series offer a user-friendly lineup with enhanced performance and durability.
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Product
Multi-Purpose RF Test System
SPA1241
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The S - Series multi-purpose RF test system can be used in many applications such as R&D lab, ATE factory testing, EMC testing, field testing, and general purpose RF design. The S - Series is a flexible alternative to expensive and bulky RF test equipment. As shown in the setup in the upper right the S-Series system can be utilized to simultaneously provide all RF functions using its 7 inch front panel display or can be connected to a larger monitor for ease of viewing multiple windows at the same time
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
Functional Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Benchtop Test System
300 Series Benchtop ATE
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The Circuit Check 300 Series benchtop ATE Test Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 300 Series Benchtop ATE, test procedures can become automatic, with test steps and go/ no-go limits easily programmable in common tabular form. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Product
Smart Sensing Systems
System
The Astronics Smart Aircraft System enables the gathering of information through sensor and IoT technology to help airlines gain the valuable insight needed to increase passenger satisfaction, improve operational efficiency, and lower costs.
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Product
Energy Metering ICs
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Analog Devices’ ADE energy measurement ICs address the challenges of next-generation smart meter architectures and are ideal for measuring active energy (kWh), apparent energy (kVA), reactive energy (kVAR), rms, and power quality with the highest accuracy in single phase and polyphase revenue meters, industrial instruments, and energy monitoring applications. ADI’s ADE energy measurement ICs combine analog-to-digital converters with fixed-function digital signal processors to perform critical measurements, while providing unparalleled functionality and ease of use.
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Product
LED Power Driver Test System
Chroma C8000
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Chroma Systems Solutions, Inc.
The Chroma 8491 ATS is equipped with optimized standard test items for LED driver testing (lighting & TV backlight). The user is only required to define the test conditions and specifications for the standard test items to perform the test.
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Product
Function Test Systems
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These specialist Automeg models test the function and integrity of wiring harnesses combined with active components such as relays, switches, contactors, diodes, LEDS, actuators and other active components.Our software takes the complex and traditionally long task of creating functional tests away from the test engineer and allows these to be created automatically, from existing ECAD data and our component library and automated software routines. All the different routes and subtests are automatically calculated in seconds.
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Product
High Voltage Test & Measurement System
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Hard-wearing and technically-sound High Voltage Test & Measurement System is developed to provide accurate results. These systems are widely used in power, electrical, engineering and other industries. They are designed using heavy-duty spare-parts to add strength with life to the systems. They are ideal to provide accurate results without any flaw to ensure to provide the best performance. These systems are perfect combination of easy usage, durability and high accuracy in results.
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Product
Positioning Test System
TS-LBS
Test System
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Product
Universal Testing Systems
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Instron universal testing systems are versatile, high-accuracy platforms (available in electromechanical and hydraulic variants) designed to perform a wide range of static mechanical tests, such as tension, compression, bend, peel, shear, puncture, and more, on virtually any material. They support force capacities from fractions of a newton up to thousands of kilonewtons, with precision load measurement, high data acquisition rates, and compatibility with thousands of accessories, including a wide range of extensometers, grips, fixturing, and automation solutions to meet demanding quality and throughput standards.
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Product
Stress Testing System
Load Dynamix
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LoadDynamix (former Swifttest) is famous for its IP based converged storage system stress testing, including iSCSI, SMB/CIFS, NFS, FC and HTTP/HTTPS based storage systems. Its GUI interface is very easy to use and allow customer engineer to fully configure all the parameters at the protcol layer. Nearlly all the major IP storage system manufacturers have LoadDynamix products in their test lab.
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
Test Instruments
Test Instrument
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Product
RF TEST AND MEASUREMENT SYSTEM
OE8000
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RF Test Measurement System (TMS) utilizes microwave photonics techniques for automated measurement of ultra-low phase noise oscillators.
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Product
Walking Test System Kit
PGA-710
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The PGA-710 Walking Test System is a complete kit designed to perform the walking test per ANSI/ESD STM97.2 and IEC 61340-4-5. The system consist of several devices designed for portability and to perform several different tests which includes measuring the voltage on a person in combination with floor materials and footwear.The kit includes the PGA-710B Data Logger, the PFM-711B Field Meter, CPM-720B Charge Plate Monitor, the PCS-730B Electrostatic Charger, Hand Held Electrode and the Prostat Autoanalysis Software version 2.0.
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Product
(250 kN) Fatigue Testing System
8802
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The Instron 8802 is a high stiffness, 250kN fatigue rated servohydraulic testing system that meets the challenging demands of both static and dynamic testing requirments. The 8802 systems include a range of configurations available to provide complete testing solutions to satisfy the needs of advanced materials and component testing. The design of the 8802 frame makes it ideal for installation within a laboratory environment, generally without the need for strangethened floors or raised ceiling heights.
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Product
Power ICs - MicroBUCK® - Voltage Regulator
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*Highly integrated microBUCK POL solutions deliver high efficiency while reducing costs*Each family offers a large portfolio of high density parts with common pinouts, allowing designers to scale for the best combination of cost and performance*Our PowerCAD simulation tool allows users to select the appropriate microBUCK regulator and generate a full circuit schematic**For performance optimization and comparison purposes, the schematic can then be edited as required.**Once the basic circuit is created, the user can perform DC, transient, and start-up simulations with visibility of all the circuit node waveforms.**Following these steps, the PowerCAD 2.0 simulation tool generates a bill of materials (BOM) available for online ordering.
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Product
Single Event Effects Test System
SEE-RAD
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The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.





























