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Product
Resistance & Capacitance Box
RCS Series
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The RCS-box combines the features and specifications of both the R-box and the C-box in one convenient package. Ideal for setting timers, oscillators, and filters, the resistance and capacitance may be used independently, in series, or in parallel. A shorting link allows them to be coupled or separated.
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Product
Cell Testing
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PEC offers a wide range of cell testers, starting from the 5A desktop test system (ACT0505), to our range of 50A cell testers for more standardized cycling (CT0550) and our advanced cell testers with capabilities up to 4000A (ACT0550). All systems support parallel switching for achieving higher currents.
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Product
Solution For Test-in-Strip
InCarrier
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The InCarrier process is based on a strip-like device carrier for single devices that combines the advantages of the singulated device test with the advantages of high parallel strip test. Leveraging the strip like design the InCarrier ensures robust test-handling for even smallest devices and supports high parallel test.
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Product
Programmable Current Preamplifier
99539
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The Model 99539 is a modular, multi-channel current preamplifier with parallel, logic level, gain control input. It consists of circuit boards which plug into a 3 1/2" high by 19" wide rack chassis.
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Product
20KVA to 200KVA Industrial UPS (3Ø – 3Ø)
NSP Series 20KVA to 200KVA
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- Designed for powering critical Industrial and IT systems- DSP controlled IGBT based PWM technology- Design topology enables N+1 parallel redundancy- Industrial grade high speed CAN bus communication- User Friendly Matrix LCD and LED mimic front control and digital monitoring- Fully rated make before break maintenance bypass operation- Optional break-less load transfer via static switch- Low harmonic distortion- High crest factor tolerance and dynamic stability- Lower TCO- Continuous full rated power at ambient as high as 45°C- N+1 Parallel operation of UPS without any common hardware- Advanced Communication Capability (RS485/Modbus/SNMP)- High branch fuse clearing capacity- On-line battery bank test without load disconnection- Compact, elegant, and light weight enclosure- Easy installation with wheels for maneuverability and front bottom terminals
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Product
Multi-Channel Synchronization Module for M8190A, M8020A or M8030A
M8192A
Synchronization Module
Complex testing sometimes requires playing multiple waveforms in parallel (e.g. multi-emitter testing). The M8192A synchronization module allows engineers to synchronize up to 12 M8190A channels and fits into a standard AXIe frame.The M8192A synchronization module also supports testing of high-speed digital busses like PCI Express.Test efficiency can be increased by testing up to 10 lanes with the M8051A and the M8041A BERT modules in parallel. These can be synchronized by the M8192A module.
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Product
QW-AddIn For Autodesk® Inventor® Software
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QW-AddIn for Autodesk® Inventor® Software is a QuickWave plug-in for Autodesk® Inventor® Software, a wide-spread mechanical tool, allowing defining a complete project for electromagnetic simulation, also periodic structures and axisymmetrical structures (V2D), directly in the popular CAD environment. A set of self-explaining dialogues provides very convenient tool for setting the electromagnetic properties such as assigning the materials, adding ports, boundary conditions, setting postprocessings and excitation parameters.Automatic mesh generation using Automatic Meshing Intelligent Generation Option (AMIGO) optimises the meshing taking into account requested wavelength resolution in all media, while avoiding unnecessarily small cells. Additionally QW-AddIn for Autodesk® Inventor® Software can be used for optimisation and parameters sweep with QW-OptimiserPlus.QW-BHM is available and heating parameters can be defined together with rotation in XY plane along axis parallel to Z axis. Creating proper axis of rotation can be done by selecting edge or solid body from the project. It will contain the middle point of selected object and its location can be modified either with the mouse or by entering new coordinates.
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Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
MEMS And Sensor Test Automation Platform
Sense+
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Sense+™ ultra-precise MEMS & sensor test automation platform allows for significant improvement in test accuracy, parallelism for a lower cost of test, and the ability to handle and inspect, small delicate sensors. Fully configured, Sense+ delivers a one-pass automated test, inspection, and metrology for the most complex MEMS devices including <1 mm WLCSP.
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Product
TRF Manager 9
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Configuration by using a PC, this is one of the major TRF generator attribute. Instruments have factory settings suitable for common applications and contain the most popular test patterns. But many users want to customize the setup or set the instrument according to specificic application requirements. They also may want to adjust parameters, that cannot be accessed by any other way. That is what TRF Manager 9 (optional software pack) can do. And much more! Pattern generators of the TRF-498 and 598 series use a parallel interface for connection with PC. Basic setup can be realized by using Pattern Manager, free software downloadable from our site. For advanced settings there is available TRF Manager 3 software. For more detailed information see the TRF-498 and TRF-598 section, please.
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Product
Battery Tester
CS-3001
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The CS-3001 test system records all block voltages, total voltage and current during a discharge test. The modular design makes it easy to connect most of all battery installations, starting from a single block and ending up with 960 block voltages. Up to four parallel strings can be tested. All measuring modules are electrically isolated (600VDC CAT III, 5000VAC test voltage).
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Product
Parallel Electrode SMD Test Fixture
16192A
Test Fixture
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
Digital Acquisition Card
PI-41000
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The PI-41000-4G is a CompactPCI® bus based instrument card that allows the user to capture up to 32-bits of digital data into an on-board memory at clock rates up to 120 MHz. The inputs are software configurable to provide one 32-bit wide channel, one 16-bit wide channel with double depth or two 16-bit channels. When configured with a single 16-bit input, the card will capture at up to 120 MHz. When configured with two 16-bit inputs or as a single 32-bit input, the card will capture at up to 80 MHz. Each digital data channel requires three timing signals, frame, line and pixel to accommodate the data capture. When operating in a two channel mode, clocks from channel A can be used to provide timing to channel B. For wider words or multiple channels, more boards can be used in parallel.
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Product
I2C Interface for Digital I/O Control
EE301-I2C
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Cable can be used with EE301-I2C or EE301-DCMI Model Numbers only. Cable + Power for Loads & Control Modules / Connects to a PC Parallel Port / Supports (2) Electronics Loads & Control Modules / 6' Power cable & 5' Data cable
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
AMIDA 5000 Tester
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AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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Product
FLIM Upgrades for Olympus
FV1000
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*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excitation by bh ps Diode Lasers*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Detection Wavelength Range from 360 nm to 900 nm*Excitation by Ti:Sa Laser, OPO, or by bh ps Diode Lasers*Systems for Multiphoton FLIM and Confocal FLIM*Systems are Modular: More FLIM Channels can be Added
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Product
Digital Control Step Attenuator
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Digital control attenuators with TTL parallel control offering fast switching speed and high attenuation accuracy
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Product
Voltage Output D/A Converters
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Analog Devices offers a large family of resistor string and R-2R voltage output (VOUT) D/A converters (DACs). From 8 bits up to 20 bits of resolution, single to 40 channels, integrated or external reference, parallel, LVDS, serial SPI or I2C interface, with high temperature operation, we have a D/A converter to suit your application. We provide precision, buffered, and unbuffered rail-to-rail VOUT D/A converters with up to ±1 LSB INL and DNL specifications and excellent offset and gain error. Our D/A converters work well in a wide variety of open-loop or closed-loop systems—adjusting gain, offset, and many other signals.
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Product
3U cPCI Serial Power Backplanes
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CompactPCI Serial is an industrial standard for modular computer systems. It is based on the established PICMG 2.0 CompactPCI standard, which uses the parallel PCI bus for communication among a system’s card components. In contrast to this, CompactPCI Serial uses only serial point-to-point connections.
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Product
High Power DC Electronic Load
63200A series
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The 63200A series high power DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more. The 63200A series have three operating voltage choices, 150V, 600V & 1,200V, with models covering power levels from 4kW to 24kW and up to 2,000A in a single unit. The DC loads have unique user defined waveform (UDW) capability and external analog modulating input for s imul a t ing re a l-wor ld, cus tom waveforms. Another distinct feature is the dynamic auto-frequency sweep function, which enables detecting a UUTs worst case output deviation across a wide range of current frequencies. In addition, a 255-set of data storage function has been built in for recall of the stored settings at any time. For automated testing, the save and recall functions can save a great deal of time.
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Product
PXI Source Measure Unit
Source Measure Unit
PXI Source Measure Units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility. These features include high channel density for building parallel SMU test systems, deterministic hardware sequencing for minimizing software overhead, and high-speed update and sample rates for quickly changing setpoints and acquiring data. Additionally, the flexible sampling rate and streaming capability of PXI SMUs allows you to use the instrument as a digitizer to capture transient behavior, and the digital control loop gives you the ability to adjust the transient response of the instrument. The ability to change the transient behavior of the SMU, called SourceAdapt, reduces SMU settling time and minimizes overshoot and oscillations, even with highly capacitive loads.
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Product
Testing Multi-Radio Mobile Devices
IQxstream
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With LitePoint's IQxstreamTM mobile test system you will have all the capability you need to fully test many 3G and even 4G cellular radios and standards. Moreover, the system is designed to reduce per-device test time and cost because of its unique parallelism architecture. A 100 MHz capture capability means that it can test adjacent channel leakage ratios (ACLR) in one, five-channel capture.
