Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
-
product
Fluorescence Microscopes
Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology. Our confocal systems enable cell biologists to study function and structure using live-cell imaging in cell cultures and invertebrate model organisms at speeds and durations previously not possible. Bruker’s super-resolution microscopes are setting new standards with quantitative single molecule localization which allows for the direct investigation of the molecular positions and distribution of proteins within the cellular environment. Our latest addition, Luxendo light-sheet microscopes, are revolutionizing long-term studies in developmental biology and investigation of dynamic processes in cell culture and small animal models.
-
product
Electronic Store Of Resistances
PS8
The module is intended for use as part of information measuring systems based on the VXI bus for software setting of resistance values with a given step along three independent channels.
-
product
DC Electronic Loads
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
NGI DC Electronic Loads
-
product
Electronic Primary Injection Test Set
eKAM
eKAM is the new fully automatic electronic primary injection test equipment. e KAM test system includes two portable units: one control unit with a large graphical display, that adjusts the output, and one current unit (up to 2000, 3000, 5000A). It can also perform Step and Touch tests and ground resistance tests.
-
product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
-
product
Electronic Outside Air Temperature
OAT
The outside air temperature sensor is an electrical component that complements the control of a modern heating system.
-
product
Advantage Xi Radar Scan Converter
Curtiss-Wright Defense Solutions
The Advantage Xi radar scan converter is a half-size PCI card. Radar video arrives into the card through the PCI bus, which allows the card to be used in a client-server configuration with radar distributed over a network, or in conjunction with a radar interface card such as the Virgo PCI and Osiris PCI.
-
product
Printed Electronics & Printed Sensors
The first membrane switch was developed and produced in 1978 using printed electronics. Conductive pastes can now also be printed on substrates such as paper, textiles, or metal in addition to polyester. Our functional foils and printed electronics enable compact, and extremely efficient electronic products that are used in every industry. Processing intelligent pastes that have various physical properties enable the production of new and innovative applications in minimized form factors without the use of additional, highly complex electronic components.
-
product
DC Electronic Load
Siglent SDL1000X series Programmable DC Electronic Load features an input range up to 150V/30A/300W. CC Dynamic mode frequency is up to 25 kHz. It delivers stability over a wide range of applications and can meet all kinds of testing requirements including: Power, battery/handheld device design, industry, LED lighting, automotive electronics, and aerospace.
-
product
Wall-Mounted Electronic Energy Meter
MWH-7W
The MWH-7W series is an electronic energy meter with excellent performance, the main function is high-precision energy metering, the panel has LCD display, the energy value is clear and easy to read. The power meter provides functions such as pulse output and RS485 communication interface, which is convenient for the user to check or structure into a centralized meter reading system.Panel and wiring cover with lead seal, in accordance with CNS 14607 specification design.
-
product
Electronics Consulting
Our approach to consulting is unique. We encourage you to participate in every phase of the study. We provide you with all the information and knowledge that you need to repeat the study and perform future studies independently. Our reports are detailed and comprehensive. A consulting project may get over in a set time period but we expect our relation to continue. Our mission is to empower you through our products and services.
-
product
Scanning Tanks
Our ultrasound test tank systems are custom built to suit your requirements and additional features can be included.
-
product
Automation Software For Aim-TTi Power Products Including LD And LDH Series Electronic Loads.
Test Bridge
Test Bridge software is a simple Windows application intended to make it possible to create a test sequence that can control up to four Aim-TTi products and record measurement results in graphical and tabular form.
-
product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
-
product
Electronic Loads
Chroma Systems Solutions, Inc.
Power conversion testing for automated test systems, LED drivers, power supply testing, battery testing, and much more.
-
product
Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
-
product
Regenerative DC Electronic Load
IT8000 Series
IT8000 series is a family of high power regenerative electronic loads with compact size. The highly integrated capability enables the e-load to simulate various e-load characteristics, and return the consumed energy back to the grid cleanly, saving costs related to energy consumption and cooling, meanwhile eco-friendly. With modular high power density design, IT8000 provide up to 18kW in 3U space.
-
product
Electronic Calibration Module (ECal), 26.5 GHz, 3.5 Mm, 2-port
N4691D
The Keysight N4691D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4691D is a precision 2-port ECal module that supports 3.5 mm connectors up to 26.5 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4691D is included for securing your ECal module and accessories.
-
product
Variable-Frequency Scanning Matrix
AllWin Instrument Science and Technology Co., Ltd.
1. Continuous Variable-frequency2. 4 way scanning matrix3. Constant pressure output
-
product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
-
product
Atomic Force Microscope
DriveAFM
The DriveAFM is Nanosurf’s novel flagship AFM platform: a tip-scanning atomic force microscope (AFM) that combines, for the first time, several capabilities in one instrument to enable novel measurements in materials and life sciences.
-
product
acA2440-75uc, Color USB3 Vision, 5 MP, 75 FPS Area Scan Camera
785907-01
The acA2440-75uc is a Color Basler Ace USB3 Vision Camera with a 5 MP resolution and a maximum image acquisition speed of 75 frames per second. The acA2440-75uc uses a IMX250 sensor and is quality tested and calibrated for high performance and reliability. This camera can be used with NI hardware and software to build machine vision systems.
-
product
1800~3000W DC Electronic Loads
JT633 series
Nanjing Jartul Electronic Co., Ltd
JT633 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT633 series load very suitable for testing power supply when produced in large quantity. Besides, JT633 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT633 series load satisfing most of R&D requirements.
-
product
DC Electronic Load Module, 1U Height, 60 V, 40 A, 200W
N6792A
The Keysight N6792A is a 200W, 1U electronic load module for the N6700 series modular mainframe.
-
product
Programmable DC Electronic Load - (Economical)
63200E Series
The 63200E series are high power DC loads that include a choice of three operating voltages, 150V, 600V and 1,200V, with power levels from 2kW to 24kW and up to 2,000A in a single unit. Power levels can increase up to 240kW when multiple units are paralleled.These high power loads are designed for testing a wide range of EV products including DC charging stations, car battery discharge, on board charger power components, and other power electronics components. With its high power capabilities, parallel control and dynamic synchronization functions make this load ideal for automotive batteries, fuel cells and more. The 63200E load's master/slave control application enables units with the samevoltage specification to be used in parallel and synchronized dynamically to meet the power testing requirements. In addition, a 255-set data storage function has been built-in for recall of the stored settings at any time. When used in automated testing, the save and recall functions can save a great deal of time.
-
product
High Soeed CMOS System on Chip (SoC) Line Scan Image Sensor
LS4k
The LS4k is a high speed CMOS System on Chip (SoC) line scan image sensor optimized for applications requiring short exposure times and high accuracy line rates. It incorporates on chip two pixel arrays consisting of 2 rows with 4,096 7µm pitch pixels and 4 rows with 2,048 14µm pitch pixels respectively, a high accuracy (12-bit) high speed (84MHz) analog-to-digital conversion (ADC), and sophisticated on chip optical calibration for PRNU, DSNU, and lens shading correction.
-
product
4-Sensor R-G-B (Prism) Color Line Scan Cameras
In addition to 3-sensor prism line scan cameras, JAI's Sweep+ Series includes a set of 4-sensor multispectral line scan cameras designed to simultaneously capture R-G-B image data in the visible light spectrum and image data in the near infrared (NIR) light spectrum.
-
product
Digital Electronic Tensile Test Machine
Shenzhen Chuangxin Instruments Co., Ltd.
The Tensile Testing Machine is widely applied to test the tensile, tear, peel, and bend of all kinds of materials, such as metal, cable and etc, it’s used to test the tensile, tear, peel, compressive strength and bending of the material. It conforms to the standard of GB, ISO7500/1, JJG475-88, ASTME4, DIN5122, JISB7721/B7733, EN1002-2, BS1610, and CNS9471/9470.
-
product
acA720-520um, Monochrome USB3 Vision, 0.3 MP, 520 FPS Area Scan Camera
787072-01
Monochrome USB3 Vision, 0.3 MP, 520 FPS Area Scan Camera - The acA720-520um is a Monochrome Basler Ace USB3 Vision Camera with a 0.3 MP resolution and a maximum image acquisition speed of 520 frames per second. … The acA720-520um uses a IMX287 sensor and is quality tested and calibrated for high performance and reliability. This camera can be used with NI hardware and software to build machine vision systems.





























