Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Widefield Confocal Microscope
Smartproof 5
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The versatile ZEISS Smartproof 5 widefield confocal microscope is your integrated system for surface analysis: fast, precise and repeatable. Put it to work on a wide range of industrial applications - such as roughness and topographical characterization - that come up every day in QA/QC departments, production environments and R&D labs. This high quality confocal system is driven by the powerful software ZEISS Efficient Navigation (ZEN) to bring you the added benefits of maximum user comfort and increased productivity.
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High Power DC Electronic Loads
63200A
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Chroma Systems Solutions, Inc.
Chroma High Power DC Electronic Loads provide wider operating voltage and current ranges up to 240kW, sine wave loading, dynamic frequency sweep to 50kHz, digitizing, MPPT, an impressive front panel that tilts, and the highest accuracy available (voltage 0.015% + 0.015% F.S. and current 0.04% + 0.04% F.S.) – all with an incredibly high power density (6kW @4U).
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DC Electronic Load Module, 1U Height, 60 V, 40 A, 200W
N6792A
Load Module
The Keysight N6792A is a 200W, 1U electronic load module for the N6700 series modular mainframe.
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Conductivity-Resistivity Sensor Electronics and Integral System with PVDF Sensor
2850
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The Signet 2850 Conductivity/Resistivity Sensor Electronics are available in various configurations for maximum installation flexibility. The universal mount version is for pipe, wall, or tank mounting and enables single or dual (digital versions only) inputs using any standard Signet Conductivity/Resistivity sensor. The threaded j-box version can be used with these same Signet sensors for submersible sensor mounting. It is also available as a combined integral system configuration for in-line mounting and includes a conductivity electrode in a choice of 0.01, 0.1, 1.0, 10.0 or 20.0 cm-1 cell constants. The 2850 is ideal for applications with a conductivity range of 0.055 to 400,000 S or a resistivity range of 18.2 M to 10 k.
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SQUID Electronics
XXF-1
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It is designed to satisfy the needs of nearly all low-Tc SQUID applications. Additional integrated current sources provide e.g. bias current and calibration pulses for TES applications. These current sources together with an additional switchable feedback path make two-stage SQUID operation very convenient.
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Microscope Photoluminescence Spectrometer
Flex One
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Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Electronic Dosimeters & Readers
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Readers operate using software packages installed on computer (PC) and communicate with DMC 3000 dosimeter and DMC 2000 and SOR families in hands-free data exchange mode. the LDM 320 reader is used as an interface to activate a dosimeter (to switch into counting mode) or to deactivate it (to switch into pause mode). When used with the included* DMCUser software, it functions as an interface to read and write the internal data of the DMC 3000, SOR and DMC 2000 dosimeters.
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Programmable Electronic Load
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Shenzhen UYIGAO Electronic Technology Co., Ltd
UYIGAO DC electronic loads provide you with the flexibility to test a wide range of power sources. Perform both static and dynamic tests to ensure that your devices can handle the steady state and occasional transient loads. The 16-bit voltage, current, and power-measurement systems provide accuracy analysis.
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Digital Microscope
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A variation of a traditional optical microscope in which a digital/microscope camera is connected, and image output is displayed on a screen and/or monitor. Most models include software and a computer for use.
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Microscopes
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A digital or traditional optical microscope can help engineers check on their high-speed probing activities much more easily. It will assure the probe tips will touch on the right contact(s), with correct contact angle and right amount of force. We use both digital and optical microscopes in our own lab. The information in this page is to help you choose a microscope best suits you.
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Electronic Transformer Test System
UI2000-ET
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• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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Electronic Kits & Modules
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This kit contains everything you need to build, the microcontroller will be programmed with the latest firmware before shipping.
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Electronic Tensile Testing Machine
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Shenzhen Chuangxin Instruments Co., Ltd.
Tensile Testing Machine, Universal Tensile Electronic Power and Textile Testing Instrument Testing Machine
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Hi-Res Radar Scan Converter PMC
Eagle-2
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Curtiss-Wright Defense Solutions
Eagle-2 is a high-performance radar scan converter from Curtiss-Wright Defense Solutions. Eagle-2 provides improved performance and support for high-resolution screen displays up to 2560 x 1600, including 2048 x 2048, making it the perfect choice for high-end radar display applications such as air traffic control (ATC) displays, VTS display command and control consoles, and radar head monitors.
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Handy Scan 3D
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The truly portable metrology-grade 3D scanners delivering highly accurate measurements.Truly portable and faster than everMetrology-grade accuracy and resolutionUser-friendly and easy to use
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Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Electronic Resistance Store
MEMS5
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Mezzanine MEMS5 is designed to reproduce the values of resistance to direct current through five channels independent and galvanically isolated from each other and from the case.
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Product
250 Watt Electronic Load Module
N3303A
Load Module
The Keysight N3303A is a 250 W (0-10A, 0-240V) electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3303A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3303A can also digitize waveforms.
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Electronic Load Mainframe GPIB
3300 Series
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A 4 Channels 1200W Mainframe which accepts up to four Load Module.
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Turret Test And Scan Handlers
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Turret platforms for semiconductor test, inspection and packaging.
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Detection Electronics
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Our detection electronics portfolio comprises all the detection electronics elements required for the operation and automation of a high quality light measurement system, including photo-detector signal recovery and digitisation (with fully programmable DC, AC and lock-in amplifiers having current/ voltage inputs), high voltage supply, optical chopper control, detector thermoelectric cooler control and relay unit.
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Electron Probe Microanalyzer
JXA-8530FPlus
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JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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DC Electronic Load
EE15140A
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The EE15140A DC Electronic Load / Works @ 0.0 Volts Input & real time I/O control attach the electronic load block to a heat- sink and your up and running. used them with D to A's, A to D's, Pots, PLC's to control the current. These Electronic Loads can be used for both Discharge & Charging Batteries & Devices
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Scanning X-Ray Detectors
Shad-o-Scan
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Shad-o-Scan is a family of scanning X-ray detectors specifically designed for the challenging requirements of high-performance industrial and scientific X-ray applications. Industry-leading TDI CCD performance enables the ultimate sensitivity and highest resolution in the industry, and ensures long detector lifetime in even the harshest radiation environments.
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Automation Software For Aim-TTi Power Products Including LD And LDH Series Electronic Loads.
Test Bridge
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Test Bridge software is a simple Windows application intended to make it possible to create a test sequence that can control up to four Aim-TTi products and record measurement results in graphical and tabular form.
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Electronic Multifunction Data Loggers
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The DeltaTrak Electronic Data Logger is a portable, pocket sized electronic device powered by a 10-year lithium battery. It is designed for easy and reliable tracking of parameters such as temperature, relative humidity, electric current, pressure, process signals, and pulse signals. All data loggers have a built-in temperature sensor plus single or multiple external channels where different sensors can be attached for remote monitoring of a variety of parameters. The DeltaTrak Data Loggers interface with a PC and have an internal memory for up to 32,000 readings. Each data point is automatically time and date stamped as it is recorded. Sampling intervals are set by the operator via a user-friendly Windows program on the PC. Recorded data is downloaded and graphed or exported in ASCII format to a spreadsheet for numerical print outs.
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Microscope Imaging Software
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Microscope imaging software from Leica Microsystems combines microscope, digital camera and accessories into one fully integrated solution.
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Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
