Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
Custom Reed Relays from Pickering Electronics
Reed Relay
Pickering Electronics manufactures hundreds of model relays. Many of these custom reed relays are minor variations of a standard part, for example, a different test specification or pin configuration. Others are custom designed to meet our customer's particular requirements.
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Electronics Manufacturing Services
EMS
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A production consignment service that develops based on know-how and technological capabilities of "MONOZUKURI " that we have cultivated over many years. Full support from design to board mounting, prototyping, manufacturing, maintenance. We respond to various outsourcing needs such as customer's design consignment and production consignment.
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Product
Boundary Scan Tester and Programmer
JTAGMaster
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The JTAGMaster Tester and Programmer is designed to work with ABI's bespoke software - a multiple purpose platform which enables users to freely configure test procedures and instruments. Integrated functions are also available to the user to automatically learn the device status, provide pin-to-pin comparison and information as well as use some reporting facilities.
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Product
Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
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The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Product
Programmable DC Electronic Load
DL3000
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The DL3000 series is a cost-effective, economical programmable DC electronic load with a friendly human-machine interface and excellent performance specifications. It provides a variety of remote communication interfaces to meet diverse testing needs for design and testing. A wide range of solutions are available for a wide range of industries including automotive electronics and fuel cells.
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Product
High Speed-Large Current DC Electronic Load (CC/CV/CR/CP)
PLZ-4WL Series
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While the PLZ-4WL series succeeds to the superior operability of our conventional model of the PLZ-4W series, the PLZ-4WL series realizes the high speed rise and fall time (slew rate of 50A/µs.) in the range of low voltage with large current. The PLZ-4WL offers six operation modes, and equips with various features such as sequence operation, switching operation, soft-start function, and time and voltage measurement. The PLZ-4WL applies not only for the conventional load test of the CPU power supply, but also it can be applied to even faster current response test. In addition, the PLZ-4WL is a space-saving design (about 50% less volume of the conventional model) that can save the facility space of the testing site, and it can be applied for the single cell testing of the large scale rechargeable battery.
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Product
Auditor Universal Electronic Testers
AUET-DC Series
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The Auditor Universal Electronic Testers (AUET) have a broad range of features to accommodate most requirements. These instruments are designed to be bench top mounted and are available in several configurations and various single or multiple torque ranges. They are also available with file capability (DC) models. The DC models require PC software Auditor Tool Manager (ATM).
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Product
Radar Scan Converter PMC
Eagle
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Curtiss-Wright Defense Solutions
Eagle is a flexible and powerful radar scan converter that is based upon field-proven technology and comes in a compact and mechanically ruggedized PMC form factor. Eagle features a low power, rugged design, enabling it to operate in a wide range of environments, including conditions of high temperature and vibration.
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Product
Electronic Crockmeter
TF411
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TESTEX Testing Equipment Systems Ltd.
Crockmeter, to determine the colour fastness of textiles to dry or wet rubbing. Electronic Crockmeter complies with ISO 105×12/D02, AATCC 8/165, BS 1006-D02, etc. Crockmeter is useful in crockmeter test and Crockmeter price is competitive.
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Electronic Development & Manufacturing
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Our employees offer proven expert knowledge and application know-how in the development of finished products, embedded electronic systems and software applications on the most varied complexity levels. Solutions for the automotive, aviation and production industries are created using a combination of modern development methods and tools and µ-electronics, embedded electronics, firmware and software.
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Product
Digital Electronic Tensile Test Machine
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Shenzhen Chuangxin Instruments Co., Ltd.
The Tensile Testing Machine is widely applied to test the tensile, tear, peel, and bend of all kinds of materials, such as metal, cable and etc, it’s used to test the tensile, tear, peel, compressive strength and bending of the material. It conforms to the standard of GB, ISO7500/1, JJG475-88, ASTME4, DIN5122, JISB7721/B7733, EN1002-2, BS1610, and CNS9471/9470.
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Product
Boundary Scan Test and JTAG Programming Tool Set
onTAP® Series 4000
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onTAP is a comprehensive boundary scan testing and JTAG programming tool set that bolsters the most accurate possible fault coverage in an affordable and expedient manner, while providing support for the entire product life cycle.
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Product
Programmable Single Channel DC Electronic Load, 150V/30A/300W
T3EL150303P
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Programmable Single Channel DC Electronic Load, 150V/30A/300W.
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Product
Time Delay and Integration (TDI) Line Scan Camera
Piranha HS
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The Piranha HS cameras provide an alternative to traditional line scan imaging. They enable you to meet the line rates and responsivity necessary for your high performance applications and allow you to reduce the number of cameras in your system. When you use fewer cameras, you use fewer framegrabbers, lenses, computers and cables. The Piranha HS family delivers the lowest price/pixel TDI system solution ever offered by Teledyne DALSA. Lighting costs can also be reduced. With TDI imaging, you can use LED lights, helping you to optimize system up-time and productivity.
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Stereo Microscopes
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Here are a few examples from our 40 years of microscopy experience in the development of special stereo microscope solutions and accessories for and with Leica , Zeiss , Nikon and Olympus .
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Product
High Power DC Electronic Load
3350G Series（4KW~6KW）
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Each 3350G Series module has its own control and display panel, CC / CR / CV / CP /Dynamic modes, also can be controlled via RS232、Ethernet、USB and GPIB interface.
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Product
Polarization Lambda Scan Software License
N7700100C
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Enables polarization-dependent swept-wavelength multichannel measurements with the PAS LS engine and PAS IL/PDL engine, as well as measurements without varying polarization with the PAS LS engine and PAS FSIL engine.
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Product
High Power DC Electronic Load（1250V）
34300E Series（5KW~40KW）
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34300E Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.SHORT time setting and SHORT_VH, SHORT_VL setting function, also can measure Short Voltage and Current.
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Product
LED Test Programmable DC Electronic Load
IT8912E Series
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IT8900 series high accuracy LED specific testing electronic loads can simulate the real output of LED lights with different characteristics.Their specific circuit can realize CR-LED mode, adjustable frequency, duty ratio PWM dimming output port (frequency: 20Hz-2KHz), I-pp/I-max measurement function can test current ripple and start up surge current of LED constant flow source. Voltage and current testing speed can reach 50KHz. IT8900 series provides CR-LED / CC / CV + CC / CR /CW and other working modes, built-in USB / RS232 / GPIB communication interface. Widely used in LED driver power dimming test.
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Product
Electronic Component Counter
ZE 300
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REINHARDT System- und Messelectronic GmbH
Instead of the widely used photoelectric barrier technology a new measuring technology is used in the new electronic component counter ZE 300: The laser technology offers a measuring beam with higher energy density and therefore more precise counting and faster counting speed. The ZE 300 component counter is microprocessor-controlled.
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Product
Ultra-High Vacuum Ф4 Scanning Kelvin Probe
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The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin Probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless-steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tuneable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
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Product
250 Watt Electronic Load Module
N3303A
Load Module
The Keysight N3303A is a 250 W (0-10A, 0-240V) electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3303A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3303A can also digitize waveforms.
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Product
Stereo & Pocket Microscope
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A small microscope which is designed to be easily portable. In some cases, the microscope may literally fit in a pocket, while in other cases it may be more comfortably carried in a field bag or small carrying case.
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Semiconductor & Electronic Systems Test and Diagnostics Services
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Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Product
Modular DC Electronic Load
N3300A Series
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The new N3300A Series of dc electronic loads is fast, accurate, and ideal for increasing production throughput in high volume dc power supply manufacturing. This series consists of a full rack width (1800 watts max) mainframe and a half rack width (600 watts max) mainframe, and 7 interchangeable electronic load modules. The modules provide a variety of voltage, current and power ratings. New dc connectors for test system configurations are now available on all modules.
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Raman Spectrometer - Confocal Raman Microscope
XploRA™ PLUS
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Incorporating unique and powerful functions in a reliable, high performance system, ideally suited to the research and analytical lab, the XploRA PLUS is our best multi-sample, multi-user Raman microscope ever.It is fully confocal, not compromising image quality, spatial or depth resolution. The SWIFT Fast Raman images are the fastest fully confocal Raman images available, typically 10x faster than conventional Raman imaging.
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Product
Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Product
Line Scan Vision System
In-Sight 9902L
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The In-Sight 9902L 2K line scan smart camera is a high resolution self-contained vision system ideal for detailed inspections of large, cylindrical, or continuously moving objects. The 9902L acquires up to 16,000 lines of 2,000 pixels per line to produce a 32MP image that can used to detect even the smallest features and defects. Each pixel line is acquired at 67,000 lines per second to keep up with the fastest production lines. This standalone vision system only requires a small view of the target part, making it an ideal choice for installations with restrictive field of view or mounting space requirements.
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Product
Advantage Xi Radar Scan Converter
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Curtiss-Wright Defense Solutions
The Advantage Xi radar scan converter is a half-size PCI card. Radar video arrives into the card through the PCI bus, which allows the card to be used in a client-server configuration with radar distributed over a network, or in conjunction with a radar interface card such as the Virgo PCI and Osiris PCI.
