Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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High-voltage Testers
Operational safety and reliability of electrical equipment and cables directly depend on the dielectric strength of the insulation. Portable and mobile high-voltage testers from KharkovenErgoPribor Ltd. are used for acceptance and operational testing of substation equipment and cable lines, as well as for checking the reliability of personal electrical safety equipment. Our testers range is represented by test systems that allow conducting high-voltage tests with DC and AC voltage, testing polymer insulated cables with very low frequency, testing and locating faults in cable sheath, as well as performing the initial burning of insulation on damaged sections of cable lines.
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PXI High Density Precision Resistor Module, 4-Channel, 2.5Ω to 925Ω
40-298-121
The 40-298-121 is a high density programmable resistor module with 4 channels which can be set between 2.5Ω and 925Ω with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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E-mobility Test Systems
Correct contactingcharging cable detectionsecurity questionExtensive range of accessories for on-site measurements in a separate caseCharging cable with additional measuring lines (Sense)Convenient control through guided test procedure via WinSAM and tabletElectromechanical locking
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Benchtop with Drop-In Test System
600 Series Compact ATE Platform
The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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In-Circuit Testers
Whether you’re choosing from our stand-alone manually loaded ICT tester all the way to our fully automatic In-line test system, Acculogic has the solution for you!Acculogic’s Scorpion family of automated test equipment and in-circuit fixture-based testers were created with one underlining theme in mind: “Cost-effective Testing”.
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FET Solid State Switch, 300 kHz to 8 GHz, SPDT
U9397A
The Keysight U9397A solid state switch maximizes your frequency range from 300 kHz up to 8 GHz, offering excellent performance with high isolation, low SWR and fast switching speed. Applications include instrumentation, communications, radar, and many other test systems that require high speed RF and microwave SPDT switching.
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PathWave Lab Operations For Battery Test
EP1150A
PathWave Lab Operations for Battery Test enables efficient planning and coordination of your entire battery test laboratory. It manages all resources, including test fields, test systems, and your device under test (DUT). PathWave provides an integrated, web-based lab management platform that helps you modernize your test workflows, eliminating legacy paper-based processes, and increasing data integrity and traceability.
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Load Banks
Power Test Dynamometer offers a complete high capacity load testing solution with our load bank and gen set testing systems. Capable of testing generators and AC/DC power sources, our load bank systems safely apply electrical loads across the entire spectrum of operation. By offering a one-stop-shop for your Load Bank and it's accompanying data acquisition software, Power Test is committed to Making Your Testing Easy.
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Partial Discharge and Tan Delta
PDIX Series
PDIX is a combined partial discharge and tan delta cable diagnostic testing system. By combining HVI’s VLF products with PDIX products, users can perform VLF AC withstand, partial discharge detection, and tan delta measurement on medium and high voltage cables, rotating machinery, and other apparatus with one integrated package fully supported by HVI & PDIX.
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PXI 10W Programmable Resistor Module, 2-Channel, 1Ω to 239Ω
40-253-013
The 40-253-013 is a programmable resistor module with 2 channels which can be set between 1Ω and 239Ω with 1Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems
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Desktop Appliance for PCI Express® Gen4
DE200-G4
A versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols, such as PCIe, SAS, and SATA.
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PXI 5W Programmable Resistor Module, 1-Channel, 2Ω to 26.7kΩ
40-252-132
The 40-252-132 is a programmable resistor module with 1 channel which can be set between 2Ω and 26.7kΩ with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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4-Module ICT System, I307x Series 6
E9903G
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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PXI 2.5W Programmable Resistor Module, 8-Channel, 1Ω to 62.1Ω
40-251-011
The 40-251-011 is a programmable resistor module with 8 channels which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Low G Sensitive Oscillators
Precision Test Systems is increasingly becoming a world leader in ultra-low phase noise (ULN) crystal and rubidium oscillators. We manufacture the CFS10B crystal frequency standard and the RFS10E and RFS10F rubidium frequency standards. All these models can also be locked to the global satellite service operated by the USA (GPS), Russian (GLOSNASS) and Europe (Galileo). We also have a complete range of distribution amplifiers to compliment these frequency standards.
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Photoelectrochemical Test System
ModuLab XM
The system, based upon Solartron Analytical's world-leading experience in transfer function measurements, offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure the system met the requirements of the most demanding photovoltaic researchers in the market today.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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RF Ports Alignment Software
With the R&S®RF Ports Alignment software together with the option R&S®SMW-K545, Rohde & Schwarz provides a standard and tailored solution for calibrating amplitude, time and phase of multi-channel SMW setups. The RF Port Alignment automatically collects the gathered correction data for the multi-channel setup using a connected vector network analyzer such as the R&S®ZNA or R&S®ZNB. Thanks to an intuitive graphical user interface the test engineer is guided through the calibration procedure step-by-step in a convenient way. With a calibrated multi-channel setup, tests of advanced systems in wireless communication or of radar receivers can be performed straightforward.
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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PXI High Density Precision Resistor Module, 18-Channel, 2Ω to 62.1Ω
40-298-011
The 40-298-011 is a high density programmable resistor module with 18 channels which can be set between 2Ω and 62.1Ω with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Drop-In Functional Test Fixtures
Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
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(2500kN+) Fatigue Testing Systems
8806
The precision mechanical systems, combined with the advanced features of the 8800 digital controller and Dynacell™ load cells, enable Instron to supply fully-integrated turnkey solutions to meet the most demanding applications. The system can be used to cover a broad range of static and dynamic test applications, covering metals, rebar, high-force fracture mechanics, aerospace panels, civil engineering components, wire ropes, or concrete.
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Test Solution Requirements Gathering
When we first talk to our customers about their test requirements, they generally know what they want to achieve but often do not have the detailed requirement specifications to enable us to design and build a suitable test system for them. The process of generating a detailed design specification is both time consuming and stressful, so we understand the challenges this causes.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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High Temperature, Low Strain Capacitive Extensometers (1200 C or 1600 C)
Model 3648
Jinan Testing Equipment IE Corporation
These extensometers use a high temperature capacitive sensor in combination with an innovative design to achieve high accuracy strain measurements in low measuring ranges not possible with other high temperature extensometers. They mount on a slide bracket (included) that can attach to the load frame of your test system; optional load frame mounting brackets are available. The overall design reduces any influence from common lab environment vibrations.The standard temperature version (to 1200℃) is supplied with high purity alumina rods. The high temperature option is furnished with alpha grade silicon carbide rods. Rods are made to order to the length required for your furnace. These units are made to order in many different gauge lengths and measuring ranges.The extensometer comes with a signal conditioner. The output is an analog DC voltage, factory calibrated with the extensometer to 0 to ±10 VDC typically. They are readily interfaced with most existing test controllers, and may be directly connected to data acquisition systems and chart recorders. Bringing the signal into a spare DC input channel (or external input) on the test controller allows the extensometer to be used for strain controlled tests like low cycle fatigue.
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Solar Analyzers
Max. solar system power (Pmax) search by Auto-scan: 1000V, 12A (12000W capability)The analyzer and the Remote Solar Detector is connected by Bluetooth wireless communication (Bluetooth 2.1 + EDR Class 1)The Remote Solar Detector is moisture-proofIntelligent test logic with no personnel attendance required in the field Solar system analyzer waits and tests the system until appropriate sunlight irradiance is detectedMax. voltage (Vpm) at Pmax, Max. current (Ipm) at Pmax Voltage at open circuit (Voc), Current at short circuit (Isc)Efficiency (%) calculation of solar systemTemperature measurement of solar panelsIrradiance measurement of sun lightSeries resistance (Rs) calculation of solar panelsWith data logging/open function, the I-V curves of solar system can be analysed / recorded for a period of time (e.g. 60 min.)Conversion of I-V curve under OPC to data under standard test condition (STC) based upon IEC standardProvide Operating Condition (OPC) and Standard Test Condition (STC) test reports for verification of solar panel performance (OK or NO OK)Users can set up the parameters of solar panelsUsers can set up the series number of solar panels. Parameters of many solar panels can be measured in one measurementThe Irradiances and Temperatures of solar panels can be continuously measured, monitored and recordedContinuously measure/monitor/record the DC power output of solar system and the AC power output of inverter (1 phase or balanced 3 phases)Calculate the efficiency of DC to AC power conversion and the efficiency of the max.output power
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PXI 34x4 Signal Insertion and Monitor Matrix
40-525A-001
This is a PXI signal insertion and monitor matrix with switched pass thru connections on both X and Y axis. It is also availablein a 16x4 format and can be used for signal insertion and monitoring purposes on connections between the UUT and test system. Each pass thru connection from LX to X can be open or closed to allow the programmatic disconnection of the signal to check the response of the UUT. The matrix can be used to connect test equipment, such as a DMM or scope, to monitor the pass thru signals via Y connections while the LY connections can be used to insert a fault condition or insert external signals. When external signals are injected the LX connections can be opened and the LY connections closed.
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Precision Resistor Module 18-Channel
40-297-001
A simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Fault Injection and White-Box Testing
VectorCAST/Probe
VectorCAST/Probe is integrated with the full family of VectorCAST tools allowing probes to be inserted during Unit, Integration, or System Testing. The probe insertions are controlled by the same technology that controls our code coverage instrumentation, which ensures that the probes function correctly regardless of the compiler, target processor, or run-time environment.
