Showing recent results 1 - 15 of 280 products found.
-
T5822 - Advantest Corp.
Wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices. The T5822 is designed to provide manufacturers of multiple memory devices with cost efficiency and optimal functionality, including full test coverage of as many as 1,536 devices in parallel with data transfer rates up to 1.2 gigabits per second (Gbps).
-
NTS3001 - Novtek Test Systems
A bench top engineering cycling system. FLASH memory endurance cycling system used to characterize and qualify the write/erase cycling endurance of FLASH memory devices and to conduct functional testing of memory devices at extreme temperatures.
-
NTS2200 - Novtek Test Systems
FLASH memory endurance cycling system used to characterize and qualify the write/erase cycling endurance of FLASH memory devices and to conduct functional testing of memory devices at extreme temperatures. Highest installed base of any cycling system in the world.
-
Keysight x1149 Analyser - The Test Connection, Inc.
The Keysight x1149 Analyser is a tool for engineers to perform structural teste on their circuit card assembly (CCA). It also performs In-System Programming for FPGAs and CPLDs devices. The x1149 Analyser programs Programmable Read-Only Memory (PROM) devices as well as execute memory verification tests on devices like the Double Data Rate synchronous Dynamic Random Access Memory (DDR SDRAMs).
-
UniTest Inc.
The application tester tests the memory devices such as graphic memory and HDD buffer memory in a specially designed condition made similar to actual PC and Server environments. In fact the graphic memory has releatively higher speed, test expense and quality standard compared to main memory, stressing the importance and the need of the application tester.
-
TCE-3600 - Triad Spectrum, Inc.
Testing DDR5 memory at enhanced bus speed is something that test engineers would like to see in their memory test system. Manufacturers of memory devices continue to stress the importance of reducing the costs to manufacture modules while maintaining test integrity.
-
Renesas Electronics Corp.
Renesas offers MIL-STD-883-compliant CMOS random access memory (RAM) and CMOS programmable read-only memory (PROM) devices that are that are qualified to QML Class Q military standards.
-
T5833/T5833ES - Advantest Corp.
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
-
ShibaSoku Co., Ltd.
Power device or module with which are digitally controlled and memory can be measured per system.
-
T5830 - Advantest Corp.
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
-
MS7208 - MiNT Systems Corporation
The MS7208 system can test a wide range of device families including – but not limited to – NAND flash, NOR flash, multi-level flash, multi-die flash, EEPROM, RAM, and mixed-technology memory devices.
-
SolidGear Corporation
A host tester is a verification tester designed for software developers and QA engineers of memory card compatible devices. It can mainly be used for verifying the card access firmware of the host device in accordance with the test specification.
-
T5503HS - Advantest Corp.
With today’s mobile electronic devices and the servers that support them handling ever-increasing volumes of data, semiconductor memory manufacturers need a highly capable, cost-efficient means of testing their latest generations of high-speed, high-capacity memory ICs – including emerging DDR4-SDRAM and LPDDR4-SDRAM chips.Advantest’s T5503HS tester gives memory manufacturers that industry-leading performance and a low cost of test along with an upgradeable system design.
-
Meco Instruments Pvt. Ltd.,
Memory & Read FunctionRight Device to know the TRUE -LIFE of Battery Capacity (Resistive / Voltage) Simultaneously MeasureOn - Line Testing without shutting down batteryBuilt - in Comparator FunctionRates Conditions as PASS, WARNING or FAILDatalogging Memory FunctionCompact and lightweightRS-232 Interface & SoftwareAuto Power Off
-
Campbell Scientific, Inc.
External data storage devices can be used for redundant data storage, additional data storage, or convenient data retrieval from the field. These devices use a variety of technologies, including USB, flash memory, CompactFlash, and microSD.
