Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
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Multifunctional Devices
Computer Gesteuerte Systeme GmbH
Each channel is independent and can be configured in a different operation mode. The technical data of each channel depends upon which electronic card of the EL6 and EL7 series is used.
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Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Static Control Devices
Panasonic Industrial Devices Sales Company of America
There are many production processes where electrostatic charges disturb smooth operation. To eliminate static, Ionizers are used.Whether the application is for the Semiconductor industry where the components are extremely sensitive and can even be damaged by high electric static charges or for the packaging industry, where plastic sleeves or foils tend to stick to each other, Panasonic has a solution to neutralize electrostatic charge.
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Training & Simulation Devices
Designed to minimize instructor input and provide realistic, automated response.
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Flash Memory In-System Programming File Generation
ScanExpress Flash Generator
ScanExpress Flash Generator is a tool to quickly create Flash programming files for use with ScanExpress™ software. The application operates as a standalone utility or integrates into ScanExpress TPG for creation and reuse of boundary-scan test files for in-system programming (ISP).ScanExpress Flash Generator combines a board Netlist, scan chain description, and BSDL files to automatically create Flash Programming Information (FPI) files. These files include all information necessary for ScanExpress Runner™ or ScanExpress Programmer™ execution systems to perform read, write, erase, and verify operations—in-system using high performance Corelis hardware.
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Network Synchronization Device
VCH-003
The Network Synchronization Device (NCD) VCH-003 is intended for use on the Unified Telecommunication Network of the Russian Federation. Depending on the configuration of the NSS, VCH-003 can be used to generate and multiply synchronization signals of 2048 kHz and 2048 kbps as part of the PEG, as an OIG to restore synchronization signals received from the line at the transit node.
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Memory Testing
C.C.P. Contact Probes Co., LTD.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
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Memory
Renesas is renowned for its product lifetimes, and our memory products are no different. Our wide range of low power SRAM products provide high reliability, stable supply and long lifetime support often not found in these devices, making them ideal for industrial designs. Renesas’ ultra-fast QDR™ (Quad Data Rate) SRAMs are ideal for next-generation high bandwidth communication systems that require memories capable of very high operating frequencies combined with low latencies and full cycle utilization. Our EEPROM realizes high speed, low power consumption and a high level of reliability by employing advanced MONOS memory technology, a CMOS process and low voltage circuitry technology.
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Serial Interface Device
The Serial Interface Device offers a number of options for connecting to serial hardware. You can choose from Ethernet, USB, PCI, PCIe, or ExpressCard interfaces to add up to 16 serial ports to your system. You can choose from common serial protocols, such as RS232, RS422, and RS485. The Serial Interface Device also offers various isolation, hyperthreading, and multiprocessor compatibility options. Some models also support 4- and 2-wire transceiver modes for full- and half-duplex communication. NI serial interfaces also appear as standard COM ports for compatibility with programs that use serial communications.
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Performance Profiler / Memory Leak Detector
GlowCode
GlowCode is a complete real-time performance and memory profiler for Windows and .NET programmers who develop applications with C++, C#, or any .NET Framework-compliant language. GlowCode helps programmers optimize application performance, with tools to detect memory leaks and resource flaws, isolate performance bottlenecks, profile and tune code, trace real-time program execution, ensure code coverage, isolate boxing errors, identify excessive memory usage, and find hyperactive and loitering objects.
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Proving Devices
Martindale Electric Proving Devices - safely prove the operation of voltage indicators and test lamps
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Programmable Read Only Memory (PROM)
Is a Static Random Access Memory. The pinout is the JEDEC 28 pin, 8-bit wide standard, which allows easy memory board layouts which accommodate a variety of industry standard ROM, PROM,EPROM, EEPROM and RAMs.
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Power Switching Devices
Watlow Electric Manufacturing Company
Watlow solid state power switching devices complement the rapid switching required by PID temperature controllers and help deliver optimum system performance and service life. They are available in 1-phase and 3-phase/2-leg and 3-leg configurations, feature touch-safe terminations, input indicators, zero-cross, random or phase-angle fire options, ratings from 18 to 1,000 amperes and agency approvals including CE and UL® 508. Various configurations offer short circuit current ratings (SCCR) of 200,000 amperes, extensive system and heater diagnostic capabilities, heater bake out, integrated heat sinks, on-board fuses, RoHS compliance and serial communications.
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Pinhole Detection Devices
ElektroPhysik Dr. Steingroever GmbH & Co. KG
The coating control by means of pore testing makes use of electrical voltage in order to uncover microscopically small defects (> 20 μm) in the coating of a surface. If even a small defect can be detected during pore testing of surface coatings, urgent action is required. Minimal flaws in the coating are sufficient to cause great damage.
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Energy Monitoring Devices
Mitsubishi Electric Automation, Inc
Monitors all energy assets on the plant floor with EnergyPAQ a scalable energy hub and smart energy control capable solution with an HMI you can customize to show critical energy data, alarms in real-time and serve energy data to an energy information layer reporting software.
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Jaw Device
PC-100
The PC-100 device is designed to determine the taper and the crown of generator core lamination. The device contain series connection which allow the data transmittion to PC.
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High-Voltage Test Device
PGK 260 HB
Cable testing and diagnostics with the BAUR PGK HB. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit. *Testing of medium- and high-voltage cables * DC voltage testing of up to 260 kV output voltage with positive or negative polarity * AC voltage testing - up to 190 kV for switchgear, busbars and insulating elements * Easy-to-maintain 2-piece design
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Memory Burn-In Tester
H5620/H5620ES
As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Temperature Measurement Devices
Qualitrol's line of Direct Mount Thermometers provide an accurate indication of temperature with a rugged, low profile design, multiple control and alarm functions with optional SCADA output
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Microwave/Millimeter Wave Devices
We at AET Associates, Inc. take pride in our engineers who have in-depth technical knowledge in the areas of microwave and millimeter wave technology. We hope that we can serve you to benefit your research and development, production, and purchase strategies.
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Flash Storage Device
Axiomtek provides various industrial-grade flash storage device for customers to simplify and shorten the system design time.
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Reflective Memory Analyzer
PEAZ-5565
Abaco Systems' PEAZ-5565 Reflective Memory Analyzer is a powerful analytic tool for the industry-leading 5565 Reflective Memory (RFM) product family. By creating a window into network traffic, the analyzer allows you to deep dive into your application code to start solving problems.
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Differential And I/Q Device Measurements
S96089B
The S96089B combines source-phase control of multiple internal or external sources with frequency-offset mode, enabling simplified test of I/Q modulators/converters, differential mixers, and harmonics or amplifiers.
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Connected Devices
enable communication between devices. We provide connectivity for sensor applications and input devices via mobile communication and develop custom IoT solutions. Capturing, transferring and visualizing data increases your productivity and creates transparency.
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Power Devices & Power Conversion
CAES has a legacy of supplying high-performance power and power conversion products to the aerospace market, providing ground power to fighter jets and other aircraft and assisting with applications such as aircraft engine starting.
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Passive Devices
Fiber Splitters, Muxes, CWDM, DWDM, WDM, PON, Fiber Jumpers, Fiber Attenuators.
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Clock Distribution Devices
Analog Devices offers ultralow jitter clock distribution products that fan out given signals for wireless infrastructure, instrumentation, broadband, ATE, and other applications demanding subpicosecond performance. Our clock products are ideal for clocking high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.
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DC High-Voltage Test Device
PGK 25
Cable testing with the BAUR PGK 25. Cables must be tested in compliance with the national and international standards. This applies before the commissioning of new cable networks. The portable BAUR PGK 25 cable test device is used for DC voltage testing in low- and medium-voltage cables. It is characterised by its low weight of only 16.5 kg, by the easy operation and solid construction for onsite use.* Compact device for DC voltage testing with negative polarity* Continuously adjustable output voltage* Perfect for mobile use
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Compact Ultrasonic Testing Device
SONAPHONE® Pocket
With the SONAPHONE Pocket you identify problems even before they arise and create value at all levels of your company. Just by detecting and eliminating leaks you can reduce the energy costs for your compressed air system up to 30 percent. This also has positive effects on your operational safety and system productivity through early warning of bearing failure and evidence of partial electrical discharges.
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Gamma Radiation Warning Device
aGent-R
Detection of the increased levels of gamma radiation and their estimation by means of the four-level threshold alarm system.
