Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
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High Speed Pick and Place Handler
Commander 2000
At throughput rates in excess of 2000 Units per Hour the HT Commander 2000 system provides unparalleled performance for the production handling and programming of flash memory devices or modules.
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Cantilever Probe Card
MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fine pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements. With outstanding craftsmanship, innovative architecture and proven methodologies based on mechanical and electrical simulation/measurement results, making MPI the top cantilever provider worldwide.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Battery Testers
Memory & Read FunctionRight Device to know the TRUE -LIFE of Battery Capacity (Resistive / Voltage) Simultaneously MeasureOn - Line Testing without shutting down batteryBuilt - in Comparator FunctionRates Conditions as PASS, WARNING or FAILDatalogging Memory FunctionCompact and lightweightRS-232 Interface & SoftwareAuto Power Off
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Memory And Storage
Intel provides technically advanced products that support every level of computing—from data center workloads to enthusiast usage. Intel® Optane™ memory creates an accelerated bridge between memory and storage. Intel® Solid State Drives (Intel® SSDs) provide storage flexibility, stability, and efficiency.
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Reflective Memory
VME-5565
The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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Memory Tester
SP3000
CST is proud to offer a portable stand alone and affordable memory tester, combining DIMM and SODIMM testing capability all on the same universal base unit with optional easy plug-on test adapters.
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Memory Test System
T5511
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Memory Interface Chips
Providing memory bandwidth and capacity to unleash the power of multicore processors
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Memory Interposers
Memory interposers for logic analyzers and oscilloscopes are ordered by memory type. Please select the memory type/technology of interest.
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Memory Recorder
MR8847A
High-speed 20MS/s, 16-channel, Fully Isolated Memory Recorder for On-site Jobs and R&D
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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RightMark Memory Analyzer
RMMA
Before this test packet was created there was no proper software for measuring vital system parameters such as CPU/Chipset/RAM providing steady and reliable (reproducible) test results and allowing for changing test parameters in a wide range. Vital low-level system characteristics include latency and real RAM bandwidth, average/minimal latency of different cache levels and its associativity, real L1-L2 cache bandwidth and TLB levels specs. Besides, these aspects are usually not paid sufficient attention in product technical documentation (CPU or chipset). Such test suite, which combines a good deal of subsets aimed at measuring objective system characteristics, is a must have for estimating crucial objective platform parameters.
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Shared Memory Network
Avionics Interface Technologies
AIT's Shared Memory Network (SMN) interface modules provide host systems with an interface to a high speed (2.125 Gbps) optical data network which can be used to share data, in real-time, between multiple distributed systems.
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Metrology Device
XPLOR 100
XPLOR 100 is a state of the art, fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.
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BAW Devices
Teledyne’s Bulk Acoustic Wave (BAW) Product Line has been producing BAW delay devices since the early 1960’s. Over the years, Teledyne Microwave Solutions (TMS) has constantly improved BAW technology and is currently the world’s only supplier of microwave bulk acoustic wave delay devices. Markets for BAW devices include instrumentation and radar altimeters and are available in connectorized, pin and surface mount configurations.
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RAMCHECK LX DDR4 Memory Tester
INN-8686-DDR4
The RAMCHECK LX DDR4 quickly and accurately tests and identifies DDR4 DIMMs for servers and desktops, as well as laptop SODIMMs.
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Measuring Device
CAN-Bus Tester 2
The CAN-Bus Tester 2 is a widely used measuring device for control of bus parameters. The success story starts already in year 2002 with the first model. The hardware was completely redesigned in version 2. The corresponding software is still developed and has been enhanced with extensive updates.
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Reflective Memory Hub
ACC-5595
The ACC-5595 is a managed hub designed to operate with our 5565 family of Reflective Memory real-time network products. The Reflective Memory hub can automatically bypass ports when it detects a loss of signal or the loss of valid synchronization patterns, allowing the other nodes in the network to remain operational.
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Memory Analysis Software for Logic Analyzers
B4661A
DDR3, DDR4, DDR5, LPDDR2, LPDDR3, LPDDR4, and LPDDR5 Analysis . The Keysight B4661A memory analysis software offers a suite of options that include the industry’s first protocol compliance violation testing capability across speed changes, a condensed traffic overview for rapid navigation to areas of interest in the logic analyzer trace, powerful performance analysis graphics, and DDR and LPDDR decoders. With the B4661A memory analysis software and a Keysight logic analyzer*, users can monitor DDR/2/3/4/5 or LPDDR2/3/4/5 systems to debug, improve performance, and validate protocol compliance. Powerful traffic overviews, multiple viewing choices, and real-time compliance violation triggering help identify elusive DDR/LPDDR system violations.
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IP-Reflective Memory
Each IP-ReflectiveMemory can be used as a standard node or as the Master Node. Clearly labled "DIP Switches" are provided to make the selection of Master or Standard Node, and the Node Address. The Network is based on using LVDS signaling over Ethernet cabling. Nodes automatically come up for pass through operation.
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Oscilloscope Device
Oscilloscope Devices are flexible, software‐defined instruments that are versatile enough for both time‐ and frequency‐domain measurements and are offered in industry-standard form factors like PCI and USB. They feature up to eight channels that can sample at speeds up to 2 GS/s. The devices also feature numerous triggering modes, deep onboard memory, and driver software API that includes data streaming and analysis functions.
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Memory Module Testers
The module tester tests the modules in which the final tested components are assembled together. This test is also one of the most important factors to guarantee the quality of the products. DDR, DDR2, DDR3, FBDIMM,
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Recorder Carrier Device
RCD
The RCD is a carrier signal demodulator for SCADA and Fault Data Recording. the RCD demodulates the carrier to indicate the presence of a relative level of a singal
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Automated Memory Analyzer For Malware
VolatilityBot
VolatilityBot is an automation tool for researchers cuts all the guesswork and manual tasks out of the binary extraction phase, or to help the investigator in the first steps of performing a memory analysis investigation. Not only does it automatically extract the executable (exe), but it also fetches all new processes created in memory, code injections, strings, IP addresses, etc.
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MODEM SHARING DEVICES
The Modem Sharing Devices are designed to allow RS-232 DTE (terminal) devices to share Leased Line and Dial line Modems or DSU's. Data arriving at the Master Port is continually broadcast to all Subchannels. The attached terminal device that raises the RTS control signal is automatically given control of the MSD. Data rates of up to 128 Kbps are supported.
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Semiconductor Device Testers
are particularly suitable for certain semiconductor test requirements, but other models may also be of interest. Our knowledgeable application engineers can guide you to the most suitable model.
