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Product
DUT Matrix 32 DUT Matrix Channels
40-530-021
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The 40-530-021 is a high density 32x8 1 pole reed relay matrix. Typical applications are signal routing in functional ATE and data acquisition systems. It consists of highly reliable sputtered ruthenium reed relays that offer >10e9 switching cycles to ensure maximum switching reliability with a long service life and stable contact resistance. Larger arrays can be built by daisy-chaining the common signals from multiple PXI modules
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Product
iSocketTM - High Power DUT - HTOL System
8000 Series
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iSocketTM Technology Open Rack-Room Temperature (RTBI) non chamber design High Power DUT Capability – 0-65W Individual DUT Temperature Measurement & Control DUT Monitoring with Auto shut down 28 BIB capacity – 14 trays 2 BIB’s per tray Multi DUT type HTOL Testing Remote System & HTOL Monitoring – Customer access via VPN
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Product
DUT Boards
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RTI designs and manufactures DUT boards for many types of special purpose test equipment including: ESD test systems, special purpose functional testers, automated curve trace equipment, as well as standard semiconductor test equipment. All designs are performed in-house using PCB design software (Mentor PADS, CAM350) and 3D mechanical design software (Solid Edge) if required. PCB fabrication is sub-contracted to one of our long-time fabrication partners.
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Product
Network Analyzer Test Setup Assistant (NTSA)
S94605B
Network Analyzer
Spreadsheet-based measurement configuration assistant aides users in setting up and calibrating complex measurements for a multiport DUT with a VNA based system
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
HV-Test System for Capacitor Packages
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The system is used to characterize the leakage currents of capacitor packages. LXinstruments implemented a project-specific PCBA for the required HV switching. The measurement technology consists of Keithley source meters and USB based devices. The DUT adaptation with safety technology was realized in cooperation with ATX.
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Product
Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Product
High Voltage Optically Isolated Probes
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High Voltage Optically Isolated Probes are designed to aid in device characterization measurements. Whether it is low or high voltage signals sitting on HV busses, high bandwidth, extreme precision, and optical isolation means floating measurements are easily made with minimal DUT loading.
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Product
Automated Measurement Expert (AMX), VNA Plugin
S94702A
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The Keysight automated measurement expert (AMX) is a smart software solution for automated multiport S-parameter measurements with the PXIe vector network analyzers M937xA/M9485A or the benchtop E5080A ENA network analyzer. The S94702A AMX VNA plugin adds S-parameter measurement capabilities to the Keysight test automation platform (TAP). The combination of the TAP and the VNA plugin forms the AMX backend software, which makes the VNA setups and executes the test sequences in the PXIe controller according to the optimized test sequence files generated by the AMX test plan builder. Other instrument plugins allow you to control the DUT mode, expand the number of test ports with the PXI switches or multiport test set, and use external instruments such as a DC power supply and a digital multimeter. The AMX backend software also provides step-by-step calibration wizard for full multiport calibration using the 4-port ECal module.
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Product
RF Shield Box
CMW-Z10
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The R&S®CMW-Z10 has excellent shielding effectiveness and superior coupling characteristics.The shield box can be used for frequencies up to 6 GHz.The antenna structure is optimized to enable excellent radio connections between the DUT and tester.The highly broadband spiral antenna allows a wide variety of applications.These outstanding features combined with modular options make the RF shield box indispensable for any radiocommunications tester.
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Product
Power/Voltage Rail Probe. 4 GHz Bandwidth, 1.2x Attenuation, +/-30V Offset, +/-800mV
RP4030
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The Teledyne LeCroy RP4030 Power Rail Probe meets the specific requirements of those who need to acquire a low-voltage DC signal as part of a:-Comprehensive power integrity, digital power management IC (PMIC), voltage regulator module (VMR), point-of-load (POL) switching regulator, or low-dropout regulator testing- Complete embedded power management system that includes PMICs, VRMs, POLs, and LDOsThe RP4030 will faithfully acquire a low-impedance, low-voltage DC power/voltage rail signal without unduly loading the device under test (DUT), while providing high offset to allow DC power/voltage rail signal display on an oscilloscope with high gain.
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Product
Hardware Platform
SmartScan 3D
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SmartScan-3D is another hardware platform that allows 3D scan using a six axis robot and DUT holder. A DUT is placed on a 360 degree rotating DUT holding jig. Vertical scanning without rotating DUT holder is one variation of SmartScan-3D for any DUT that is standing up, rather than laying flat on X-Y plane. Any scan technology can be integrated to the SmartScan-3D.
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Product
PXI-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
778572-15
Signal Module
35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXI‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXI‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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Product
Software Tool Especially Designed for Production Process Supervision
LEON OP
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The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user levels and restrictions per user group- Displaying execution results and statistics by panel or nest- Supporting interaction with an automation (e.g.: handler system)- Supporting interaction with a process control / MES system- Integrated Callback structure to adopt to different workflows- Maintenance view for fast displaying of fails inside a board- Result History View to quickly access the last test results- Store execution results in result files with user defined format- Autostart-option for running application in automation mode without any operator interaction at all- Several abortion criteria to abort execution by fail count (consecutive or time based)- A Maintenance View for viewing testprobe locations on the DUT is available via Aster Quadview
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Product
FPGA Image Processing (IP) Development Kit
ProcVision
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Gidel’s Vision Pro Development Kit is an optimal solution for developing,validating, demonstrating and evaluating Image Processing (IP) andpipeline designs on FPGA.The suite is designed to provide a complete and convenient envelop enablingthe developer to focus strictly on the proprietary image processingdesign. The entire Vision Pro flow is within a single FPGA, independentof the final target application(s). The Vision Pro flow is composedof a pipeline that streams simulated data to the user image processingdesign under test (DUT) and then captures the design’s output streamfor displaying, storing, analysis and/or co-processing on host software.The entire process is performed on a single FPGA without the need foradditional peripheral connectivity or tools.Vision Pro suite is plug-and-play enabling the developer to begin at oncethe IP design development and validation. A simple design example providesthe developer immediate hands-on familiarization with the systemflow and supporting tools. The final design can be ported to any IntelFPGA device or other vendors’ devices (FPGA or ASIC) by replacing basiclibraries. To significantly reduce compilation time, initial design developmentmay be on a small FPGA device and later compiled for the targetdevice(s). The target implementation may use any FPGA board. For a fullImaging/Vision system solution, Gidel offers a number of off-the-shelfgrabbers and FPGA accelerators that are designed to utilize these imageprocessing blocks and Gidel Imaging Library (GIL).
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Product
PXIe-4144, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit
782432-01
Source Measure Unit
PXIe, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit - The PXIe-4144 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4144 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Product
Multi-Channel Attenuation Control Unit (4-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7204B
Attenuator
The J7204B is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204B reduces cost of ownership and provide the best measurement accuracy.
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Product
Memory Test Software
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Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Product
DC Power Module, 20V, 5A, 100W
N6743B
Power Module
The Keysight N6743B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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Product
VPC Receiver Frame
ABex REC21-84TE-EXT
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Robust and flexible interconnect solution for test fixtures. Designed for the use with ABex PXIe Rack 18 it provides support to equip all 21 slots with VPC interconnect modules. In addition, it offers 6 more slots on the bottom, below the ABex rack to feed through signals from external measurement devices.The interface uses the well-known Virginia Panel connectors with more than 20.000 guaranteed mating cycles. To build DUT specific test fixture, we also provide the corresponding ITA mounting frame (ITA = Interchangable Test Adapter).
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Product
Power Supplies And Loads
Power Supply
Power Supplies and Loads power devices under test (DUTs) such as RF power amplifiers and cellular handsets. The power supply takes in AC power and delivers DC voltage with a fixed polarity, either positive or negative, to its load.
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Product
Cryogenic Applications
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Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
Signal Generator Frequency Extenders
FES
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These frequency extension modules easily connect to the output of your signal generator so you have high-performance source for your DUT characterization activities. Characterize your DUT with the confidence that the superior performance in terms of output power, spurious and harmonic will provide product accurate results.
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Product
Test Probe
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Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
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Product
Bidirectional DC Power Supply
62000D
DC Power Supply
Chroma 62000D programmable bidirectional DC power supplies provide both power source and load characteristics. These two quadrant power supplies allow power from the DUT to be converted back to the utility grid and so are ideal for testing renewable energy power systems such as PV, storage, and EV inverters as well as a wide range of bidirectional power conditioning system (PCS) and may also be used as a battery simulator.
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Product
DC Power Module, 8V, 12.5A, 100W
N6742B
Power Module
The Keysight N6742B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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Product
PXI/PXIe Source Measure Unit Family
PXS(e)840x
Source Measure Unit
The PXS840x PXI SMU family is a high-speed, 4-quadrant source measure unit. Carry out measurements directly on the DUT with the integrated CMU and VMU.
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Product
Test Probes
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A physical device used to connect electronic test equipment to a device under test (DUT).
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Product
Functional Testing
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Functional Ethernet testing is done during the research and development phase of a product or service. It can cover many parameters depending on the DUT and the application. Using Xena’s products, your range of functional Ethernet testing includes:*Multicast*40/100G PCS and PMA Layer*Transparent Transport*Energy Efficient Ethernet (EEE)*Microbursts and random IFG*Synchronous Ethernet*Automotive Ethernet*1588v2 Performance Testing*Regression testing*Kernel drivers and NIC testing*Hardware emulation (ASIC*)
