-
Product
DUT Resistance Tester
-
AllWin Instrument Science and Technology Co., Ltd.
1. This test verfies the integrity of DUT2. The resistance is measured by measuring voltage3. Current is made by distribution
-
Product
Text-Based Way to Connect & Disconnect Relays on ABex Modules
ABex Switching
-
The ABex Switching features a text-based way to connect and disconnect relays on ABex modules. Alias names for channels could be defined in a DUT specific topology file and then be used for text-based switching. These alias names are also shown in the Konrad System Manager allowing easy debugging of test sequences. The ABex Switching functionality could be either used out of NI Teststand with the provided test steps or via API from other programming languages.- Text-based switch routes- XML based topology for Alias mapping- Switch routes with support for Alias names- Seamless integration into Konrad System Manager
-
Product
HV Test System for Patient Monitors
-
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
-
Product
Electromagnetic Immunity Scanner
SmartScan BASIC
-
The BASIC is manually operated system for performing susceptibility scanning at the system level with minimal data storage capability. This system includes:1. Up to 8kV (optional. 4kV base) pulse generator for ESD susceptibility testing- Camera and camera shutter to take DUT picture and failing spots- Control computer2. Up to 8kV Probe Sets:- 1mm Hx/y Field Probe- 5mm Hx/y Field Probe- D=8mm Hz Field Probe- D=8mm Ez Field Probe- Contact API for custom design probes3. Manual input of testing location and failing condition over the DUT to be included in final report.
-
Product
Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
-
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
-
Product
Hand-In Type Electromagnetic Anechoic Box (Shield Box)
MY3720
-
Suitable for weak electric field resistance test, out-of-service test or digital forensics for smart phone, tablet terminal or mobile PC ! !DUT can be operated directly with bare hands while placing it in the box and looking at the inside from the shield window.
-
Product
Characterization Platform
-
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
-
Product
Shield Boxes
-
Concentric Technology Solutions, Inc.
CTS can provide a customized integrated RF Shield Box or RF Enclosure Test Solution for manual or automatic testing at an off-the-shelf solution price. Many companies make RF Shield boxes, RF Enclosures or DUT fixtures, but only CTS bridges the gap by providing a complete integrated RF Shield Box or RF Enclosure testing solution for providing the RF shielding needed for repeatability within your budget and schedule.
-
Product
HV Test System up to 20000 Volt
-
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
-
Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
-
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
-
Product
DUT Boards
-
RTI designs and manufactures DUT boards for many types of special purpose test equipment including: ESD test systems, special purpose functional testers, automated curve trace equipment, as well as standard semiconductor test equipment. All designs are performed in-house using PCB design software (Mentor PADS, CAM350) and 3D mechanical design software (Solid Edge) if required. PCB fabrication is sub-contracted to one of our long-time fabrication partners.
-
Product
Function Tester with Low Number of Channels
UTP 6010 RF
-
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
-
Product
Cryogenic Applications
-
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
-
Product
P-Series Single Channel Power Meter
N1911A
-
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
-
Product
Nonlinear Pulse-Envelope Domain
S94518B
-
The S94518B Nonlinear Pulse-Envelope Domain measures the vector corrected amplitude and phase of the fundamental and harmonic pulse envelopes of your DUT.
-
Product
Sound Harmonics and Current Analyzer
H74050100
-
This analyzer is used as end of line control for electro mechanic components with electric motors, with or without mechanical reduction. While the motor is running at nominal speed, a spectrum and temporal analysis of the sound as well as a current consumption test is performed. Statistical analysis of the data acquired is also performed real-time, expediting the PASS/FAIL decision of the DUT.
-
Product
Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
-
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
-
Product
JESD22-A115 Machine-Model (MM) Pulse Emulator
MM-10A
-
High Power Pulse Instruments GmbH
- Pulse unit to generate JESD22-A115 machine-model (MM) waveforms with TLP- Extremely stable and reproducible machine-model (MM) waveforms- Compatible with HPPI TLP-3010C/4010C/8010A/8010Csystems which have installed pulse width of 25 ns and rise time of 100 ps to 300 ps- Up to ±10 A machine-model peak current with TLP-3010C, which is equivalent to ±667 V (MM)- Up to ±15 A machine-model peak current with TLP-4010C, which is equivalent to ±1000 V (MM)- Up to ±30 A machine-model peak current with TLP-8010A and TLP-8010C, which is equivalent to ±2000 V (MM)- Same measurement procedure as TLP including DC test of the DUT- Compatible with HPPI TLP software and waveform data storage and management- 50 Ω SMA input and output connectors- Compact size: 61 mm x 25 mm x 17 mm
-
Product
Functional Test Fixtures
-
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
-
Product
PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
-
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
-
Product
3U CPCI 32-bit Test Extender
-
Measurement and testing of CompactPCI® assemblies in the 3U Euro-board form factor is greatly facilitated by the use of this test adapter. Easy access to the DUT is guaranteed because the adapter has plug-in connections on 3 sides. The Modern BRIDGE design permits up to 3 CompactPCI® cards and one standard PCI® card to be inserted in one CompactPCI® slot. This allows system developers to implement a large number of tests with little effort and enables you to achieve vital time to market.
-
Product
Transformer Turns Ratio Meter
TTRM 102
-
SCOPE introduces state of the art precision single phase Transformer Turns Ratio Meter (TTRM ) designed for field testing as well as factory testing of power transformers, instrument transformers and distribution transformers of all types. TTRM 102 along with turns ratio, measures ratio deviation, phase angle deviation, magnetizing current and detects tap-position of single phase transformer in charged switchyard condition. The range of AC voltage selection offers high accuracy in measurement.Both the instrument have in-built TFT display with touch screen and thermal printer. The user friendly, simple instrument makes the testing more easy. With the touch keypad it is possible to enter required DUT information.The ratio results are displayed with % error. Internal non-volatile memory gives the provision of storing test results.Further data can be downloaded to PC or copied to memory stick through USB port provided.
-
Product
Custom Pogo Pin Rings & Blocks
-
Reduce your cost-of-test with our pogo pin blocks and interfaces that transform complex DUT boards or breakout boards into universal motherboard-style interfaces. Eliminate the need to purchase or build a new board for every unique device, unit, or package.
-
Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
-
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
-
Product
Low Noise Test Leads For N1413 With B2980 Series, 3m
N1425B
-
The N1425B is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425B is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425B enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425B to the B2985B/87B.
-
Product
FCB Probe Card
-
The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
-
Product
Multi-Channel Attenuation Control Unit (5-channels), DC to 6 GHz, 0 to 121 dB, 1 dB Step
J7205A
-
The J7205A is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to5 devices under test (DUT). Operating frequency from DC to 6 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205A reduces cost of ownership and provide the best measurement accuracy.
-
Product
1-Port 14 GHz Analyzer
R140
-
R140 Vector Network Analyzer (cable and antenna analyzer) delivers lab grade performance in a handheld device. This patented (US Patent 9,291,657) analyzer can be connected directly to the antenna or other DUT without the need for a test cable, eliminating measurement uncertainties inherent to cables. Resulting in highly dependable performance and calibration stability. The 1-port VNA comes with all the features engineers have come to expect included standard in our software.
-
Product
DUT Matrix 32 DUT Matrix Channels
40-530-021
-
The 40-530-021 is a high density 32x8 1 pole reed relay matrix. Typical applications are signal routing in functional ATE and data acquisition systems. It consists of highly reliable sputtered ruthenium reed relays that offer >10e9 switching cycles to ensure maximum switching reliability with a long service life and stable contact resistance. Larger arrays can be built by daisy-chaining the common signals from multiple PXI modules
-
Product
Active Probe, 1 GHz
N2795A
-
The N2795A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±8 V), the probe can be used in a wide variety of applications.
