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Product
Memory Test Software
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Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Product
Memory Analyzers
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Market drivers in the memory sector have changed. Gone are the days of simply pushing Moore’s Law to ever faster data rates. The memory designs of today and tomorrow must also be smarter than ever before. Today, handheld and wearable computers must draw from a limited battery reserve while serving up fast, responsive, and compelling mobile experiences. Meanwhile the cloud of data centers and server farms that feed us these compelling experiences must continuously grow while simultaneously reducing overhead and environmental impact. These two different markets have the same goals: smarter memory, smarter control systems, and lower power usage.
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Product
Memory Products
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The electronic systems we use today require some form of memory for data and software storage. As a leading supplier of high-quality memory products, we offer a broad portfolio of serial EEPROM, serial EERAM, parallel EEPROM, OTP EPROM, serial Flash, parallel Flash, serial SRAM, NVSRAM, and CryptoMemory® security ICs to meet your memory needs. We also offer the industry’s first commercially available serial memory controller for use in high-performance data center computing applications. Our extensive testing protocols have ensured industry-leading robustness and endurance along with best-in-class quality to provide you with reliable products, dependable technical support and a consistent supply of devices throughout your product’s lifecycle.
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Product
RightMark Memory Analyzer
RMMA
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Before this test packet was created there was no proper software for measuring vital system parameters such as CPU/Chipset/RAM providing steady and reliable (reproducible) test results and allowing for changing test parameters in a wide range. Vital low-level system characteristics include latency and real RAM bandwidth, average/minimal latency of different cache levels and its associativity, real L1-L2 cache bandwidth and TLB levels specs. Besides, these aspects are usually not paid sufficient attention in product technical documentation (CPU or chipset). Such test suite, which combines a good deal of subsets aimed at measuring objective system characteristics, is a must have for estimating crucial objective platform parameters.
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Product
Parallel Memory Test Solution
Magnum2
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Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.
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Product
Memory Test Systems
T5503HS2
Test System
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
Volatile Memory
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CAES offers an extensive volatile memory portfolio developed to handle the demands of harsh space and terrestrial environments.
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Product
288-Pin Dual In-Line Memory Module
SQR-UD4(ECC)
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SQRAM is Industrial Grade DRAM memory. all of SQRAM are designed with original IC chip and adopt a rigorous test program.
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Product
SO-DIMM DDR5 Memory
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the 5th generation of DDR memory designed as a small-form-factor module for laptops, notebooks, and mini-PCs.
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Product
RAMCHECK LX DDR4 Memory Tester
INN-8686-DDR4
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The RAMCHECK LX DDR4 quickly and accurately tests and identifies DDR4 DIMMs for servers and desktops, as well as laptop SODIMMs.
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Product
Shared Memory Network PCI & PCIx Interface
PCI-SMN
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Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodes - Network interrupts supported - Compatible with PCI & PCIx Host System Slots - Software Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
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Product
SO-DIMM DDR2 Memory
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Enable better electrical performance and speed (compared to SO-DDR) with Advantech. We offers industrial grade SO-DDR2 800/667 memory with 30μ" gold plating connector (200 pin), featuring 1.8v operating voltage and better bandwidth.
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Product
DRAM Memory Module DDR3 Memory
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Deliver stable memory technology with Advantech! We offers DDR3 1866/1600/1333 memory with 30μ" gold plating connector (240 pin) featuring 1.35v/1.5v low operating voltage and better bandwidth. With rigorous reliability, vibration tests, and 0 ~ 95℃ (32 ~ 203℉) wide operating temperature range, our certified DIMM is suitable for edge computing, enterprise, embedded, automotive, data centers, and networking applications.
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Product
Memory Tester
RAMCHECK LX DDR3
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Quickly test DDR3 DIMM and SO-DIMM memory. In just seconds, RAMCHECK LX will perform a thorough test of the module and provide complete identification. Also tests expensive LRDIMM modules.
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Product
4k/HD Frame Memory Board
GG-170
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The successor to the popular GG-167-HD/4K, this is an uncompressed HD/4K video input and output compliant frame memory board.
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Product
288-Pin Dual In-Line Memory Module
SQR-UD4S
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SQRAM is Industrial Grade DRAM memory. all of SQRAM are designed with original IC chip and adopt a rigorous test program.
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Product
Memory Diagnostic Utility
MemTest86
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MemTest86 is the original, free, stand alone memory testing software for x86 computers. MemTest86 boots from a USB flash drive or CD and tests the RAM in your computer for faults using a series of comprehensive algorithms and test patterns.
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Product
Memory Test System
T5835
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The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
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Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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Product
Acute 4GS/s 68 Channel Logic Analyzer With 32Gb Memory
Acute LA3068B+
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*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis*32Gb RAM*Active Probes*Logic, State, Protocol triggers
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Product
Memory Testing
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C.C.P. Contact Probes Co., LTD.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Product
Performance Profiler / Memory Leak Detector
GlowCode
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GlowCode is a complete real-time performance and memory profiler for Windows and .NET programmers who develop applications with C++, C#, or any .NET Framework-compliant language. GlowCode helps programmers optimize application performance, with tools to detect memory leaks and resource flaws, isolate performance bottlenecks, profile and tune code, trace real-time program execution, ensure code coverage, isolate boxing errors, identify excessive memory usage, and find hyperactive and loitering objects.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Acute 2GHz, 34 Channel, TravelLogic Series Protocol & Logic Analyzer With 8Gb Memory
Acute TL4234B
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The TravelLogic Series of Protocol & Logic Analyzers are small enough to fit into your shirt pocket, yet are truly sophisticated logic analyzers, capable of 2 GHz timing analysis, or 200 MHz state analysis, with up to 8 Gb total stackable memory for the 34 channels. They plug into a PC or Laptop USB port making them ideal for the field service technician or engineer, hopping from PC to PC, or taking with them for diagnosis on the road. Also remember that with USB, no additional power supply is needed.
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Product
Memory Interface Chips
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Providing memory bandwidth and capacity to unleash the power of multicore processors
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Product
14-Bit Digitizer For PCIe Gen-2, 4 Channels 125 MS/s Up To 8 GS Memory
Octave-14 Express / CompuScope 8349
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The GaGe Octave Express 83XX CompuScope PCIe digitizer card features 14-bit resolution with sampling rates up to 125 MS/s with true Effective Number of Bits (ENOB) of 11.1-bits with 10 MHz input. Onboard digitizer sample memory is expandable up to 8 GS (16 GB) and up to 8 Octave Express digitizers can be combined for up to 32 channels in a single system.
