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Memory Testing
C.C.P. Contact Probes Co., LTD.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Timing, Logic & Memory
Offering an extensive portfolio of products for programmable clocks, clock generation and distribution, standard logic and memory (Flash, EEPROM and SRAM) across various applications.
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Memory And Storage
Intel provides technically advanced products that support every level of computing—from data center workloads to enthusiast usage. Intel® Optane™ memory creates an accelerated bridge between memory and storage. Intel® Solid State Drives (Intel® SSDs) provide storage flexibility, stability, and efficiency.
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Memory Tester
RAMCHECK
RAMCHECK is our most advanced memory tester and is the latest in our product line. Highly modular and user friendly, it redefines the capabilities of an affordable and portable ram checker.
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RightMark Memory Analyzer
RMMA
Before this test packet was created there was no proper software for measuring vital system parameters such as CPU/Chipset/RAM providing steady and reliable (reproducible) test results and allowing for changing test parameters in a wide range. Vital low-level system characteristics include latency and real RAM bandwidth, average/minimal latency of different cache levels and its associativity, real L1-L2 cache bandwidth and TLB levels specs. Besides, these aspects are usually not paid sufficient attention in product technical documentation (CPU or chipset). Such test suite, which combines a good deal of subsets aimed at measuring objective system characteristics, is a must have for estimating crucial objective platform parameters.
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Memory Test System
T5801
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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Volatile Memory
CAES offers an extensive volatile memory portfolio developed to handle the demands of harsh space and terrestrial environments.
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Memory Test System
T5830/T5830ES
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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4k/HD Frame Memory Board
GG-170
The successor to the popular GG-167-HD/4K, this is an uncompressed HD/4K video input and output compliant frame memory board.
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Memory Diagnostic Utility
MemTest86
MemTest86 is the original, free, stand alone memory testing software for x86 computers. MemTest86 boots from a USB flash drive or CD and tests the RAM in your computer for faults using a series of comprehensive algorithms and test patterns.
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Reflective Memory Node Card
PMC-5565PIORC
The PMC-5565PIORC Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data.
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Memory Burn-in Tester
B6700 Series
B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Lan Digitizer / Oszilloscope With 16 Bit, 4 Channels 100 MS/s Up To 8 GS Memory
The GaGe series of Faceless Connected Instruments (FCiX) provide test and measurement professionals new options for integrating high resolution, multi-channel digitizers into Ethernet and LAN enabled measurement systems. The applications served include manufacturing test, automotive test, remote communications monitoring, multi-site semiconductor test, and other solutions where a lightweight but powerful, multi-channel, independent digitizer system is required.
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Reflective Memory Analyzer
PEAZ-5565
Abaco Systems' PEAZ-5565 Reflective Memory Analyzer is a powerful analytic tool for the industry-leading 5565 Reflective Memory (RFM) product family. By creating a window into network traffic, the analyzer allows you to deep dive into your application code to start solving problems.
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Memory Tester for DDR4 DIMMS
RAMCHECK LX
USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
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Acute 4GS/s 68 Channel Logic Analyzer With 32Gb Memory
Acute LA3068B+
*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis*32Gb RAM*Active Probes*Logic, State, Protocol triggers
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Automated Memory Analyzer
Volatility
Volatility has become the world’s most widely used memory forensics platform. The project is supported by one of the largest and most active communities in the forensics industry. Volatility also provides a unique platform that enables cutting edge research to be immediately transitioned into the hands of digital investigators. As a result, research built on top of Volatility has appeared at the top academic conferences and Volatility has been used on some of the most critical investigations of the past decade. It has become an indispensible digital investigation tool relied upon by law enforcement, military, academia, and commercial investigators throughout the world.
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Dynamic Digital I/O (3U), 16 Ch., Per Pin Control, Up To 200 MHz W/256MB Memory & LVDS
GX5293
The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 digital input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.Dynamic Digital I/O (3U), 16 ch., per Pin Control, up to 200 MHz w/256MB Memory & LVDS
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4-CH 16-Bit 10/40 MS/s PCI Digitizers with 512 MB Memory
PCI-9816/9846
The ADLINK PCI-9816/9846 are 10MS/s, 40MS/s sampling 16-bit 4-CH digitizers designed for digitizing high frequency and wide dynamic range signals with an input frequency up to 20 MHz. The analog input range can be programmed via software to ±1 V or ±0.2 V and ±5 V or ±1 V. With a deep onboard acquisition memory up to 512 MB, the PCI-9816/PCI-9846 are not limited by the data transfer rate of the PCI bus to enable the recording of waveforms for extended periods of time.
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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14-Bit Digitizer For PCIe Gen-2, 4 Channels 100 MS/s Up To 8 GS Memory
Octave-14 Express / CompuScope 8347
The GaGe Octave Express 83XX CompuScope PCIe digitizer card features 14-bit resolution with sampling rates up to 125 MS/s with true Effective Number of Bits (ENOB) of 11.1-bits with 10 MHz input. Onboard digitizer sample memory is expandable up to 8 GS (16 GB) and up to 8 Octave Express digitizers can be combined for up to 32 channels in a single system.
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Dynamic Digital I/O (3U), 32 Channels Up To 200 MHz W/512MB On-Board Memory, W/LVDS
GX5283
The GX5280 Series are high performance, cost-effective 3U PXI dynamic digital I/O boards with 32 TTL input or output channels and 32 LVDS input or output channels. The GX5280 Series offers an industry leading 512 MB of on-board memory and supports test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
