Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
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Electricity Metering Device- Residential
Mk31E
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Mk31E is another addition to the Papillon series which enhanced the Mk31 with a disconnect relay, additional communication capabilities, advance tampering features and a larger memory storage capacity.
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Device Parameter Analysis
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bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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Wireless Device Compliance Testing
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Compatible Electronics is the largest commercial wireless testing and certification body in Southern California. Our state of the art equipment ensures we have the tools and resources necessary to get your wireless approvals completed with a quick turnaround time.
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Ethernet Powered Device Analyzer
PDA-604A
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Emulate any 802.3at Type-1, Type-2, 802.3bt Type-3, or Type-4 PSE powering 2 or 4 pairs at all possible PD input voltages. Optionally supports 802.3at and 802.3bt Ethernet Powered Device Conformance Test Suites and LLDP Emulation and Analysis.
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Cable Locating Device
TM520
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Coordinating with high-voltage signal generator, test sound and magnet simultaneously, locate high-resistance and arc-over fault of the power cable. While fixing the fault point, the instrument can test the cable path as well.Coordinating with audio-frequency signal generator, test audio frequency induction, locate low-resistance fault, and identify the cable and test the depth of it.
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Product
MODEM SHARING DEVICES
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The Modem Sharing Devices are designed to allow RS-232 DTE (terminal) devices to share Leased Line and Dial line Modems or DSU's. Data arriving at the Master Port is continually broadcast to all Subchannels. The attached terminal device that raises the RTS control signal is automatically given control of the MSD. Data rates of up to 128 Kbps are supported.
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High-Voltage Test Device
PGK 110 / 5 HB
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Cable testing and diagnostics with the BAUR PGK HB. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit.* Testing as DC or Dc testing device* Polarity of the DC voltage can easily be reversed* Robust and durable
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Vehicle Multiprotocol Interface Device
Interface
The Vehicle Multiprotocol Interface Device excels in applications requiring real-time, high-speed manipulation of hundreds of CAN frames and signals, such as hardware-in-the-loop (HIL) simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI-XNET device-driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time for processing complex models and applications.
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ESD Device Testing
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Barth Electronics, Inc. offers complete ESD Testing to the semiconductor industry. Nothing is outsourced – all testing is performed at our factory in Boulder City, Nevada.
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Automated Memory Analyzer
Volatility
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Volatility has become the world’s most widely used memory forensics platform. The project is supported by one of the largest and most active communities in the forensics industry. Volatility also provides a unique platform that enables cutting edge research to be immediately transitioned into the hands of digital investigators. As a result, research built on top of Volatility has appeared at the top academic conferences and Volatility has been used on some of the most critical investigations of the past decade. It has become an indispensible digital investigation tool relied upon by law enforcement, military, academia, and commercial investigators throughout the world.
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Testing And Inspection Devices
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HEIDENHAIN offers testing and inspection devices that deliver all setup, monitoring, and diagnostic data needed for the analysis of its encoders. Grid encoders from HEIDENHAIN are ideal for machine tool inspection and acceptance testing, accurately measuring CNC machine tool movements in both static and dynamic inspection.
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Programmer AUTO300 Weilei Memory
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AUTO300 is the newest programmer from weilei company. That programmer is dedicated to automotive electronics. The main advantages are : reliability, speed, and the ratio of quality to price, the software in ten languages and 3-year warranty
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Optical Device
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Optical devices are products that use the optical characteristics (birefringence) of quartz crystals. Murata Manufacturing uses high-precision synthetic quartz crystals grown using our proprietary technology to manufacture high-grade products.
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Digital Ultrasonic Testing Device
SONAPHONE
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The ultrasonic leak detector SONAPHONE is designed for a quick and precise location of leaks in compressed air, inert gas and vacuum systems. System leaks can easily be detected. The variety of devices in the range and the extensive accessories available enable this range of devices to be used for a multitude of various applications. With the help of the ultrasound testing device SONAPHONE, it is easy to pinpoint leaks.
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Rolling Displacement Measuring Device
ASR01
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This device is used to dynamically measure the displacement and load that occur when a specific sample is pressed down using a flat indenter, and to help analyze the phenomenon and the potential capacity of the sample.
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Radiation Survey Device
DRG-T
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The DRG-T radiation survey device is designed for use in special-purpose vehicles for continuous control and measurement of exposure dose rate (EDR) of gamma and X-ray radiation, as well as for providing audio and visual alarm of its dangerous levels and for issuing commands to start the actuators of protection equipment.
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Millimeter Wave Control Devices
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Ducommun millimeter wave products include various control devices for system integration. The CAE, CPS, CPD and CPM series control devices are discrete or MMIC based PIN diode attenuators and switches. The CAF, CAL, CAR and CPL series control devices are waveguide based mechanical tunable attenuators and phase shifters. These devices are offered to cover the frequency range from 18 GHz to 110 GHz.
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Passive Tapping Device
DSL Phantom™
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DSL Phantom™ is a unique passive tapping device for Lawful Interception (LI) of ADSL lines. The device records and stores broadband digital information, offering unique advantages to Law Enforcement Authorities (LEAs) looking to capture data between the target and the service provider premises.
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Device Specific Kits
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Kits contain specific type of the measuring device and is packed with typical accessories
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Product
PXI/PXIe High-Accuracy Multi-Measurement Device
PXM(e)7822
Digital Multimeter
The PXM Multi-Measurement Devices combine the functionalities of a 16 Bit digitizer, a 24 Bit multimeter, a timer/counter and a highly flexible trigger matrix in a PXI or PXIe device.
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Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Digital Reconfigurable I/O Device
ITA
The Digital Reconfigurable I/O (RIO) Device features user-programmable FPGA for onboard processing and flexible I/O operation. You have complete control over the synchronization and timing of all signals and operations along with custom onboard decision-making that executes with hardware-timed speed and reliability. You can configure user-defined hardware for a wide variety of applications, such as custom digital DAQ, high-speed waveform generation, sensor simulation, hardware-in-the-loop (HIL) test, custom digital communications protocols, bit error rate testing, and other applications that require precise timing and control.
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Separation Layer Device
NivuScope 2
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NivuScope 2 measurement system for reliable separation layer detection and sludge level measurement mainly in primary and secondary clarifiers
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Product
SpaceWire EGSE & Device Simulator
312
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The SpaceWire EGSE & Device Simulator is a programmable hardware unit designed specifically for generating sophisticated test schedules involving precision timing and creating accurate real-time simulations for SpaceWire enabled instruments.
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Product
IP-Reflective Memory
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Each IP-ReflectiveMemory can be used as a standard node or as the Master Node. Clearly labled "DIP Switches" are provided to make the selection of Master or Standard Node, and the Node Address. The Network is based on using LVDS signaling over Ethernet cabling. Nodes automatically come up for pass through operation.
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Device Testing
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The BTL Working Group (BTL-WG) has developed a test package which contains a set of testing procedures. These can be acquired and used by manufacturers to pre-test their products for BACnet compliance before they send their products to an RBTO (Recognized BACnet Testing Organization) for BTL Testing. The BTL Test Package is available on the test documentation page.
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Pull Out Device
BCL-1
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This Pull out device BCL-1 is designed and manufactured according to relevant standard requirements of IEC884-1/ GB2099.1-2008 and other electrical accessories standards, Mainly used to test the needed maximum force when the plug pull out from socket and the minimum force when single stage plug pull out from socket, and to inspect whether the socket can withstand the lateral stress imposed by electric plug into the socket. This device is applied to plugs and sockets which rated voltage no more than 250V and rated current no more than 16A.Specifications: • Weights: 36N*1, 5.4N*1, 5N*2, 4N*1, 2.6N*1; • Standard testing plug: each one for Dipolar 10A, tripolar 10A and 16A • Standard test bolt: Each one for 1.5N and 2N • 1 set of clamping device • 1 set of Weights tray • Lateral stress weights 5N*1 • 1 set of lateral stress bar
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Acute 4GS/s 136 Channel Logic Analyzer With 32Gb Memory
Acute LA3136E+
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*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis*32Gb RAM
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Backend Test For Packaging Devices
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Power MOSFETs need a lot of different tests. We understand backend test, and have over 80% of our installations used in this application, operational 24hrs every day delivering fully tested and QA approved products at throughput rates up to 20kuph. Backend test, for power devices in particular, has a diverse, but well-established list of technical demands to detect both failures and failure mechanisms.
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IoT Devices Penetration Testing
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There is a rising concern that IoT devices are being developed rapidly without appropriate consideration of the profound security challenges involved, as demonstrated by the various IoT devices hacked in recent years— automobiles, cameras, children's toys, thermostats, and medical devices.With more than a decade of specialized cyber security testing experience combined with our extensive research and development, we can assess and identify both common and complex security vulnerabilities that may be residing within your whole IoT ecosystem.
