Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
- Pickering Interfaces Inc.
product
PXI Single 18 Channel MUX, BNC Connectors
40-735-902-S3
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the de...show more -
product
Cantilever Spring Pin ULTRA
CONTACT Series
ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
-
product
UHS II Protocol Analyzer and Exerciser
PGY-UHS II SD/SDIO
Prodigy Technovations Pvt. Ltd.
UHS II Protocol Analyzer (PGY-UHS II SD/SDIO) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. PGY-UHS II SD/SDIO UHS II Protocol Analyzer is the most feature rich comprehensive Protocol Analyzer available to capture and debug UHS-II protocol data. PGY-UHS-II Protocol Analyzer supports FD156 and HD312 data rate. The innovative active probe has minimum electrical loading on device under test (DUT) and captures protocol data without affecting the performance of DUT.
-
product
Modular Power
RFP DC High Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
-
product
Test Connector Components
Any flat substrate, or bumped substrate, can be compressed against Z-Axis Elastomeric Connectors to make contact. The picture illustrates a Z-Thru Z-Alloy Connector Frame used to connect the DUT (Device Under Test) to a circuit board.
-
product
Breakdown Voltage Tester
ZDS-50B
Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.5-2008/IEC60851-4; Inspection standard: JB/T4279.11-2008Used to test the breakdown voltage performance under room temperature of enameled round and flat wires with nominal conductor diameter of 0.018mm and above;Three voltage rise speeds are available: 20V/s, 100V/s and 500V/s, with error being ±5%;Three test methods can be adopted: round bar method, twist pair method and ball method;Clamp a group of test samples (5 for each) once, available to complete breakdown or ...show more -
product
1kV, 25 MHz High Voltage Differential Probe with Auto Zero Disconnect
HVD3102A
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
-
product
Customized Test Fixtures
Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
-
product
Solderability Tester
LBT210
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
-
product
MEMS Device-Oriented Testers
Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
-
product
Modular Power
RFP Controller
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
-
product
Digital I/O Adapter Module For FlexRIO
Digital I/O Adapter Modules for FlexRIO offer up to 54 channels of configurable digital I/O that can interface with single‐ended, differential, and serial signals at a variety of voltage levels. When combined with a large, user‐programmable FPGA, you can use these modules to solve a variety of challenges, from high‐speed communication with a device under test to emulating custom protocols in real time.
-
product
Logic Analyzer Probes
Three probe types are available for GoLogicXL logic analyzers: flying leadset, Mictor, and Pinpoint probes. The Mictor and Pinpoint probes are compatible with similar Keysight/Agilent "soft touch" and Tektronix "connectorless" probes. All GoLogicXL probes are coaxially shielded and use passive termination inputs to prevent loading the device under test. Both differential and single-ended input signals are supported by all probes. Input voltage swings small as 300 mV are supported in single-ended mode, and 150 mV for differential signals.
-
product
PXI Matrix Switch: 8x32, 1-Wire, 100Vrms/2A, Armature Relays
M9122A
The M9122A is an 8x32 full crosspoint switch matrix offering high-voltage switching in a high-density PXI module. This module allows for higher voltage switching of multiple channels in a single instance. Any row can be connected to any column, making it ideal for routing instrument signals to the device under test. This module is configured with a common ground. The durable armature switches are capable of switching up to 100Vrms, with up to 60W of power. The 8-wide bus can be used to route signals between your instruments and the device under test. Choose from the durable connector block or standard cable connections.
-
product
NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
-
product
Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Ea...show more -
product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization pro...show more -
product
Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
-
product
RF / MW switch
The RF / MW switch includes a variety of RF and microwave switch modules - RF multiplexers, which are available for use in the 34980A multifunction switch / measurement unit, providing broadband switching from DC to 20GHz . Use these modules to route test signals between your device under test and a signal source, oscilloscope, spectrum analyzer, or other instrument. The switch / attenuator driver module also controls the external switches and attenuators of the 34980A.
-
product
sbRIO-9239, Non-Enclosed, ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780875-01
Non-Enclosed, ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the sbRIO‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range. Non-enclosed modules are designed for OEM applications.
-
product
2-Axis Rate and Position Tables
When a device under test needs to be stimulated with simultaneous movements around two axes, then a product from the ACUTRONIC two-axis motion simulator range is the right choice. Due to their independent motion simulation in two axes they are very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
-
product
PXI 18 Channel Data Comms MUX, 96-pin SCSI
40-735-902
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the ...show more -
product
Handheld Circuit Breaker And Timer Analyser
CAT-H Series
The operation of the breaker can be initiated in different ways (e.g. from a control room, by a local breaker or externally by a test device) depending on the test conditions. Various time measurement triggers are available to record a measurement under a different test condition:*Coil control channel*Continuous current clamping channel*DC voltage channel
-
product
High Flexibility VNA Cables
Our lines of high frequency VNA test cables display excellent electrical properties such as wonderful phase stability of +/- 6° at 50 GHz and +/- 8° at 67 GHz as well as VSWR of 1.3:1 at 50 GHz and 1.4:1 at 67 GHz. The 50 GHz assemblies are terminated with 2.4mm connectors while the 67 GHz versions utilize 1.85mm connectors. The braided stainless steel armoring surrounding the coax provides a rugged, but flexible cable with a flex life exceeding 100,000 cycles, making these test cables ideal for...show more -
product
Multimedia Test Video Generator/Analyzer
882EA-DP
The Teledyne LeCroy quantumdata 882EA-DP test instrument with both a DisplayPort 1.1 transmitter and receiver (analyzer) option is packed with features for video and audio testing of DisplayPort monitors and sources at pixel rates up to 268 MHz. The 882EA-DP test instrument provides two (2) additional DisplayPort ports for passive monitoring of the link layer through the optional Aux Channel Analyzer (ACA) application. The ACA option enables you to monitor link training transactions either betwe...show more -
product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
-
product
4 x 8 Two-Wire Matrix Module for 34970A/34972A
34904A
The Keysight 34904A module for the 34970A/34972A Data Acquisition/Switch Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your DUT at the same time. Rows or columns may be connected between multiple modules to build 8 x 8, 4 x 16 or larger matrices, with up to 96 crosspoints in a single frame.
-
product
Test Leads Adapter Sets
A physical device used to connect electronic test equipment to a device under test.
-
product
PXIe Digital I/O: 28 LVDS Channels, 8 Trigger Channels
M5302A
M5302A is a single-slot Digital IO PXIe module with 28 programmable LVDS channels and 8 single-ended channels. The LVDS channels can be used to communicate to the device under test or can be used to control other devices by emulating protocols such as Camera Link. The single-ended channels are suitable for event triggers or other general-purpose IO applications.
-
product
4 Channel 1.0 ~ 17.0 Gb/s Pulse Pattern Generator and Error Detector
CA9806
The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate ...show more -
product
PXI Single 36 Channel MUX, SMB Connectors
40-735-912-S4
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the de...show more
