Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Product
128-Ch 0,250A-100VAC 24VDC Multiplexer/Matrix
YAV90128
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A unique YAV90128 module is able to do all combinations of signal computation at low frequency between the device under test and the various measuring instrumentation inside a test system.
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Product
RF & Microwave Modules for 34980A
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The Keysight RF and Microwave multiplexer modules for the 34980A Multifunction Switch/Measure Unit offer broadband switching capabilities for switching from DC to 26.5 GHz. Use these modules to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation. A switch/attenuator driver module also allows control of switches and attenuators external to the 34980A Mainframe.
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Product
LXI Matrix Switching Unit
ProDAQ 6140
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The ProDAQ 6140 provides a relay matrix which can be fitted between the sensors and actuators on a device under test and the data acquisition and control system. It allows to separately connect/disconnect the signals from either side and to connect them to an internal bus. In this way signals can be routed via the bus to new destinations or the bus can be used to monitor or supply test signals. This allows calibrating and debugging the system without disconnecting and separating channels throughout the system wiring.
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Product
Source/measure Units
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Transcat offers source measure units in various categories, from precision to application specific. A source and measurement unit (SMU) is a device that supports testing applications, including those that demand high accuracy and high resolution capabilities. The units essentially combine the functionality of a DMM with a precise power supply, while also offering excellent low current operations. An SMU can precisely source voltage or current to a device under test or development, while simultaneously measuring voltage and/or current. These simultaneous capabilities often equate to faster testing processes. An SMU is the smart solution when low-level voltage, current, and resistance are needed for functional tests and electronics profiling. Unit applications range from design validation to manufacturing, and SMUs are frequently used within the semiconductor and electronics industries.
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Product
RSE Wireless EMC Spurious Emission
TS8996
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The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
Pressure Comparator (System D)
P Series
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AMETEK Sensors, Test & Calibration
The P-Series (System D) comparators are hydraulic screw pumps designed for easy, controlled, high pressure generation. Each comparator includes a 4 connection manifold, which can be used for the reference indicator, the device under test, a fine adjust, an isolation valve, or a fluid reservoir. The adjustable reference pressure port lets you set your reference gauge at the best viewing angle. Three models are available for hydraulic oil, water, or both.
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Product
CAN MiniModules
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Measurement points distributed throughout a device under test, whether in a vehicle or at a test bench place high demands on the measurement technology. Measurement modules must be compact, robust, reliable, and easy to use. CSM meets all these requirements with its long-term proven CAN MiniModule series.
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Product
RF Shielded Test Enclosure, Largest Rack Mountable Enclosure
JRE 1724
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Originally designed for testing wide screen laptops, the rack-mountable JRE1724 is ideal for large wireless devices such as; Mesh Network AP's, Cellular/LTE/4G Base Stations, and other large RF devices. Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble free operation over its lifespan. Internal struts keep the lid open for easy internal access when connecting the device under test.
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Product
BERT Measurement Solutions
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Bit error rate testers (BERTs) are usually the initial step for communications testing. These instruments generate digital test patterns, typically pseudorandom binary sequences (PRBSs), that drive devices under test (DUTs). Following the transmission of the signal through the link, the receiver in the BERT captures the signal. This setup can be used for multiple testing purposes, such as to evaluate the performance of a transmitter, a receiver, or an optical link.
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Product
PCIe 6.0 Protocol Analyzer
P5570A
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Keysight PCIe 6.0 Protocol Analyzer redefines protocol debugging and validation through a new innovative CEM card form factor, bringing vast improvement in signal integrity and equalization with instant link-up to systems as well as devices under test
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Product
DUT Prototype Board
DPB8800
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The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.
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Product
EMC Accessories
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Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
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Product
Test Port Adapter Set, 3.5 Mm (Test Port) To Type-N
85130C
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The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
1kV, 120 MHz High Voltage Differential Probe with Auto Zero Disconnect
HVD3106A
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The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Product
12-Ch 10A-250VAC RCV Power Distribution Unit
YAVAR438
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- Hardware controlled Enable Input- 12 Power relays up to 10A 250VAC/DC and 300W or 2.700VA switching power- 12 10-mOhm shunt resistors.- 6 Switched 2-Pole sense channels- Single phase isolated or 3-Phases non-isolated switching capabilities, to or from the device under test (power or load)- VPC TriPaddle 96 pins connector.- NI LabView & TestStand driver.- .NET, C/C++, VB driver.- Soft Front panel for direct interface.- CAN Control or Ethernet (with Ethernet to CAN Gateway).- Self-test module available.- Form A
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Product
PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
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PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
AC High Voltage Tester
VHT
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VEER make High Voltage Tester VHT is specially designed to test Dielectric Strength of Device under Test as per applicable standards. High Voltage test is required to determine whether test object has proper insulation or not. High Voltage test is carried out as Routine Test Each device is subjected to test at high voltage of 1 kV + 2 x (working Voltage)If Insulation is weak then device will consume more power because of leakage current which causes more heat. Heat will reduce the reliability and overall life of device under test It is also responsible for high risk of electric shock. So, High voltage test is necessary for all electrical equipments.
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
Mass Interconnect
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Mass interconnect is a way of connecting test instrumentation to a device under test (DUT). To put it simply, mass interconnect is a very large plug and socket which connects your device under test to your test instrumentation without the mess and hassle of having to connect each signal separately.
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Product
PathWave Lab Operations For Battery Test
EP1150A
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PathWave Lab Operations for Battery Test enables efficient planning and coordination of your entire battery test laboratory. It manages all resources, including test fields, test systems, and your device under test (DUT). PathWave provides an integrated, web-based lab management platform that helps you modernize your test workflows, eliminating legacy paper-based processes, and increasing data integrity and traceability.
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Product
PCIe 6.0 Protocol Exerciser
P5573A
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Keysight P5573A PCIe 6.0 Protocol Exerciser gives the flexibility in providing realistic traffic to devices under test and also able to emulate as a complex host system
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Product
Keysight Dual/Quad 4x8 Reed Matrix for 34980A
34933A
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The Keysight 34933A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x8, 8x8, or 4x16 2-wire configurations 64 2-wire or 128 1-wire cross-points High-speed reed relays Connections to the internal DMM Expandable via four 2-wire analog buses Relay counter ±150 V peak, .5 A switch, 1.5 A carry current
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Product
Functional Test
UTS
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The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
Digital Instruments
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Digital Instruments generate and acquire high-speed digital waveforms for transmitting data, communicating with devices under test, or testing digital interfaces. These instruments are ideal for semiconductor characterization and production, interfacing to LVDS and TTL digital electronics, and testing the functionality of high-speed serial links.
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Product
Modular Power
RFP DC Load
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AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Product
Test Connector Components
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Any flat substrate, or bumped substrate, can be compressed against Z-Axis Elastomeric Connectors to make contact. The picture illustrates a Z-Thru Z-Alloy Connector Frame used to connect the DUT (Device Under Test) to a circuit board.
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Product
Solderability Tester
LBT210
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Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
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Product
Regenerative Power System, 500 V, 40 A, 10 kW, 200/208 VAC
RP7952A
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The RP7952A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test. The regenerative capability enables the energy normally consumed to be returned to the grid cleanly, saving costs associated with energy consumption and cooling.
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Product
PXIe-4112, 2-Channel, 60 V, 1 A PXI Programmable Power Supply
782857-01
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The PXIe‑4112 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
