Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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AC Voltage Proving Units
HLV-2
Standard Electric Works Co., Ltd
The AC Voltage Detectors and AC Voltage Testers utilized to determine if the devices under test are functionally working. They are not a calibrator and cannot be utilized for calibration.
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Power Profiler, DC Energy Analyzer, Power Supply, Digital Multimeter, Source Measure Unit, Power Debugger
Otii Arc Pro
Otii Arc Pro is an instrument that can precisely source voltage or current and simultaneously measure voltage and/or current. It computes power and energy and syncs with software output, enabling engineers and developers to easily see what drains the energy and optimize the battery life of their devices under test.
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Test Leads Adapter Sets
A physical device used to connect electronic test equipment to a device under test.
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PXI Programmable Power Supply
PXI Programmable Power Supply modules feature multiplechannels that you can combine for higher voltage or current capabilities. Some modules include isolatedchannels and an output disconnect functionality that allows isolation from the device under test(DUT) when not in use and remote sense to correct for losses in system wiring. You can use these models to simplify the task of designing automated test systems for a wide range of applicationsfrom aerospace and defense to automotive and component testby eliminating the need to mix multiple instrumentation form factors in a given test system.
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Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Qualification Tester
LQ402
Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 6 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 2 cabinets. One is for the electronic components with the primary measurement devices and the other one holds the 6 load boxes.
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Regenerative Power System, 20 V, ±400 A, 5 KW, 200/208 VAC
RP7931A
The Keysight RP7931A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Function Tester with Low Number of Channels
UTP 6010 RF
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
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PXI-2549, 2.7 GHz, 50 Ω, Dual-Terminated SPDT PXI RF Relay Module
778572-49
2.7 GHz, 50 Ω, Dual-Terminated SPDT PXI RF Relay Module - The PXI‑2549 is a general-purpose single‑pole double‑throw (SPDT) switch module. You can use it to add flexibility to your switch network or to maintain uniform signal paths across multiple channels when building high‑channel‑count multiplexers. The PXI‑2549 termination resistors minimize reflections on open channels and protect your source or device under test from damage. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use its onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Regenerative Power System, 950 V, 20 A, 10 kW, 200/208 VAC
RP7953A
The RP7953A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test. The regenerative capability enables the energy normally consumed to be returned to the grid cleanly, saving costs associated with energy consumption and cooling.
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Solderability Tester
LBT210
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
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Automatic Fixture Removal
S95007B
Many devices do not have coaxial connectors and so they are put in fixtures in order to measure them in a coaxial environment. You must accurately remove the effects of the fixture to get a good measurement of the device under test (DUT). This option adds a powerful application wizard to guide you through characterizing a fixture and removing it from the measurement. The S95007B software is compatible with M980xA PXI Vector Network Analyzers.
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Test Connector Components
Any flat substrate, or bumped substrate, can be compressed against Z-Axis Elastomeric Connectors to make contact. The picture illustrates a Z-Thru Z-Alloy Connector Frame used to connect the DUT (Device Under Test) to a circuit board.
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Error Detector Remote Head 32 and 17 Gb/s
N4952A
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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PXIe-4143, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit
782431-01
PXIe, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit - The PXIe-4143 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4143 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4143 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Artificial Power Supply Network
KH3763
Beijing KeHuan Century EMC Technology Co,.LTD
The artificial power supply network (also called the power supply impedance stabilization network) should be able to provide a stable impedance to the device under test in the radio frequency range, isolate the device under test from high-frequency interference on the power grid, and then couple the interference voltage to the receiver.
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Customized Test Fixtures
Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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Single Board Source/Meter/Switch
SMSU
SMSU Series SourceMeterSwitch Unit (SMSU), introduced by SW Link Ltd, is single-channel voltage/current sourcing, 4X6 switch matrix and measurement instruments. Each Series 100 SMSU instrument tightly integrates highly accurate stable DC power source and a true instrument-grade programmable gain amplifier and 18bits ADC on a 100x100mm PCBs. It can output up to 20V, sub-uA to 1A current to device under test (DUT)
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Spring Probes
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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PXIe-2748, 3 GHz, 16x1 PXI RF Multiplexer Switch Module
780587-48
PXIe, 3 GHz, 16x1 PXI RF Multiplexer Switch Module—The PXIe‑2748 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 3 GHz in production test applications. The high channel count of the PXIe‑2748 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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PXI Battery Simulator Module
41-750-001
The 41-750 is a battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals than can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
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MEMS Device-Oriented Testers
Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
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RFP DC Low Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems
QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.
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NI-9228 , ±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783861-02
±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9228 performs differential analog input. With channel-to-channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9228 is simultaneous sampling with two options for filtering: a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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Regenerative Power System, 80 V, ±250 A, 10 KW, 200/208 VAC
RP7935A
The Keysight RP7935A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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NI-9224, ±10 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783862-01
±10 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9224 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9224 is simultaneous sampling with two options for filtering a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
