Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Product
Three-Phase compact Electric Power/Energy
MC133C
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The Model MC133C is a compact single housed three phase electric power/energy calibrator. It can supply the device under test with precision one phase AC voltage and current with calibrated phase shift along with DC voltage and current. Output voltage can be set in five ranges up to 280V and output current in six ranges up to 30A.
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Product
RF Filters
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RF Filters block unwanted frequencies when testing electronic devices for emissions during EMC testing. They attenuate unwanted frequencies and allow the desired signals through. The RF filters isolate the device under test from external RF noise, this increases the reliability and accuracy of the EMC testing by preventing out-of-band noise and harmonics.
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Product
Shock Testing
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Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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Product
Matrix Modules for 34980A
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The 34980A matrix modules are full cross-point matrices allowing you to connect any row to any column in the same instance. This is a convenient way to connect multiple test instrument points to multiple points on a device under test. All matrix modules also include a relay switch counter to help predict when relays need to be replaced.
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Product
PXI Programmable Power Supply
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PXI Programmable Power Supply modules feature multiplechannels that you can combine for higher voltage or current capabilities. Some modules include isolatedchannels and an output disconnect functionality that allows isolation from the device under test(DUT) when not in use and remote sense to correct for losses in system wiring. You can use these models to simplify the task of designing automated test systems for a wide range of applicationsfrom aerospace and defense to automotive and component testby eliminating the need to mix multiple instrumentation form factors in a given test system.
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Product
Programmable RF Multi-Port Test
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A programmable multi-port switch between your RF device under test and a Vector Network Analyzer significantly speeds up testing.
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Product
Battery Simulator
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The purpose of this battery impedance network (BNB) is to provide electric power to the device under test, providing a standard impedance. It has been developed for automotive tests. A resistor that emulates the internal battery resistance is implemented in the BNB.
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Product
Electronics Functional Test
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Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
NI-9229, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module
779785-02
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±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
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Product
Error Detector Remote Head 32 and 17 Gb/s
N4952A
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The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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Product
Quad 4x32 Reed Matrix for 34980A
34934A
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The Keysight 34934A module for the 34980A Multifunction Switch/Measure Unit offers the highest density matrix for connecting paths between your device under test and your test equipment, allowing for multiple instrument connections to multiple points on your device under test at the same time.
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Product
6kV, 100 MHz High Voltage Differential Probe with Auto Zero Disconnect
HVD3605A
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The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Product
PXI-2547, 2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module
778572-47
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2.7 GHz, 50 Ω, 8x1 PXI RF Multiplexer Switch Module—The PXI‑2547 is an RF signal multiplexer switch module. The higher channel count of the PXI‑2547 makes it ideal for test systems that require the switching of a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
PXIe-4143, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit
782431-01
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PXIe, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit - The PXIe-4143 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4143 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4143 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Automated Optical Inspection (AOI)
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Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method.
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Product
Pod/Nest Fixtures
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Nest and Pod Fixtures are used to test components and sub-assemblies. They typically are built in an array and the devices under test are subjected to tests that simulate operating conditions or life-cycle testing. Test Head Engineering is experienced in providing nest and pod testers that meet the connectivity, ergonomic and mechanical requirements of component testing.
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Product
Regenerative Power System, 500 V, 40 A, 10 kW, 400/480 VAC
RP7962A
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The RP7962A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test. The regenerative capability enables the energy normally consumed to be returned to the grid cleanly, saving costs associated with energy consumption and cooling.
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Product
Multi-Channel Attenuation Control Unit (4-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7204B
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The J7204B is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204B reduces cost of ownership and provide the best measurement accuracy.
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Product
Test Probe
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Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
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Product
PXIe-4144, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit
782432-01
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PXIe, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit - The PXIe-4144 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4144 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Product
Test Probes
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A physical device used to connect electronic test equipment to a device under test (DUT).
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Product
Pulsed IV-Curve Solutions
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Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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Product
GONIOPHOTOMETRY
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Goniophotometers are required to measure angular resolved distributions of photometric or colorimetric quantities, either by rotating the lighting device under test or by moving the sensor around the device. Depending on the application, different geometries are used to obtain distributions in the appropriate CIE coordinate system.
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Product
Regenerative Power System, 160 V, ±125 A, 10 KW, 200/208 VAC
RP7936A
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The Keysight RP7936A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Product
Scalar Network Analyzer Extenders
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A Scalar Network Analyzer is a type of RF network analyzer that is used to measure only the amplitude properties of a DUT (Device Under Test). Unlike a Vector network Analyzer, it does not measure both amplitude and phase of the DUT.
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Product
Bulk Current Monitoring Probe
MP-50
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The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.
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Product
Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems
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QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.
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Product
CMX RF Port Extender
CMX-Z25
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Complex devices under test (DUT) come with additional antenna ports to support low, mid and high bands - and advanced MIMO schemes such as 4x4 MIMO. The R&S®CMX-Z25 is the solution: Up to 16 DUT ports can be supported with just 4 ports from R&S®CMX500. So even prototypes of 5G smartphones, tablets, laptops or industrial modules with an extended number of antenna ports can now be connected to a single R&S®CMX500. Together with the scalable CMX architecture any 5G and 5G Advanced mobile device can now be tested in one go - without recabling or 3GPP band combo limitations.
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Product
Artificial Power Supply Network
KH3762
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Beijing KeHuan Century EMC Technology Co,.LTD
The artificial power supply network (also called the power supply impedance stabilization network) should be able to provide a stable impedance to the device under test in the radio frequency range, isolate the device under test from high-frequency interference on the power grid, and then couple the interference voltage to the receiver.
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Product
Memory Test Software
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Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
