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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
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The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
1.25 Gbps Compact Bit-Error-Rate Tester
OPB1250
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The OPTELLENT OptoBERT™ OPB1250 is a cost-effective easy-to-use bit-error-rate (BER) measurement system for testing components and systems in R&D and manufacturing environments as well as field installations. It incorporates a pattern generator, clock recovery circuits, and a bit-error-ratio analyzer in one compact module that provides both electrical and optical interfaces at data rates up to 1.25Gb/s. The OptoBERT integrated system eliminates the need for additional interface modules to test devices.
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Product
Modular Breakout System 3-Pin & 20-Pin Plugin Module
95-199-004
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The 95-199-004 Plugin Breakout Module is designed to be fitted to a PXI 40-199 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
PXI Vector Component Analyzer, 100 kHz to 32 GHz
M9816AS
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The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Product
AI Inference System
MIC-741-AT
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AI Inference System Powered by NVIDIA® Jetson Thor™. Embedded with NVIDIA® Jetson T4000™ up to 1200 TFLOPS (FP4). Supports 1 x SFP28 (1 x 25GbE). Supports 2 x 1GbE, 2 x 10GbE4, 6 x USB 3.2 Gen 2, 2 x M.2 2280, 1 x M.2 Ekey (Support both WiFi AEKey), 1 x M.2 Bkey (LTE,5G).
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Product
Automated Compliance and Device Characterization Tests
N5990A
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The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Product
19” Rackmount Data Collection System
DCS-211
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- Intel Atom® x5-E3930 processor- Up to 8x DI and 6x DO with two 2A relays- 3x M12 GbE, 1x RJ-45 GbE, 2x isolated RS232/422/485, 2x USB and one lockable HDMI port- Up to 3x PCI Express mini slots with one USIM card slot each- Storage: up to 64GB eMMC 5.0, 1x 2.5” SATA drive bay
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
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The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
System Integration
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G Systems develops fully integrated systems and we know that both software and hardware are equally important to system design. Our focus on code quality and optimization ensures customers receive efficient and maintainable code. We specialize in LabVIEW development and all of our LabVIEW developers are certified developers or architects. We’re also highly skilled in mechanical and electrical hardware design and builds on a wide variety of data acquisition, signal conditioning, RF, and distributed communication platforms.
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Product
Tabletop Single Site Test Handler
3111
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The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
200 Vdc External Voltage Bias Fixture
16065A
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Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
Squeak & Rattle Sub-System And Component Testing
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At MB Dynamics, we’re proud to provide clients in a wide range of industries with quiet, custom turnkey component testing systems for combined squeak & rattle testing as well as durability testing of different components and subsystems (in 1 to 6 DOF). Test items can be excited in one or more axes to understand and characterize the physics and root causes of BSRs. Real-world, on-road vibration conditions are multi-axis simultaneous – vertical, fore-aft or longitudinal, lateral, roll, pitch, and yaw – 6 degrees of freedom or 6 DOF. Affordability drives decisions to find BSRs by exciting in one or two – fewer than 6 DOF. That has been a driving force for MB – be effective at finding BSRs with a lesser number of shakers (DOFs) and thus reduce the test equipment cost of finding BSRs. Vertical-only can be effective; sequential vertical then fore-aft then lateral is one step closer to real-world; creating vibration in four or five axes of response simultaneously is even closer; and full 6 DOF systems that are quiet come closest to duplicating in the lab the on-road conditions. MB offers all these possibilities to meet trade-offs of budget, test time, road replication, and BSR detection effectiveness.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
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Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
6TL29 Semi-Automated Test Platform
AQ377
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- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
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The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
VLSI Test System
3380
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The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
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The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Automated Test Systems
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WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
ATE Self Test Fixtures
AL663
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AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Product
H(3)TRB & HTGB Test Systems
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SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Hydrostatic Test Stand, Hydraulic System Components
9901HTX-100LR2-72x24x12
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The 6 foot wide Hydrostatic Test Stand, Hydraulic System Components is utilized for pressure testing hose and tube assemblies as well as any component requiring hydrostatic testing in the integral safety test chamber.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
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The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
BSD (Test Diagnostics)
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BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
In-Process Wafer Inspection System
7945
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Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Product
Functional Test
UTS
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The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
Test Management Software
ActivATE™
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Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
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Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Emergency Systems
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Safety and survival products which aid in on-board emergencies, aircraft evacuation, and search and rescue operations.
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Product
Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
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The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
