Discrete Semiconductor
semiconductor typically having one circuit.
-
Product
Discrete Devices Test
FTI 1000
-
The FTI 1000 tester consists of independent test channels that allow all DC and AC MOSFET parameters to be tested either separately, or in one handler insertion or prober touch-down.
-
Product
Semiconductor Thermal Transient Tester
T3Ster®
-
T3Ster (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.
-
Product
Semiconductors
-
Meets SDIO card v2.0 specificationSupports SDIO SPI, 1-bit, and 4-bit SD modesHost clock rate from 0-50 MHzSingle SDIO function interfaceSD commands processed in hardwareReset output on completion of initializationIndication of high speed and high power enabling to application logicMaximum block size supported is 1024 bytesThree I/O mode selection pinsCRC7 and CRC16 modulesSupports direct R/W (IO52) and extended R/W (IO53) commandsAPB bus interfaceParallel bus interfaceStandard 8051 split bus interfaceGeneric 8051 bus interfaceUART interface
-
Product
Hi-Speed Discrete Test System
QT-6000
-
QT-6000 Test System, with built-in capacitance test (DC+CAP) and Scanbox etc, is applicable to devices like medium & small power transistors, MOS-FET, diodes and Wafer.
-
Product
Semiconductor Authenticity Verification & Anti-Counterfeiting
JTAG Interrogator
-
Top manufacturers have used JTAG tests for years to ensure electronic systems are free from defects and assembled correctly. With growing uncertainty in supply chains and the proliferation of counterfeit components, that same technology can be used to verify the authenticity of system components.The Corelis JTAG Interrogator is an affordable solution for semiconductor verification. The software and hardware system provides the means to quickly identify components on an assembled electronic product by reading available information from the JTAG chain. Components can also be scanned to discover undocumented opcodes that may indicate hidden JTAG capabilities such as backdoors and harmful or malicious functions.Fast and nonintrusive JTAG component identification has never been so easy.
-
Product
Semiconductor Curve Tracer
CS-5000 Series
-
*Max. Peak Voltage : 5,000V（HV mode）*Max. Peak Current : 1,500A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
-
Product
Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
-
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
-
Product
68-Pin SCSI Micro-D Female Discrete Wire
40-962-068-F
SCSI Female Connector
This connector is designed to allow users to directly terminate with IDC connections to the 68-Pin SCSI Style Micro D connector. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
-
Product
ITA, G18, 18 Module With Discrete Wiring And PCB Capability
410120101
ITA
ITA, G18, 18 Module with Discrete Wiring and PCB Capability
-
Product
Semiconductor Large Range Type Tester
HS-PSTT
-
HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001～19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
-
Product
9050, 50 Module, Receiver, VXI and Discrete Wiring, Double Tier
310104248
Receiver
This 50 module receiver is rugged and designed to accommodate high I/O. With high contact point availability, the 9050 receiver is suited for larger test and measurement systems. The top tier accommodates VXI instruments and accepts VPC's interconnect adapters with the bottom tier for discrete wiring.
-
Product
Slot 0 Module Retainer Block Set, For Discrete Wiring, 1 Position
510109150
Module Retainer
These module retainer blocks are used to attach modules directly to the inner frame of a VXI receiver for discrete wiring. These modules then hinge down with the receiver to provide easy access to wiring.
-
Product
Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
-
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
-
Product
Complete Solution for Developing & Testing Discrete Voltage-Level Interfaces
M4KDiscrete Module
-
The M4KDiscrete module provides a complete solution for developing and testing discrete voltage-level interfaces. The M4KDiscrete contains control I/O registers that are memory-mapped and may be accessed in real time. The module supports twenty programmable I/O discretes that can record or control the external discretes that are connected to it. In addition, the module can record changes in the input discrete with an associated time tag via a built-in FIFO. Output discretes are open collector, capable of handling up to 32V with a maximum sink current of 100 mA each. Ordering Information:The user can set each discrete:• Either as input or output.• Either to TTL (0 – 5V) or Avionics (0 – 32V) voltage levels on inputs and• Either enable or disable external debounce on inputsThere is a 4092 Word FIFO (a string of 1023 discrete entries) containing the data and time tags.The M4KDiscrete module is supplied with C drivers, including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application.
-
Product
Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
-
Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
-
Product
ITA, 9050, 50 Module, VXI And Discrete Wiring, VDATS
410104721
ITA
Customized VDATS 9050 VXI ITA frame with 3 bearings per side.
-
Product
32-CH Discrete Input Modules with U Profile
HSL-DI32-UD
Digital Input Module
HSL U series is designed as compact & horizontal-placed slave module. For I/O module, ADLINK adopts three types of connectors to meet different users' requirements & habits. Compared with past models, U series brings compact size, easier-to-wire and cost-effective advantages for users. DI/O, AI/O and motion control module are supported
-
Product
Semiconductor Test Software Solutions
-
The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
-
Product
Semiconductor Lifecycle Management
-
Defense and space applications no longer drive the semiconductor industry. There is such a mismatch between the market life of a modern semiconductor, which can be measured in months to a couple of years, and the platform needs of defense and space platforms, measured in decades.Semiconductor Lifecycle Management (SLiM™) from Teledyne e2v HiRel Electronics solves this headache. We have many years of experience partnering with customers to save cost and lower risk when dealing with platform extensions.
-
Product
Coax, Module, Receiver, CASS, 64 Position, Discrete Wiring or Side PCB
510113121
Receiver Module
Coax, Module, Receiver, CASS, 64 Position, Discrete Wiring or Side PCB.
-
Product
Manual Semiconductor Metrology System
-
Front USB port enables easy storage of measurements and other data to flash drivesMTI Instruments’ Proprietary Capacitance Circuitry for Outstanding Accuracy and DependabilityNon-contact measurements76-300 mm diameter wafer rangeOptional wafer measurement ringsWafer stops for exact centeringEthernet interfaceFull remote control software (Windows compatible)Optional calibration wafers
-
Product
High Volume Semiconductor Substrate Interconnect Tester
GATS-2100
-
Pre-align *load *CCD camera alignment *electrical test * unload * sort of pass, opens, shorts, and alignment errors.The GATS-2100 concurrent approach provides unmatched volume capability... 2.5 seconds per device. As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies for your requirements
-
Product
Semiconductor Test Platform
PAx
-
PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.
-
Product
Semiconductor Test
-
Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
-
Product
Discrete Input Event Recorder
-
Wabtec M Series Recorders provide a compact recording solution for discrete electrical and pneumatic signals and provide compliance to FRA Crash Hardening requirements.
-
Product
Semiconductor
-
With state-of-the-art manufacturing facilities in the U.S., Europe and Asia, local sales offices throughout the world, and on-site applications support, FUJIFILM Electronic Materials is your global partner.
-
Product
Signal, Module, ID, CASS, 64 Position, Discrete Wiring
510114108
ITA Module
Signal, Module, ID, CASS, 64 Position, Discrete Wiring.
-
Product
Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
Analyzer
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
-
Product
24 Ch , Discrete I/O (0 to 60 VDC, 500 mA/Ch.)
DT1
-
The DT1 module features 24 programmable channels for either input (voltage or contact sensing with programmable, on-module pull-up/pull down current sources), or output (current source, sink, or push-pull) up to 500 mA per channel from an applied, external 3 – 60 VCC source. These modules can sense broken input connections and whether an input is shorted to +VCC or to ground.
-
Product
Semiconductor Functional Verification Tools
Trek5
-
Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
