Showing results: 1 - 3 of 3 items found.
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FTI 5000 -
Focused Test, Inc.
FTI 5000 performs Safe Operating Area (SOA) tests on power devices, such as MOSFET, Bipolar Transistor (BJT), Thyristor and IGBT. The SOA test is defined as the voltage and current conditions over which the device is expected to operate without damage.
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FTI 3000 -
Focused Test, Inc.
FTI 3000 performs Burn-In and Test of Zener diodes and conforms to MIL STD 750 specifications. The system tests multiple Zener diodes serially for an extended burn-in time and periodically monitors the Vf of the diodes. The burn-in power is provided by controlling the Ir of each diode string and no external heating of the diodes is needed.
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FTI 1000 -
Focused Test, Inc.
The FTI 1000 tester consists of independent test channels that allow all DC and AC MOSFET parameters to be tested either separately, or in one handler insertion or prober touch-down.