Manual Semiconductor Metrology System

Manual Semiconductor Metrology System

Front USB port enables easy storage of measurements and other data to flash drives
MTI Instruments’ Proprietary Capacitance Circuitry for Outstanding Accuracy and Dependability
Non-contact measurements
76-300 mm diameter wafer range
Optional wafer measurement rings
Wafer stops for exact centering
Ethernet interface
Full remote control software (Windows compatible)
Optional calibration wafers

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