Gigabit Ethernet Test
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Product
Dual Channel Gigabit Ethernet Test & Simulation Instrument for XMC
XMC-DCE
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Avionics Interface Technologies
Dual channel, high precision Ethernet Test Instrument
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Product
Dual Channel Gigabit Ethernet Test & Simulation Instrument for PCI Express
PCIe-DCE
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Avionics Interface Technologies
Dual channel, high precision Ethernet Test Instrument
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Product
Dual Channel Gigabit Ethernet Test & Simulation Instrument for PXI Express
PXIe-DCE
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Avionics Interface Technologies
Supports 10/100/1000 Mbit/s Full Duplex EthernetUtilizes SFPs to support both Copper and Optical interfacesUser controlled Ethernet frame transmissions with high precision timing and scheduling
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Product
10 Gigabit Ethernet Test & Simulation Instrument for PXI Express
PXIe-10GE
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Avionics Interface Technologies
Supports 10G and 1G Full Duplex Ethernet2 Network Interfaces (future expansion to 4 network interfaces)User controlled Ethernet frame transmissions with high precision timing and scheduling
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Product
GAOTek Handheld Gigabit Ethernet Test Module
A0070008tek
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GAOTek Handheld Gigabit Ethernet test module is a highly efficient test instrument which designed for Ethernet layout and integration tests which conforms to Ethernet test standards. This instrument is required for testing from physical layer to service layer of emerging (or next generation) networks. The Ethernet tester is the new Ethernet tester to qualify Ethernet service over LAN and RAN deployment. This is a highly efficient test instrument for service providers to ensure SLA KPIs with the subscribers.
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Product
Test Management Software
ActivATE™
test
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
8-Ports Gigabit Ethernet RCV Interface
YAV90058C
Ethernet Interface
8x RJ45 LAN connectors to VPC RCV 192 pins module
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Product
3U CompactPCI Serial 4-Port USB 3.2/2-Port Ethernet Card
cPCI-A3USB
Ethernet Interface
- Follow PICMG® CompactPCI® Serial design guide- CompactPCI® Serial, 3U 4HP- 4x USB3.2 Gen 1 ports and 2x RJ45 2.5G LAN ports in front panel- 1x USB2.0 port on board- Operating temperature: -40°C to +85°C- Designed to meet EN50155 standards
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Product
PXI Ethernet Interface Module
Ethernet Interface
PXI Ethernet Interface Modules equip PXI systems with high-bandwidth Ethernet-based connectivity with up to 40 Gb/s data rates per port. Featuring compatibility with industry-standard network and automatic cable polarity detection, these modules are ideal for high-performance data transfer and vision applications on the PXI platform. These modules have independent bandwidth to support two GigE Vision cameras with Power over Ethernet (PoE).
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Product
8-Pin M12 Male To 8-Pin RJ50 Male (Right-Angle), Shielded, FieldDAQ M12 Ethernet Cable
786171-03
Ethernet Cable
IP67 Gigabit Ethernet, Shielded X-Code M12 Male to RJ45 (Right Angle), 3M for FieldDAQ
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Product
8-Pin M12 Male To 8-Pin RJ50 Male, Shielded, FieldDAQ M12 Ethernet Cable
785944-01
Ethernet Cable
IP67 Gigabit Ethernet, Shielded X-Code M12 Male to RJ45 (Straight), 1M for FieldDAQ
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
3-Pin B2CF Omnimate Male to Pigtail, Unshielded Automotive Ethernet Cable
787108-01
Ethernet Cable
Cable, 3POS B2CF Omnimate To Pigtail, Automotive Ethernet, Unshielded, 1m
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Product
RJ45 (Ethernet 100 Base T) to 90 Series Interface (R)
J90RJ45R
Ethernet Interface
RJ45 Ethernet connector for VPC Tripaddle 90 series RCV moduleUp to three connectors per moduleFor Cat 5 Fast Ethernet cable IEEE 802.3 standard100 Base-T
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Product
Automotive Test Solutions
test
The testing and simulation systems from this division are used primarily in the automotive and automotive supplier industry. These are, for example, modular function-testing systems and diagnostic tools for automotive ECUs or bus communication systems for a wide variety of electronic components in automotive production. Electromechanical assemblies and entire car seats are also tested to ensure they function
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Product
Functional Test System
TS-5040
Functional Test
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Cable Free ATE
CABLEFREEATE
test
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
In-Circuit Test Systems For Sale
Test System
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Product
4FE+1FE ST Multi-Mode Unmanaged Ethernet Switch
ADAM-6521/ST
Ethernet Switch Module
Provides 4 x 10/100 Mbps Ethernet ports with RJ-45 connector and 1 x 100 Mbps multi/single-mode fiber port with ST connector, Supports full/half duplex flow control, Supports Integrated Loop-up engine.
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Product
8-Thermocouple IoT Modbus/SNMP/MQTT Ethernet Remote I/O
ADAM-6018+
Ethernet I/O Module
8ch thermocoupleProtocols:MQTT(TLS),SNMP,Modbus TCP,RESTful API,ASCIIGCL to perform basic logic control rulesPeer-to-Peer function to map I/O statusWatchdog timer to recover the systemBuilt-in web server
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Product
Functional Test Fixtures
Test Fixture
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
