Gigabit Ethernet Test
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Product
Dual Channel Gigabit Ethernet Test & Simulation Instrument for XMC
XMC-DCE
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Avionics Interface Technologies
Dual channel, high precision Ethernet Test Instrument
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Product
Dual Channel Gigabit Ethernet Test & Simulation Instrument for PXI Express
PXIe-DCE
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Avionics Interface Technologies
Supports 10/100/1000 Mbit/s Full Duplex EthernetUtilizes SFPs to support both Copper and Optical interfacesUser controlled Ethernet frame transmissions with high precision timing and scheduling
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Product
Dual Channel Gigabit Ethernet Test & Simulation Instrument for PCI Express
PCIe-DCE
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Avionics Interface Technologies
Dual channel, high precision Ethernet Test Instrument
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Product
10 Gigabit Ethernet Test & Simulation Instrument for PXI Express
PXIe-10GE
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Avionics Interface Technologies
Supports 10G and 1G Full Duplex Ethernet2 Network Interfaces (future expansion to 4 network interfaces)User controlled Ethernet frame transmissions with high precision timing and scheduling
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Product
L2-7 10GbE Test Solutions
NGY 10GE SFP+ and 10G BASE-T Load Modules
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Keysight Network Applications and Security
Ixia's 10 Gigabit Ethernet LSM10GXM test load modules delivers an industry-leading, high-density, affordable layer 2 through 7, 10 Gigabit Ethernet IP test solution. The NGY family supports both low port count layer 2/3 applications with limited project budgets and highest density test lab, QA, and system test applications. NGY is perfect for both converged data center infrastructure testing and 10GbE switch test beds. NGY load modules leverage Ixia's converged data center test applications to offer the high port scalability, virtual scalability, protocol coverage, with an affordable test solution for data communications testing.
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Product
GAOTek Handheld Gigabit Ethernet Test Module
A0070008tek
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GAOTek Handheld Gigabit Ethernet test module is a highly efficient test instrument which designed for Ethernet layout and integration tests which conforms to Ethernet test standards. This instrument is required for testing from physical layer to service layer of emerging (or next generation) networks. The Ethernet tester is the new Ethernet tester to qualify Ethernet service over LAN and RAN deployment. This is a highly efficient test instrument for service providers to ensure SLA KPIs with the subscribers.
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
E1 Ethernet cable, twisted pair 10m
182219-10
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8-Pin Male Ethernet to 8-Pin Male Ethernet, CAT-5E Ethernet Cable - The 8M-8M Ethernet Cable connects devices to network hubs or switches. The cable has straight-through wiring and is available in different lengths and thin profile options.
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Product
Test Workflow Standard
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Automated Aerospace and Defense Test
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Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Interactive Benchtop Test
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Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
8-Ports Gigabit Ethernet ITA Interface
YAV90058A
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8 RJ45 LAN connectors to VPC ITA 192 pins module
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Product
Ethernet Module
M4K-ETH
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The M4K-ETH is an intelligent Gigabit Ethernet interface module for the multiprotocol Excalibur 4000 family of carrier boards. The module supports 10Mhz, 100Mhz and 1Ghz Full Duplex UDP/IP Ethernet.
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Product
10 Gbit Ethernet Card, PXIe Form Factor
ADQ10GBE
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The ADQ10GBE module enables fast network connection from a cPCIe/PXIe chassis to an external host computer. It occupies a single slot in an 3U cPCIe/PXIe chassis and can be used with backplanes supporting up to x8 Gen2 PCIe. All necessary software drivers are included and can be installed on the PXIe controller. ADQ10GBE can be used under Windows 7 (32 or 64 bit), Windows 8 and 8.1, and Linux (native support or ixgbe source code).
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Product
NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Cable Free ATE
CABLEFREEATE
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Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
NI Real-Time Test Cell Reference System
778820-35
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DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
8FE Unmanaged Ethernet Switch, -40~75℃
EKI-2528DI
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Provides 8-port Fast Ethernet ports with Auto MDI/MDI-X, Supports 10/100 Mbps Auto-Negotiation. Provides compact size with DIN-rail/Wall mount, and IP30 metal mechanism, Supports redundant 12 ~ 48 VDC power input and P-Fail relay, EKI-2528DI supports wide operating temperatures from -40 to 75°C.
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Product
EN50155 Managed Ethernet Switch
EKI-9512G-4GMW
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8 x M12 X-Coded 10/100/1000 Mbps ports + 4 x M12 X-Coded 10/100/1000 Mbps Bypass ports, Complies with EN50155 & EN50121-3-2, Operating temperature: -40 ~ 75°C. Operating power input range: 16.8~137.5VDC, Supports X-Ring Pro for rapid and predictable convergence.
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Product
Automotive Ethernet Interface Device
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The Automotive Ethernet Interface Device converts unshielded twisted pair (UTP) Automotive Ethernet to standard Ethernet. This device is ideal for developing applications that require Automotive Ethernet to test and validate automotive electronic control units (ECUs). It includes ports for Automotive Ethernet connections and ports for 100BASE-TX Ethernet connections. You can use switches on the front panel to configure each 100BASE-T1 port as master or slave. The device also provides LED on the front panel so that you can monitor the linkage and activity on the various ports.
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Product
8FE + 2FE/GE SFP Port Managed Industrial Ethernet Switch
EKI-5710E-2FI
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Redundancy: X-Ring Pro (ultra-high-speed recovery time, <20 ms), RSTP/STP (802.1w/1D), IXM function for fast deployment, Security Pack with 802.1X, ACL, RADIUS, TACACS+, MAB Authentication, SNMPv3, HTTPS, SSH, and SFTP. Management: SNMP v1/v2c/v3, WEB, Telnet, standard MIB, private MIB, Supports NMS for easy and visualized to monitor and manage network remotely.
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Product
Imperial Test Executive
ITE
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The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
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The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
Wireless Device Test
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New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Seno-Con Test System
PANTHER 2K QST
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Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
PXIe-8245, 4-Port, 10/100/1000BASE-T PXI Ethernet Interface Module
787313-01
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The PXIe-8245 supports Ethernet-based communication between PXI hardware and external instruments and devices. This PXI Ethernet Interface Module includes four RJ45 10/100/1000BASE-T Ethernet interface ports in a single-slot PXI Express module.
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Product
Test Fixture (SMD Components)
16034E
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Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
