Defect
other than specified, imperfection .
-
Product
Wafer Defect observing instrument
HS-WDI
-
Application■Semiconductor wafer■Solar wafer■Solar Cell■Thin-film Cell
-
Product
Wafer & Die Inspection
-
SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
-
Product
Scanning Electron Microscope
E5620
-
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
-
Product
PXI Fault Insertion Insertion Switch Modules
-
Our PXI Fault Insertion Insertion Switch Modules feature a breakout arrangement that allows faults to be attached to the sensor lines, this includes the breaking of a connection or the adding of defect – all of which can simulate connectivity problems in the system.
-
Product
High-precision Surface Inspection for Wind Turbine Blades
waveCHECK™
-
8tree's waveCHECK is a handheld-portable 3D-inspection tool for inspecting wind turbine blades in manufacturing and operation. Its efficient detection of surface defects and instant visual feedback revolutionize surface inspection.It can detect wrinkles, steps, gaps, rain erosion and any other surface damage.
-
Product
Holiday Detector
VHD
-
Veer Electronics Make Holiday Detector is Capable to Detect Any Pinhole or Defects .In Anticorrosive Coating on Metallic Pipes/Surfaces. The Pipe is connected to Earth and Electrode Charged to High Tension is moved over Coating. If Any Pinhole or Defective Point is detected on Coating High Voltage Spark Occurs on Pipe or Surface of Testing. At the Same time Electronic Buzzer also gives Audio Indication and Fault LED glows as Visual Indication of Fault.
-
Product
Full 3D Inline Metrological & Imaging AOI
-
Metrological Full 3D AOI is achieved by measuring all 3 dimensions (X, Y and Height) to detect every measurable solder and component defect pre-reflow and/or post reflow soldering.
-
Product
G3 System
Dragonfly
-
Unique 2D imaging technology provides fast, reliable inspection for sub-micron defects to meet today's R&D needs and tomorrow's production demands. Onto Innovation's patented Truebump® Technology combines multiple 3D metrology techniques to deliver accurate 100% bump height metrology and coplanarity.
-
Product
Automated Visual Quality Control System for Lid Assembly
Angara-form
-
The automated visual inspection system is designed to identify and reject covers that have defects that have arisen during industrial production, as well as visible defects in the form of black dots or dirt on the surface of the cover.
-
Product
Defect Review Station Software for electrical test
Faultstation
-
Centralize all error review for your different testers in a single seat! To capture PCB layout information, FaultStation offers the choice of DPF or IPC input. In combination with a Ucamco data-prep seat, DPF is the obvious choice, while industry standard IPC provides a doorway to all other data-prep systems in today’s marketplace. Once the layout data is available, you combine it with the error information from a variety of different models and makes of testers.
-
Product
Static Analyzer
Julia
-
Julia Static Analyzer is best in class for finding defects and security vulnerabilies in C#, Java and Android applications (for C and C++ languages, please have a look to GrammaTech CodeSonar). By using Julia Static Analyzer, you reduce development and maintenance costs and eliminate risks related to security vulnerabilities and privacy leaks. The powerful analysis technology ensures a maximum precision of results. With advanced dashboarding you can flexibly transform the data into useful information for the different stakeholders.
-
Product
Armature Tester
-
Qingdao AIP Intelligent Instruments Co., Ltd
This tester is suitable for online or offline detection of various armature electrical properties, such as power tool motors, garden tools, vacuum cleaner motors, small household appliance motors, automobile motors, fitness equipment motors, permanent magnet micro-motors, etc. The tooling of the tester meets the requirements of arbitrary placement of the armature, and can automatically and accurately sort/track faulty solder joints; the equipment startup methods include buttons, remote control, and sliding cover; it meets the armature test of special processes such as double insulation, and automatically identifies solder joints, winding short circuit/open circuit , winding errors, poor welding and other problems; the tester can also automatically count the number of tests, the number of defectives and other data, which is convenient for quality management analysis.The tester test items mainly include:bar-to-bar resistance, diagonal resistance, welding resistance, insulation resistance, ac hi-pot, surge.
-
Product
Precision Impedance Analyzer (10Hz to 130MHz)
ST2851
-
ST2851 series precision impedance analyzer is a new generation impedance test instrument by adopting the current international advanced automatic balance bridge principle. It is based on Windows10 operating system, which realizes a fully computerized operation interface, making the measurement more intelligent and easier.ST2851 series impedance analyzer surpasses the 120MHz frequency bottleneck of similar foreign instruments, and solves the defect that it can only be analyzed but cannot be tested independently. At the same time, it adopts two interfaces of single test and analysis to make the test easier.
-
Product
Cross Sections and Metallography
-
Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
-
Product
1μΩ-4kΩ AC Milliohmmeter Low Resistance Tester
TH2521
-
Shenzhen Chuangxin Instruments Co., Ltd.
TH2521 AC Milliohmmeter is a high-performance and intelligent tester widely used to test contact resistance, internal resistance and battery voltage. The application of constant current source with 1kHz frequency can greatly eliminate the potential error caused by thermoelectricity on DUT. This meter has the function to automatically detect contact failures on test cable. At the range of 30mΩ, basic R resolution can reach 1μΩ. It is applicable for transformer, inductance coil copper resistance, relay contact resistance, switch, connector contact resistance, wire resistance, PCB line and via reistance dan metal defect detection, etc. In the mean time, signals, such as HIGH, LOW, PASS, can be output through HANDLER interface, thus it is very convenient to be used in automatic production line.
-
Product
PoE Transient Test Meter
Trans-Guard 910016
-
GrayStone Automation's innovative DCVBD voltage breakdown meter measures the breakdown voltage of many lightning protection devices and components to identify transient protection devices that may be damaged or defective and help prevent costly transient damage to critical and expensive equipment.
-
Product
Atomic Force Microscope
HDM Series
-
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
-
Product
Halt Hass Chambers
-
HALT and HASS chambers from WEIBER provide extreme temperature & vibration capabilities used during the product design and manufacturing cycles to compress the time normally required to identify design and process weaknesses. HALT techniques are important in uncovering many of the weak links inherent to the design and fabrication process of a new product. HASS techniques are incorporated during the production phase to find manufacturing process defects that could cause product failures in the field.
-
Product
AutoGet auto Focus Portable Fiber Endface Inspector
CA3008
-
CA3008 Autoget is an intelligent portable fiber enface inspector. with newest hardware and software, and with functions of auto focus, auto exposure,auto analysis, autogenerate report, auto image transmission, etc. Autoget can clearly find out the defects of fiber endface, such dirts, scratches.
-
Product
ECHO VS System with Image Enhancement
Echo VS
-
The ECHO VS system adds our Image Enhancement Suite to the ECHO platform to provide industry-leading image quality and defect identification capabilities. It’s our most accurate ultrasonic NDT equipment for development labs and for production environments that require the highest precision. The Echo system can be fitted with an optional chuck for manual wafer inspection.
-
Product
Electronic Inspection Systems
-
Intego's knowhow even makes it possible to identify challenging defects that may be located under the surface. One system is the inspection of chips by means of lock-in thermography, which visually represents the IR radiation intensity signal of electronics. Special lasers and flash lamps generate a very short heat impulse (10 ms) on the chip, which generates a measurable heat flow. In most cases, a resolution of < 1 μm can be achieved.
-
Product
Ultrasonic Optical Flaw Detector
MIV-X
-
Thanks to Shimadzu’s proprietary light imagining technique, which combines an ultrasonic oscillator with a stroboscope, defects near the surface of a material, including peeling of the bonding and adhesive surfaces of heterogeneous materials, as well as paint, thermal sprays, and coatings can be inspected easily and non-destructively.
-
Product
Defect Isolation
-
*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB
-
Product
Battery Boxes Testing Equipment
-
Battery boxes can be tested for faults by placing the box on a metal plate. By applying a test voltage to an electrode inside the box, the moulding can be checked thoroughly - particularly at the injection points - and any faults found. Defects will be identified by a spark passing from the electrode, through the defect itself, to earth (the conductive material placed outside the battery box.
-
Product
Multi-Layer Analysis for Next Generation PONs
Multi-ONU Emulator
-
The NG-PON Xpert multi-layer analyzer is a unique, real-time protocol analyzer for XG-PON1, NG-PON2 and XGS-PON networks and products. The Multi-ONU Emulator introduces a new revolutionary approach for comprehensive testing of an OLT. It enhances the testing with repeatable test scenarios and functionalities that cannot be tested in any other way, including the OLT's ability to handle various ONU models and configurations, error and defect conditions, alarms and traffic loads.
-
Product
Composite Damage Checker
35RDC
-
The handheld 35RDC is a simple Go/No-Go ultrasonic instrument designed to detect subsurface defects caused by impact damage on solid laminate aircraft composite structures. The 35RDC features a backlit LCD that displays the word GOOD if no subsurface damage is found or the word BAD when it detects subsurface damage.
-
Product
Probecard testers
MANAGER
-
Today more complex probe cards are being used. More pins,higher density and larger array requires a new approach inprobe card analysis. With the soaring cost of new generationprobe cards, repair of defective cards becomes an necessity.BE Precision Technology offers all capabilities with the newMANAGER V. Future proof, up to 450 mm full wafer contactprobe cards can be analyzed with up to 88.000 test channels.High-end materials are used to stand extra tough requirements—such as 500 mm diameter diamante viewing window,ultra stiff carbon flip-table, high power Z–stage to generate 600Kg of contact force
-
Product
Inductive Heat Flux Thermography
DEFECTOVISION IR Product Family
-
Foerster Instruments, Incorporated
The DEFECTOVISION IR system is an addition to FOERSTER's core competence, the non-destructive testing of semi-finished metal products. All around the world, more than 6.5 million tons of steel have been tested safely and efficiently by now with our latest technology.
-
Product
Flaw Detectors
-
Flaw detectors are essential for ensuring the safety and quality of industrial products. They accurately identify defects such as cracks, voids, and inclusions without damaging the materials. Ultrasonic testing is particularly notable for its precision and versatility among the various non-destructive testing methods.
-
Product
Vacuum Discharge Test Equipment
DAC-VD-1
-
DAC-VD-1 can locate defective points such as scars or pinholes on stator coils and wires easily.By applying voltage in a vacuum chamber, the electric arcing from a defective part can be discoveredvisually in a short time. DAC-VD-1 can be used widely in variety of applications from product developments to outgoing inspections.
