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Product
Needle Microprobe
MT-23/8HT
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Fast-response 23 gauge needle probe, (needle length is 8 cm) for instant readings in tissue, semisolids, liquids. Also for very small specimens, powders and materials. Needle tip is sealed to ensure only stainless steel contacts specimen. Max. temp. 200°C. 5 ft. lead. Smallest microprobes give fastest reading. Short probes are easier to insert and last longer. Type #'s indicate needle gauge and needle length in cm.
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Product
Probe “Socket” Clamps
LCP-S12
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A simple and cost-effective option for mounting Small-aperture Probes in the probe plate. A Socket Clamp tool is needed for insertion and removal of the clamp in the probe plate
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Product
Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74T80-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
CamTrac Z-Axis Test Fixture Kits
CT Serie
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The CT Series Mechanical Kits, utilizing the patented CAM mechanism1, offset the same precision linear motion. The 'Z' axis motion is ideal for a larger point count mechanical test applications.The CT Series features a hinged 3/8" FR4 probe board, tooling holes for precision alignment, removable sides, precision shafts and cam slide block assemblies, and a pan latch assembly.
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Product
RTD Thermometer
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Tel-Tru® Manufacturing Company
Tel-Tru RTD probe assemblies and RTDs integrated with a compact transmitter are designed for precision temperature measurement in demanding sanitary or industrial environments. RTDs are configurable with many options to meet the needs of dairy, beverage, food, pharmaceutical and chemical processing applications.
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Product
Proximity
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Our revolutionary Digital Proximity System (DPS) eliminates the need for dozens of different drivers and transmitters by a single, field-configurable package that can be set to work with probes and cables from a variety of manufacturers. The DPS consists of a probe, an extension cable, and a driver or transmitter.
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Product
DH Series QuickLink Adapter Kit with 3 x QL-SI Tips
DH-QL-3SI
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Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Product
Probe Card Analyzers
PB1500
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The PB1500 is a low cost probe card analyzer system. It has the capability to perform all the tests done on the larger PB3600/6500 probe card analyzers, but at a lower cost for low pincount cards. A maximum of 1,280 channels may be configured in the PB1500 MUX system. The Precision Measurement Unit (PMU) has the same accuracy, repeatability and range as the larger analyzers. The repair process consists of selecting a failing probe, which moves it under the binocular microscope and positions a crosshair over the correct position for that probe.
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Product
HandyScope HS6-DIFF With EMI, SureConnect & SafeGround: 1 GS/s, 250MHz BW, 4 Channel (256MS/ch), USB Differential Digital Storage Oscilloscope, Spectrum Analyzer, Voltmeter, Transient Recorder
HS6-DIFF-1000XMEGS-W
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The powerful capabilities of the WiFiScope HS6-DIFF-1000XMEGS EMI analyzer give the user the possibility to quickly perform a good EMI compliance test. With this cost effective test, time and money are saved by avoiding extra visits to expensive EMC testing facilities. The supplied EMI probe set TP-EMI-HS6 contains three magnetic field (H field) probes and one electric field (E field) probe. The tripod ensures that the probes can be positioned properly at the object under test.
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Product
Clamp Meters
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Is an electrical test tool that combines a basic digital multimeter with a current sensor. Clamps measure current. Probes measure voltage.
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Product
Kelvin Clip Set
11062A
Accessory Kit
Create custom Kelvin probes for 4-wire resistance measurements; set contains only the two gold-plated clips
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Product
PocketLab Thermo
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To compare is to understand. Let this simplified two-temperature probe solution turn your next science lesson into an exploration. Thermo is a dual temperature sensor that includes two thermistor probes with simultaneous measurement capabilities.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 0.79 (23.40) - 1.75 (49.60) General Purpose Probe
HPA-40A
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 35Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 660Overall Length (mm): 16.76
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Product
LXI WTB Probe, Terminated
60-981-002
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The 60-981 LXI Wired Trigger Probe provides a simple method of monitoring the LXI Wired Trigger Bus activity. It provides a through line active probe that can be used to non-intrusively monitor the waveforms of the M-LVDS drivers on all 8 channels. Each channel has two single ended outputs from the differential pair that can be subtracted by an oscilloscope to display each driver output and the differential signal.
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Product
Vacuum Probing Systems
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Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
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Product
High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1I15-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Digital Eddy Current Displacement Sensor
ZET 7140-S
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A digital eddy current sensor consists of a primary transducer (eddy current probe) and the ZET 7140-S measuring unit.
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Product
ElcoMaster Oven Profiling Software
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*Oven Logger set up & programming*Paint/Powder parameter library*Product probe maps*Fully customisable inspection templates*Selectable probe/channel traces*Statistical analysis by probe/channel*Max, Min, standard deviation, coefficient of variation*Temperature profile, cure progress, histogram & individual cure value graphs against product*Time at temperature, time of peak difference*Time above maximum absolute & minimum cross link temperatures*Fully customisable inspection reports*Combined reports - coating thickness, gloss, adhesion, profile, climate, surface cleanliness*Report generator wizard & PDF generator*Email or export data*Import photo’s, data sheets, critical data, inspection notes, etc & include on inspection reports*Cloud computing - allows for cross site collaboration, including internal text messaging tool*Overlay temperature profiles, review and compare multiple oven profiles over time*Use additional data loggers for multiple channels or run overlays
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Product
Wide Measurement Range Model Of Semi-automatic 4 Point Probe Sheet Resistance/resistivity Measurement
RT-3000/RG-2000 (RG-3000)
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*User programable measurement pattern & programmable measuring pattern*Tester self-test function, wide measuring range*Thickness, edge, temperature correction for silicon wafer*Film thickness conversion function from sheet resistance*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)
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Product
Logic Analyzer Probe
FS2521
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The FS2521 is a logic analyzer probe used to test DDR4 SO-DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4164A logic analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR4 SO-DIMMs. Now qualified at 3200MT/s
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Product
PCIe Carrier For PMC And PrPMC
PCI104
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The PCI104 is a PCIe carrier for PCI Mezzanine Cards (PMC) or Processor PCI Mezzanine Cards (PrPMC). The PCI104 carrier allows simplified testing of PMC/PrPMCs and their associated PMC I/O Modules (PIMs) by using a PC environment during board development or deployment. The PCI104 can also reduce the costs of manufacturing PMC/PrPMCs by allowing manufacturers to use off-the-shelf PCs for functional testing. The PCI104 converts the PCIe x4 edge connection to PCI-X via a PCIe to PCI-X bridge. The trace lengths to the PMC/PrPMCare kept to a minimum so the PMC/PrPMC can run with a133MHz PCI-X clock speed. The J4 connector of the installed PMC/PrPMC is routed to a 96-pin DIN connector per theVITA-35 specification. The PCIe to PCI-X bridge can run in either transparent or non-transparent mode and can also operate in forward or reverse mode. The PCI104 has a fan mounted on the board to cool the PMC/PrPMC. The fan can easily be removed for testing and probing of hosted card.
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Product
NI-9231 and cDAQ-9171 USB Sound and Vibration Measurement Bundle
865665-01
Sound and Vibration
NI-9231 and cDAQ-9171 USB Sound and Vibration Measurement Bundle - The USB Sound and Vibration Measurement Bundle with NI-9231 and cDAQ-9171 includes the NI-9231 C Series Sound and Vibration Input Module and the cDAQ-9171 CompactDAQ Chassis for sound and vibrations measurements. This bundle provides a portable, USB-based sensor measurement system that helps you measure signals from integrated electronic piezoelectric (IEPE) and non IEPE sensors such as accelerometers, tachometers, and proximity probes. The included NI-9234 features 8 channels with built-in anti-aliasing filters that automatically adjust to your sample rate. Additionally, the bundle supports simultaneous sampling and high dynamic range measurements necessary for modern measurement microphones and accelerometers.
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Product
Differential Voltage Probes
DP150/DP200pro
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The DP differential isolation probes are an important accessory for any laboratory involved in power electronics and high voltage systems. These probes allow isolated and floating measurements with any oscilloscope or data recorder, whilst the oscilloscope can remain grounded. Using a DP150 or DP200pro probe, differential and floating measurements can be made on a variety of ac power systems like 230V/110V ac input power supplies, chopped and switching power supplies, thyristor controllers, variable speed motor drives (PWM signals), motor inrush current and measurement across current shunts. The isolated input is made via two 4mm/banana safety sockets. The BNC output allows easy connection to an oscilloscope. The DP probes can be powered from a 9V battery or external power supply.
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2L-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Probes & Test Leads
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The Di-LOG range to test leads are designed and manufactured to the highest quality and meet all safety standard as stipulated in BS EN 61010
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Product
CUSTOM Sensors
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Over half of our orders are customized. Custom systems include simple calibrated range changes, vacuum compatability, mechanical probe changes, unique driver electronics, unusual calibrations, and completely new designs for inclusion in OEM products.
