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Product
MPI Manual Probe Systems
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MPI Advanced Semiconductor Test
manual probe systems are open, easy to use and cost effective yet highly accurate. These systems are designed for precision analysis of substrates and wafers up to 150, 200 and 300mm.
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Product
SA1000X, 1 GHz, ±8 V, 10X Attenuation, Single-Ended Active Oscilloscope Probe
784255-01
Oscilloscope Probe
1 GHz, ±8 V, 10X Attenuation, Single-Ended Active Oscilloscope Probe - The SA1000X is single-ended, active voltage probe that is used for many different high-speed measurement applications. The probe is powered by an included auxiliary power supply that is internationally compatible and certified. You can use it with oscilloscopes that provide 50 Ω input impedance.
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Product
Wireless Moisture Monitors Data Loggers
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Lignomat’s monitoring systems can measure:*wood moisture, bamboo, gypsum, sheetrock, solid materials*relative humidity and temperature, DPT, GPP, EMC*EMC*concrete moisture using in-situ RH probes ASTM F 2170*Surface and interior temperature https://www.lignomatusa.com/wp-content/uploads/2015/02/wireless-moisture-data-logger.jpg
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Product
Tire Pyrometers
52-50690
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Longacre Racing Products, Inc.
Computes tire temp averages for temps just taken, recalled from memory, or you can even manually enter temps taken previously to compute averages. Advanced electronics stabilize your readings quickly giving you accurate, consistent results. Pyrometer comes with a built-in night light with auto shutoff, fast response coiled cord adjustable tire probe, and carrying case. It also features a built-in four car stopwatch with 75 lap memory for all 4 cars.
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Product
MANIA TEST PROBE
SERIES 76
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ElectricalMAXIMUM CURRENT: 3 amps continuousat working travel, non - inductiveRESISTANCE: At 35 mA test current,50 mOHMS meanMaterial and FinishesPLUNGER: Heat treated berylliumcopper, FINISH: -2E / -2P Hard nickel plated-2D / -2E138 24 Kt gold plated,BARREL: Phosphor bronze, nickel platedSPRING: Stainless steel, silver platedPIN: Music wire, hard nickel plated
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Product
AirTech Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Hillger NDT has developed AirTech testing technology for the requirements of air-coupled testing. Our USPC 4000 AirTech ultrasonic testing system and our robust AirTech sensors consisting of optimized transmit and receive probes deliver optimal results under demanding conditions.
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Product
CP-2XX-4 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 39Full Travel (mm): 1.00Recommended Travel (mil): 30Recommended Travel (mm): 0.75Overall Length (mil): 158Overall Length (mm): 4.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
NI-9230, 3-Channel, 12.8 kS/s/channel, ±30 V, C Series Sound and Vibration Input Module
783824-02
Sound and Vibration
3-Channel, 12.8 kS/s/channel, ±30 V, C Series Sound and Vibration Input Module - The NI‑9230 can measure signals from integrated electronic piezoelectric (IEPE) and non‑IEPE sensors such as accelerometers, tachometers, and proximity probes. The NI‑9230 is also compatible with smart TEDS sensors. The NI‑9230 incorporates software-selectable AC/DC coupling, IEPE open/short detection, and IEPE signal conditioning. The input channels simultaneously measure signals. Each channel also has built-in anti-aliasing filters that automatically adjust to your sample rate. When used with NI software, this module provides processing functionality for condition monitoring such as frequency analysis and order tracking.
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Product
SMA Rotary Attenuator
WATT-6SR1211
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Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Product
Traversing Probe
TP 1000-20
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Advanced Thermal Solutions, Inc.
The TP 1000-20 is a stainless steel traversing probe designed for measuring air velocity and temperature. The probe is used to obtain velocity and temperature profiles at different locations in the same plane. The small sensor has a high rate of response, making it ideal for high-speed flow measurement. The sensor requires support for traversing.
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Product
Standard 1.00 (28.00) - 1.80 (51.00) General Purpose Probe
P2662BG-1Q1S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 68Full Travel (mm): 1.73Recommended Travel (mil): 50Recommended Travel (mm): 1.27Overall Length (mil): 575Overall Length (mm): 14.60
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Product
Radiometric Probe for UVB Irradiance
LPUVB03BLAV
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The LPUVB03BLAV probe measures global irradiance (W/m²) on a surface area (m²) in the UVB (280 nm…315 nm) spectral region. In particular, the spectral sensitivity is focused at 305 nm, with a bandwidth (FWHM) of 5 nm. The global irradiance is the result of the sum of direct solar irradiance and of diffused irradiance incident on a planar surface.
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Product
Alternate 2.65 (75.00) - 6.50 (184.00) Bead Probe
BTP-25C-6.5
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Thermocouple Thermometer – 2 Inputs – Data Logger
HD2128.2
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Thermocouple thermometer for probes type K, J, T, R, N, S, B, E, two inputs.
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Product
Precise 3D Profilometry
µscan
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Using the NanoFocus µscan technology, you can measure up to 100 times faster than with conventional probe systems. Various µscan sensors are available for the different application areas. The optical profilometers of the µscan series are suitable for the fast scanning of surface profiles with precision in the low nanometer range.
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Product
P2662B General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 68Full Travel (mm): 1.73Recommended Travel (mil): 50Recommended Travel (mm): 1.27Overall Length (mil): 575Overall Length (mm): 14.60
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Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Product
Microwave Testing
1100B
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The Model 1100B Picoprobe sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics.
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Product
HPA-0 General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Probe Card Solutions
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Advanced engineering solutions are required to meet increasing challenges for wafer test, driven by today’s rapid technology acceleration. Translarity offers probe card solutions for the global semiconductor and packaging test industries, tailored to customer specifications. The company’s IP portfolio, design capabilities, innovative products, and reputation for quality, reliability and customer support ensure the right solution for your testing requirements.
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Product
1 GHz, 1 MΩ, 0.9 pF Active Probe
ZS1000
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Engineers must commonly probe high frequency signals with high signal fidelity. Typical passive probes with high input R and C provide good response at lower frequencies, but inappropriately load the circuit, and distort signals, at higher frequencies. The ZS Series features both high input R (1 MΩ) and low input C (0.9 pF) to reduce circuit Loading across the entire probe/oscilloscope bandwidth. The ZS1000 is ideal for 200–600 MHz oscilloscopes.
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Product
Photometric Probes for Illuminance
LPPHOT03… Series
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The probe LPPHOT03 measures illuminance (lux), defined as the ratio between the luminous flux (lumen) passing through a surface and the surface area (m²). The spectral response curve of a photometric probe is similar to the human eye curve, known as standard photopic curve V(λ). The difference in spectral response between LPPHOT03 and the standard photopic curve V(λ) is calculated by means of the error f’1.
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Product
Zero Field Cavity
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Zero field cavities generate a zero magnetic field in an air gap. They are mainly used to calibrate hall probes for their zero scale value of output for the magnetic field strength H or the magnetic flux density B they measure. For example Gaussmeters can be calibrated by using Zero Field Cavity.
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Product
Test Points, Tips, Probes, Jumpers and Clips
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Nickel Plated Steel Alligator Clips. PTFE Insulated Terminals and Test Point Jacks. Circuit Board Test Jacks and Plugs. Color Coded PCB Mount Test Points, Loop Style with Plastic Base for Snap-In Mounting. Surface Mount Test Points on Tape and Reel.
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Product
BP-1 PROBE
BP-1
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Rugged ConstructionWater ResistantUnaffected by Surface CoverEasy to InstallZinc Plated Clamp (included in kit)
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Product
Precision Coating Thickness Gauge Probe Range
Elcometer 355
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Unique probe modules allow the Elcometer 355 Coating Thickness Gauge to be versatile and flexible for any coating thickness measurement application.
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Product
CAM/GATE Test Kits
Series 45
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The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components
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Product
Microscopic Four-Point Probes
M4PP
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CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
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Product
Digital Circuit Tester 3-49V
28830
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Operating range of 3-49 volts DC to work on most vehicle electrical systems. 360° visibility of polarity. The red light indicates positive polarity, green indicates negative polarity. Long, 12ft. coil cord and heavy-duty alligator clamp for secure connections. The probe is insulated to prevent the possibility of shorting the side of the probe to other components.
