Product

Eddy Current Test System

CIRCOGRAPH® Product Family

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Foerster Instruments, Incorporated

CIRCOGRAPH® Product Family - Foerster Instruments, Incorporated

The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.

Product

Criticality Systems

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Mirion Technologies

Mirion Technologies

The CAAS-3S is a next generation system based on operational excellence established over forty years. The new design is based on the highly reliable analog signal chain used in the probe design for the previous EDAC-2 and later EDAC-21 products which have had successful safety records and very low false alarm rates. This new system addresses the next several decades of facility operation.

Product

Magnetic Field Camera: mapping for MRI applications

MFC2046

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Metrolab Technology SA

MFC2046 - Metrolab Technology SA

MRI and NMR spectroscopy applications require a highly uniform magnetic field, within at most a few ppm. NMR is the only magnetic measurement technique capable of providing a field map with that degree of precision. Introduced 25 years ago, Metrolab’s NMR Magnetic Field Cameras have revolutionized field mapping for MRI magnets. They reduced acquisition times from hours to minutes, positioning errors to fractions of a millimeter, and they rendered human and drift errors negligible. Now, meet the latest generation NMR Magnetic Field Camera, the MFC2046! Map any magnet with the New generation of MFC probe arrays. Magnetometer Teslameter Gaussmeter

Product

ResMap or DualMap Auto Load Table Top

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Creative Design Engineering, Inc.

Creative Design Engineering, Inc.

*Type: Table Top*Wafer load: open cassette*Wafer size: 4" to 8"*Mini Environment: N/A *Probe Changer: N/A *Aligner: N/A*Size: 12" x 28" x 10"*Range: 1m/ to 10M/*Accuracy: 0.5%*Repeatability: 0.02% *Static Repeatability: 0.1% dynamic

Product

Pipe & Duct Inspection Cameras

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General Tools & Instruments

General Tools & Instruments

Pipe & Duct Inspection Camera are video inspection cameras with a probe long enough (roughly 70 ft.) to locate and identify an obstruction in a water or sewer line or HVAC duct by taking close-up video clips and photos of it. The P16PIP probe (also available separately) that comes with the DPS16 Pipe & Duct Inspection Camera has better camera lighting and optics and slightly better resistance to water than the P610-20PR probe that attaches to a recording or non-recording wet/dry inspection camera console.

Product

Linear Testfixture (2 pcs. Cassette Included), UTT 105 x 170 mm (2pcs)

MG-05

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MG Products

MG-05 - MG Products

FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (1000N) 650 units for each cassette• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 105 x 170 mm (wxd) each cassette• Outer dimensions: 550 x 400 x 50 x 140 mm (wxdxh1xh2)• Designed for 2 pieces changeable cassette

Product

Semiconductor Metrology Systems

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MTI Instruments

MTI Instruments

MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.

Product

Dual Channel External Temperature

TGP-4520

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Gemini Data Loggers Ltd.

TGP-4520 - Gemini Data Loggers Ltd.

This unit has connections for two external probes (not included) and is ideal for comparing ambient and process conditions or comparing two different processes.

Product

25 GHz differential probe with ProAxial interface

DH25-PX

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Teledyne LeCroy

DH25-PX - Teledyne LeCroy

25 GHz differential probe with ProAxial interface.

Product

Dry Bulb Temperature Probe for WBGT

TP3207.2

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Senseca

TP3207.2 - Senseca

Dry bulb temperature probe used for calculating the following indices: IREQ,WCI, DLE, RT, PMV, PPD, WBGT, SR and mean radiant temperature. Pt100 sensor.

Product

Thermal Microclimate Data Logger

HD32.1

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Senseca

HD32.1 - Senseca

The HD32.1 Thermal Microclimate is a data logger multifunction instrument to measure the microclimate in moderate, hot, severe hot, cold environments and the measure of physical quantities. It is provided with 8 inputs for probes equipped with SICRAM module and a back-lighted graphic display. It has been designed for microclimate analysis in the workplace; the instrument is used to detect the necessary parameters to establish if a certain workspace is suitable to perform certain activities.

Product

DVB-T/T2 Compact Monitoring Probe

EdgeProbe Nano DVB-T/T2

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TestTree

EdgeProbe Nano DVB-T/T2 - TestTree

With its small, compact and easy to handle design, the EdgeProbe Nano DVB-T/T2 is the ideal tool for field technicians to transport in order to validate and monitor 24/7 all points of a DTV network.EdgeProbe Nano is able to monitor DVB-T and DVB-T2 signals through its RF input (144 x 137 mm compact format).Combined with a Network Monitoring System or not, the EdgeProbe Nano provides a powerful broadcast network alert & diagnosis tool allowing DTV network operators to monitor global trends and anticipate potential failures.

Product

Digital Leeb Hardness Tester

TIME®5310

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Beijing TIME High Technology Ltd.

TIME®5310 - Beijing TIME High Technology Ltd.

TIME5310 is an advanced digital Leeb hardness tester developed with advanced micro electronic technology. It is loaded with all the features for metal hardness testing, such as probe auto recognition, large memory, USB output, removable printer, software, etc. The improved display makes it is much easier to read the values. TIME5310 digital hardness meter is a must have for testing in the field or in the lab. By the way, there are newly designed probes for this hardness meter now.

Product

Web Sensor

T3511P

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COMET SYSTEM, s.r.o.

T3511P - COMET SYSTEM, s.r.o.

Humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.

Product

Turbidity Probe

AS56-N

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optek

AS56-N - optek

AS56-N is a probe for direct installation into pipelines and vessels measuring NIR light absorption (Turbidity or Solids Concentration) in various liquid flow streams. Two optical path length choices allow the measurement range to meet the process control requirements.

Product

Web Sensor

P8552

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COMET SYSTEM, s.r.o.

P8552 - COMET SYSTEM, s.r.o.

The devices are equipped with two connectors for connection of the temperature and humidity external probes and three binary inputs for two-states signals. The dry contact or two-state voltage signal can be connect to the binary input.

Product

Handheld Humidity/Temp Hygrometer

625

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Edgetech Instruments

625 - Edgetech Instruments

The Model 625 is an ideal instrument for indoor air quality (IAQ) and indoor environmental quality (IEQ) measurements of temperature and humidity. The EdgeTech 625 temp/RH probe can be used two ways: use it as an integrated unit by attaching the probe head to the instrument or connect both parts via a cable. The clear back-lit display can be switched between relative humidity, wet bulb, and dew point at the touch of a button.

Product

Current Probe

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Vernier Software & Technology, LLC

Vernier Software & Technology, LLC

Simplify your experimental setup with the Go Direct Current Probe. It connects wirelessly via Bluetooth® or wired via USB to your device. The wireless connection eliminates additional cables that can clutter the lab bench. Capture small currents like those produced by a magnet falling through a coil.

Product

Spring Contact Probes

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Merica Technology Ltd

Merica Technology Ltd

Spring Contact Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)

Product

HandyScope HS6-DIFF With SureConnect: 500 MS/s, 250MHz BW, 4 Channel (256MS/ch), USB Differential Digital Storage Oscilloscope, Spectrum Analyzer, Voltmeter, Transient Recorder

HS6-DIFF-500XMS-W5

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TEAM SOLUTIONS, INC.

HS6-DIFF-500XMS-W5 - TEAM SOLUTIONS, INC.

The only oscilloscope in the world that has:- SafeGround, differential input channels that can be switched to single ended.SureConnect, auto-detects a true connection between the probe tip and the device under test.- CMI interface.- USB 3.0 interface, 5Gb/s data transfer- Lowest noise