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DYNAMIC TRACKING
VXTRACK
The C-Track dual-camera sensor is a complete portable 3D measurement solution that offers probing inspection and dynamic measurement capabilities. It is fitted with high-quality optics and special lighting, enabling it to measure all reflectors within its operating space. The probing stylus is very useful for aligning parts with respect to a referential (calculated using a group of reflectors), which allows movement or deformation monitoring directly on the part's referential.
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1Z-2-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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SIP-90-4 Test System Interface Probe
SIP-90-4
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Rogowski AC Current Probe, 23 MHz, 3000 A
N7040A
The Keysight N7040A Rogowski coil current probe is designed for measuring AC currents up to 3,000 A with the bandwidth ranging from 3 Hz to 23 MHz. The probe is easy to use because it has a thin, lightweight, flexible and simple-to-use clip-around Rogowski coil that enables current measurement in the most difficult to reach parts and confined spaces of a circuit under test. It can also measure large AC current without increase in transducer size.
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Standard 1.17 (33.20) - 4.50 (128.00) Battery Probe
CP-2LB-8
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 88Full Travel (mm): 2.25Recommended Travel (mil): 78.7Recommended Travel (mm): 2.00Overall Length (mil): 315Overall Length (mm): 8.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Handheld Surface & Volume Low Resistivity Meter for Conductive Materials
Loresta AX
The Loresta AX Resistivity Meter a handheld unit measures the low resistivity of samples with consistent accuracy. This resistivity meter measures resistivity using a wide variety of probes. The Loresta AX uses a standard RCF that enables the user to input other RCF''s if known.
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30A, 100 MHz CURRENT PROBE, BNC, AC/DC, 30A rms, 50A Peak Pulse
T3CP30-100
30A, 100 MHz CURRENT PROBE, BNC, AC/DC, 30A rms, 50A Peak Pulse.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1L24-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Temperature Kit
TEMPKIT
The Power Probe Temperature Kit is designed to give readings for ambient temperature and from the wireless Temperature Probe. The Tempkit has a built–in temperature sensor in the base unit, plus a temperature sensor in the remote wireless Probe. This allows for multiple readings simultaneously. One additional wireless Temperature Probe (TEMPPROBE) is available separately, for a second temperature reading.
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Standard 2.00 (57.00) - 3.60 (102.00) General Purpose Probe
P2664G-4V1S
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 10Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 114Full Travel (mm): 2.90Recommended Travel (mil): 84Recommended Travel (mm): 2.13Overall Length (mil): 895Overall Length (mm): 22.73Overall Length Remark: Tip 1C: 845 mil (21.46 mm) Tip 2R: 935 mil (23.75 mm)
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Standard 3.00 (85.00) - 6.00 (170.00) Non Replaceable General Purpose Probe
G-S-F
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
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DL-HCM Series Accessories Kit with Probe Holder, Micro IC Grabbers (Qty. 2), and Y-Banana Adaptor
DL-HCM-Acc-Kit
60 V of common mode and 80 V differential input range with 1 GHz of bandwidth, make these probes ideal for lower voltage GaN power conversion measurements. The 60 V of common mode is well suited for handling any float of the battery and bulk/absorption voltage during charging, while the 80 V differential input range provide margin for any overshoot.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Microwave Testing
40A
The GGB Industries, Inc., MODEL 40A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 40A achieves an insertion loss of less than 0.8 db and a return loss of greater than 18 db through 40 GHz.
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Light 0.60 (17.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-72T20-2
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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High 1.80 (51.00) - 12.60 (357.00) Switch Probe
TSP138-H230-3
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 138Test Center (mm): 3.50Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,760Overall Length (mm): 44.70Switch Point (mil): 67Switch Point (mm): 1.70
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Heavy Duty Circuit Tester / Jumper
32900
Heavy-duty circuit tester for checking low voltage up to 12 volts. By depressing the red button the tester becomes a jumper for powering electrical components or a ground. The probe, handle, cord and clamp are reinforced for durability. Comes with a strain relief spring on the cord.
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AC Power Analyzers
Measure voltage, current and power on 4 channels: DC, 1-phase AC or 3-phase ACMake more accurate power measurements: 0.05% at 50/60 HzMeasure current directly: internal shunts to 50 Arms, or with external probes or transducersAddress multiple test scenarios with isolated inputs
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Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25UN-10
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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Web Sensor
P8552
The devices are equipped with two connectors for connection of the temperature and humidity external probes and three binary inputs for two-states signals. The dry contact or two-state voltage signal can be connect to the binary input.
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Thickness Gauges
CMX
The CMX has all features of the MX & MMX gauges with a ton of advanced features. Measure material and coating thickness simultaneously, while still detecting pits & flaws in a single mode (PECT). Auto probe zero, auto probe recognition, auto temperature compensation are also included. Selectable Large Digits and B-Scan display options, up to 64 custom user definable setups, selectable transducer table for precision linearity, and material and coating calibration options are also available.
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Oscilloscope, 100 MHz, 2 GS/s interleaved, 4 CH, 200 Mpts/Ch interleaved, Fully Loaded DSO with 16 Dig Ch MSO
T3DSO2104HD-MS
The T3DSO2000HD series of Bench Oscilloscopes feature 4-channel models with analog bandwidth options of 100 MHz, 200MHz and 350 MHz. The T3DSO2000HD Oscilloscopes use 12-bit high resolution ADCs and a low noise front end which provides an impressive noise performance to cover a wide range of measurement applications. Each model offers a maximum sample rate of 2 GSa/s (interleaved) and a maximum memory depth of 200 Mpts in interleave mode. The MS configured models also include a 16 channel logic probe as standard.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type D, Ø0.80mm, 230gf
K100-D080230-SKAU
K100 Series, Pitch 100mil, Tip Style D, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
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Pin-Mapping for Custom Connectors, Test Fixtures, UUTs | Cable & Harness Testers
PinMap™
Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester.
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True RMS RF Millivoltmeter
3440A
The 3440A measures the true rms of low level RF and microwave signals to over 1GHz. High rms accuracy, traceable to NIST, is assured regardless of waveshape. Common calibration errors are eliminated through temperature compensation of the probe detector diodes; double shielding protects the interchangeable probes from rough handling and pickup. Relative gain or loss measurements are simplified by a 0 dB reference adjustment. DC output proportional to the ac input is provided for analog recorders and to allow operation as an ac-dc converter.
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1L18-10-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1T30-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
