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Product
AC / DC Voltage And DC Polarity Tester
1861
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Peaceful Thriving Enterprise Co Ltd
*With cETL Approval.*Built-in LED and neon lamp indicator.*Neon lamp for 120V-230V-400V AC.*LED Display for 12V-50V and polarity.*Long lead connects tester body and probe.
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Product
150 A, 10 MHz Current Probe - AC/DC, 150 A rms, 500 A Peak Pulse, 2 meter cable
CP150B
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Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
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Product
Volt Probe & Socket Testers
Non-Contact & Socket
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Use Amprobe non-contact volt probes to safely check circuit breakers, wall sockets and fuses for voltage presence with portable, economical tools. For sockets, choose an Amprobe socket tester, which can confirm whether GFCI breakers are properly wired.
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Product
Broadband Field Meter
NBM-520
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*Intelligent probe interface detects the probe parameters*Fully automatic zero point adjustment*PC software for convenient data management
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Product
Micro probes 1 MHz up to 1 GHz
MFA 02 set
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The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
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Product
Wafer & Die Inspection
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SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Product
Autosamplers for Chromatography
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Maximize the throughput and flexibility of your ACCQPrep system by adding automated sample loading for longer unattended operation.The two rack AS 2x2 and four rack AS 4x2 sampler options allow different chromatographic conditions to be applied to a variety of different samples and doubles or triples the fraction collection capabilities of the base system.The ACCQPrep AutoSamplers provide high recovery of samples with 99.9% transfer of analyte. PeakTrak software allows users to quickly create sample queues for walk up open-access labs and overnight purifications. Develop methods that result in the highest purity and largest loading capacity with the 3 Step Focused Gradient Generator that works seamlessly with the AutoSampler and PeakTrak software. An integrated wash station and sophisticated robotic probe movement ensures sample purity and limits cross contamination.
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Product
Group3 controllers
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The Group3 controllers - the CNA and DNA - have a built-in PID algorithm, that allows them to perform local closed loop control. A controller, combined with a Group3 analog Hall probe forms a compact, inexpensive way to implement closed loop magnet control.
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Product
Standard 2.00 (57.00) - 6.00 (170.00) Non Replaceable General Purpose Probe
F-S-R
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 66Recommended Travel (mm): 1.68Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
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Product
High 1.50 (43.00) - 9.60 (272.00) Long Travel Bead Probe
BPLT-1HL-9.6
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Product
Adapter/Nickel
WADP-NFSF
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Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Product
Natural Ventilation Wet Bulb Probe
HP3201.2
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Wet bulb probe with natural ventilation. Pt100 sensor. Probe dimensions: stem Ø 14 mm, length 170 mm. Equipped with SICRAM module, two spare cotton wicks and 50 cc distilled water.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1T30-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.00 (28.00) - 2.75 (78.00) Non Replaceable General Purpose Probe
E-S-W
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 65Full Travel (mm): 1.65Recommended Travel (mil): 43Recommended Travel (mm): 1.09Overall Length (mil): 495Overall Length (mm): 12.57Rec. Mounting Hole Size (mil): 67Rec. Mounting Hole Size (mm): 1.70Recommended Drill Size: #51Overall Length Remark: Overall length for E-S-V and E-S-W is .540 (13.72)
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Product
High-Voltage Differential Probe, 25 MHz
N2791A
High Current Probe
Use the N2791A 25-MHz low-cost high-voltage differential probe to make safe and accurate floating measurements with an oscilloscope. The N2791A differential probe allows conventional earth-grounded Keysight oscilloscopes to be used for floating signal measurements of up to 700 V of differential voltage and common mode voltage.
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Product
High Voltage Differential Probe
DP750-100
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Shenzhen Micsig Instruments Co., Ltd.
*The leads and probe are with shielded design, interface ends are integrated in a compact box, no need to twist the cables, leads to a lower noise floor and has less interference. *Support one-press Zero calibration and automatic overrange alarm.*Directly powered by Micsig UPI interface, realise auto scaling setup, can also powered by oscilloscope via USB cable.
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1I-10-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Low-leakage Switch Matrix Family
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Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1H-7-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Streaming Quality Monitor
Net-OTT
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NET-OTT probe allows monitoring of over-the-top audio and video streams.
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Product
RF Helmholtz Coil
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The Beehive Electronics 135A RF Helmholtz coil generates a well-controlled, uniform magnetic field. It can be used to calibrate magnetic field probes, such as the Beehive 100 series, or for testing the susceptibility of other devices to magnetic fields. The Helmholtz coil comes supplied with a fixture that makes it easy to calibrate Beehive 100 series probes.
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Product
Constant Distance SECM
VS-STYLUS
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In collaboration with SENSàSION, we are pleased to offer the Soft Stylus Probe contact mode technique developed by Professor Hubert Girault and co-workers of the Laboratory of Physical and Analytical Electrochemistry (LEPA) at the École Polytechnique Fédérale de Lausanne (EPFL) for constant distance SECM. The probe technology offers the following benefits:
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Product
Thermometer, -20°C to +400°C, 7.9 ", 2.7 ", 1.2 "
72-6700
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Infrared Thermometer*Three thermometers in one...Infrared, Pt100 ohm and Thermocouple*Accommodates 4 wire Pt-100 ohm probes and thermocouple types K, J, R, T, and E.*Selectable readings °C or °F*Data Hold function*Min./Max memory function*Laser guide for IR function*RS 232 output*Auto power off
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Product
Passive Probe, 10:1, 75 MHz, 2-Pack
N2142A
Oscilloscope Probe
The Keysight N2142A is an extremely low-cost passive probe that provides a switchable 10:1 / 1:1 attenuation and up to 75 MHz bandwidth. It features a high input resistance of 10 MΩ (switchable to 1 MΩ) to address a wide range of measurement needs with low probe loading. The probe can be adjusted for both low-frequency compensation and high-frequency compensation. For the best measurements, you should compensate your probe to match its characteristics to the oscilloscope. This probe is compatible with Keysight InfiniiVision Series oscilloscopes with 1 MΩ input.
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Product
Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3G-1
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Central Visibility and Remote Monitoring
Torque Visor
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Visor provides central visibility and remote monitoring of multiple probes, plus easy access to a comprehensive log of system events. Operators can retrieve detailed analysis directly on the respective probe, and spot fault trends across services or several geographic regions.
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-1J-10
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Probes And Cables
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The iProbe is an intelligent temperature sensor that can be calibrated independently of SBIR’s blackbody systems or 104i precision thermometers. These ultra-stable, highly responsive iProbes are used to provide long term accuracy and repeatability of under 0.010°C. Each iProbe incorporates onboard flash memory that allows all calibration constants and calibration date information to be stored independently of the blackbody or thermometer system. This allows iProbes to be exchanged for use on a blackbody or thermometer without any loss in stability or accuracy. To re-calibrate a system you need only exchange the current iProbe with a recently calibrated one. No special equipment is required and there is no down time in the test area.
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Product
LED Probe Clip Light
U1176A
Accessory Kit
Clip this 3-in flashlight on your test probes for great visibility when using your handheld DMMs in dark places
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Product
Sensor Products: Weld Force Probe Auditing System
90061-XH Series
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This system is ideal for field measurement and data logging of forces between the tips of resistance spot welders. The system consists of a handheld sensor and portable readout/ data logger (PMAC 2000).





























