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Product
AC Current Probe 100 mV/A, 60A, 11 Hz LF Bandwidth, 5MHz HF Bandwidth, 1m cable
T3RC0060-LF
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AC Current Probe 100 mV/A, 60A, 11 Hz LF Bandwidth, 5MHz HF Bandwidth, 1m cable.
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Product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25I40-16
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
In-Circuit Test (ICT)
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Analog components (resistance, capacitance, inductance, diodes, transistors, etc.) as well as complex digital components can be tested in the ICT. Compared to other test methods (e.g. flying probe), the in-circuit test enables very short test times (= high assembly throughput) combined with a very high test coverage.
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Product
Guided Wave Radar Level Transmitter
2291
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The 2291 Guided Wave Radar level transmitter is designed for continuous level measuring of conductive or non-conductive liquids, pulps and solids. The 2291 level gauge operates based on the well-known TDR (Time Domain Reflectometry) principle. Micropulses are sent along a probe guide at the speed of light. As soon as the impulse reaches the surface of the medium, it is reflected back to the electronic module. Level distance is directly proportional to the flight time of the impulse.
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Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2F-1
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1L18-7-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High Accuracy Internal Measurement Ultima
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• Ultima handles and kits with display unit D62S Advanced und absolute digital probe P12D• Measuring range from 2 to 310 mm• Resolution up to 0.0001 mm• Mechanical repeatability : 1μm from 2 to 60 mm, 1.5μm from 60 to 210 mm and 2μm from 210 to 310 mm• Robust construction designed for use by inspection and machine shop• UKAS certificate supplied with each head• UKAS certificate supplied with each setting ring.• Rings manufactured according to DIN 2250 part 2 (standard)• Blind bore measuring from 12 to 310 mm• Compatible with all Sylvac digital display• Special heads on request ( threads, grooves, splines, slot width, etc...)
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Product
Small IC Adapter for ZD Differential Probe Qty 2
PACC-ZD006
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Small IC adapter for ZD differential probeQty 2
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1L18-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Featured Accessories
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Get the most out of your AE products. Our product accessories can make an excellent AE product even better. From software to probes, find the right accessory to enhance and transform your application processes or analysis.
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Product
Web Sensor
T3511P-2
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Humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.
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Product
Scanning Kelvin Probe
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Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350 mm. With work function resolution of 1 - 3 meV, and the spatial resolution of the Probe tip diameter (0.05 mm with the SKP5050 model), the Scanning Kelvin Probe gives reliable, repeatable measurements for work function, contact potential difference and Volta potential.
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Product
High Frequency (RF) Testing
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C.C.P. Contact Probes Co., LTD.
CCP designs high frequency testing probes, coaxial probe sockets and pressurized conductive rubber sockets.
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Product
Radiometric Probe for Photons Flow
LPPAR03… Series
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The probe LPPAR03 measures the ratio between the number of photons that strike a surface in one second, in the 400 nm…700 nm spectral range and the surface area (m²). This quantity is defined as PAR: Photo-synthetically Active Radiation.
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Product
BPLT-1 Long Travel Bead Probes
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Product
K Thermocouple Surface Probe
TP772
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Surface thermocouple Type "K" probe. °C max: 400. Response time: 3 s.
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Product
Infiniium V-Series Oscilloscope: 13 GHz, 4 Analog Channels
DSAV134A
Oscilloscope
13 GHz analog bandwidth (upgradable)4 analog channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.09 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Improve your testing with the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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Product
LPDDR5 Protocol Debug And Analysis Solution
U4971A
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The LPDDR5 Solution Bundle provides a systemized hardware, probing, and software solution for LPDDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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Product
SP200B, 200 MHz, ±60 V, 1X or 10X Attenuation, Single-Ended Passive Oscilloscope Probe
780284-01
Oscilloscope Probe
The SP200B is a standard switchable passive probe for oscilloscopes that provide 1 MΩ input impedance. Depending on the attenuation ratio, the probe has an analog bandwidth of 6 MHz in the 1x attenuation setting or 200 MHz in the 10x attenuation setting.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1B-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
InfiniiMax Single-ended Connectivity Kit
E2668B
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Use for single-ended measurements; includes one single-ended browser, one solder-in probe head, and one socketed probe head.
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Product
UVA Irradiance Probe
LP471UVA
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Radiometric probe for measuring the IRRADIANCE in the UVA spectral range 315 nm…400 nm, peak at 360 nm, quartz diffuser for cosine correction. For non-destructive testing ISO 3059:2001, EN 571-1, ASTM E1417.
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Product
Standard 1.08 (31.00) - 4.00 (114.00) Long Travel Bead Probe
BPLT-25F-4
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Product
Calibration Baths
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Calibration baths are electronic controllers which automatically, quickly and with the help of a liquid, supply a temperature. Due to the high reliability and exceptional homogeneity in the measuring chamber, calibration baths are particularly suitable as a factory/working standard for the automatic testing and/or calibration of the widest range of temperature probes - independent of diameter. A special micro calibration bath design enables on-site applications.
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Product
Pipe & Duct Inspection Cameras
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Pipe & Duct Inspection Camera are video inspection cameras with a probe long enough (roughly 70 ft.) to locate and identify an obstruction in a water or sewer line or HVAC duct by taking close-up video clips and photos of it. The P16PIP probe (also available separately) that comes with the DPS16 Pipe & Duct Inspection Camera has better camera lighting and optics and slightly better resistance to water than the P610-20PR probe that attaches to a recording or non-recording wet/dry inspection camera console.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1I35-7
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Micropositioner
S-725
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Primarily used for probing targets that are approximately 0.5 mil (12.7 microns) and larger, with 80 TPI resolution.
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Product
Alternate 0.66 (19.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-62T1-6
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Adjustable Press Plate Bed of Nails Testers
Protector Adjustable Family
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Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
