Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Iridium Physical Layer Test Systems
PLTS
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Device Testing
The BTL Working Group (BTL-WG) has developed a test package which contains a set of testing procedures. These can be acquired and used by manufacturers to pre-test their products for BACnet compliance before they send their products to an RBTO (Recognized BACnet Testing Organization) for BTL Testing. The BTL Test Package is available on the test documentation page.
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Electronic Control Unit Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Scienlab Battery Test System – Module Level
SL1001A Series
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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Fully-Automated CTIA-Compliant OTA Test System
TS8991
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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IOL & Power Cycling Test Systems
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Seam Fold Test Device
FFR1000
This equipment is designed to bend a flexible printed circuit board, which has a high degree of freedom and versatility, and at that time, apply a load to the bending point at the initial stage or each time, and repeat bending and unfolding to confirm the durability.
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Power Device Testing System
Devices that control electric power, and are used in automobiles and a wide range of electrical products.
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Test And Simulation Devices
BreakingPoint
Control global threat intelligence at Internet-scale to create massive-scale, high fidelity simulation and testing conditions for battle-testing infrastructures, devices, applications, and people.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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ARINC-429 Module
M4K429RTx
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Backend Test For Packaging Devices
Power MOSFETs need a lot of different tests. We understand backend test, and have over 80% of our installations used in this application, operational 24hrs every day delivering fully tested and QA approved products at throughput rates up to 20kuph. Backend test, for power devices in particular, has a diverse, but well-established list of technical demands to detect both failures and failure mechanisms.
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PCI Express 4.0 Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Ball Pressure Test Device
ZBP-T
Made up by the related item according to IEC60695, IEC884-1, GB/T5169.21-2006, GB4706.1-2005, GB2099.1-2008, etc. • R = 2.5mm Pressure: 20N • Base with thermocouple hole • Material: 304 stainless steel
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Medical Device Testing
Our experts are qualified to assist you in EMC testing a variety of medical devices, from highly advanced robotic surgical systems, basic over-the-counter devices, and everything in between. Backed by more than 30 years of experience, F2 Labs can provide you with the necessary medical device testing and certification to get your product in the hands of doctors and patients on a timely schedule.
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Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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VLT Chassis Dynamometers for Diesel Smoke Testing under Road Conditions (CDST)
Diesel Smoke Testing by Free Acceleration Test is one! But how accurate is this Test? We all know that it is a not valuable test, but still better as none testing of Vehicle Diesel Engines. The results are not realistic in many cases. And not as good for the Engine we know.
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High-Voltage Test and Diagnostics Device
Viola
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR viola. The portable and powerful viola high-voltage testing and diagnostics device is used for cable and cable sheath testing of medium-voltage cables up to 35 kV and electrical equipment. Another function is insulation testing on electrical equipment.* High performance and compact* Precise and non-destructive determination of the cable condition* Easy and quick test setup* Automatic testing and diagnostic sequences
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Wireless Device Testing Software
Get the most out of your mobile networks and devices. Our comprehensive portfolio of wireless testing equipment is designed to address even the most complex measurement requirements.The multistandard, modular and highly flexible, one-box wireless communication test solutions from Rohde & Schwarz support all main cellular communications, wireless connectivity, GNSS and broadband standards.Featuring high-speed, high-precision and exceptional flexibility, our leading-edge solutions can easily be extended to cover the latest standard enhancements. Benefit from our decades-long excellence in the T&M industry – Rohde & Schwarz is the right partner to fulfil your test requirements.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Test System
UltraFLEX
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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High-Voltage Test Device
PGK 110 HB
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK HB. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit.* Testing of medium- and high-voltage cables* DC voltage testing of up to 110 kV output voltage with positive or negative polarity* AC voltage testing - up to 80 kV for switchgear, busbars and insulating elements* Easy-to-maintain 2-piece design
