Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Efficient All-In-One Test Solution for Low-Cost IoT Devices
KT RFCT 2400
The low price point creates a cost effective means for testing wireless communication units, while generating a favorable cost to performance ratio.The calibrated RF test system has a small footprint, integrating seamlessly into test system infrastructures via a single Ethernet connection. GPIOs control the DUT and peripherals. The test system enables communication interfaces like SPI, I2C, UART and CAN. Simple Go/No-Go tests can be performed in parallel. The KT-RFCT 2400A features a 70 MHz to 6 GHz frequency range and includes non-signaling and signaling connections. Bluetooth signaling standards are supported up to 4.1 as well as BT-LE. WIFI signaling standards supported are a, b, g, n and ac.The KT-RFCT 2400A is the perfect test system for a wide range of applications, such as Bluetooth, Infotainment, Keyless Entry, Tire Pressure Measurement, GPS and WIFI.
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Device Cloud for Web & Mobile App Testing
Remote Testkit
*Better test efficiency and productivity.*Flat rate for 24/7/365 unlimited device access.*Stable and secure operation by NTT
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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UL Rain Spray Test Device With Nozzle
CX-UL56
Shenzhen Chuangxin Instruments Co., Ltd.
UL rain spray test device with nozzle Size:500*800*2000mm((adjustable height 1000~2000mm)Nozzle water column intersection from the ground height 0-1400mm adjustable
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Discrete Devices High-speed Testing System
QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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BAW Devices
Teledyne RF & Microwave has been producing Bulk Acoustic Wave (BAW) delay devices since the early 1960’s. Over the years,Teledyne has constantly improved BAW technology and is currently the world’s only supplier of microwave bulk acoustic wave delay devices. Markets for BAW devices include instrumentation and radar altimeters and are available in connectorized, pin and surface mount configurations.BAW devices operate as low as 300 MHz and as high as 17 GHz, usually in sub-bands of around 10%. Depending on the delay and frequency of operation the insertion loss is in the range 30 dB to 90 dB.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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SAS Protocol Test System
Sierra M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Medical Devices
As more medical devices become wireless, manufacturers will be looking for compact and affordable testing solutions for wireless components. Copper Mountain Technologies’ USB vector network analyzers provide portable, cost-effective network analysis solutions for medical wireless device applications.
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Microwave Devices
Photonis Defense and its predecessors have been designing and manufacturing Traveling Wave Tubes (TWTs) since their invention in the early 1940’s. Photonis manufactures helix-type tubes that are constructed using the industry standard metal-ceramic construction. Our tubes are conduction cooled and feature rare earth periodic permanent magnets for power-free focusing.
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Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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IoT Developer Device
Thingsee One
Thingsee One is a smart developer device for Internet of Things (IoT) application and solution development. The device is designed for the easier and faster deployment of new IoT applications and services at a fraction of the current cost. Thanks to its robust structure, wide variety of fully programmable sensors and extensive cellular connectivity, Thingsee One is an ideal host for a multitude of different applications.
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Serial Device Server
SD-330AC-1402
The Silex SD-330AC-1402 features a FIPS 140-2 wireless/wired LAN Serial Device Server and an Ethernet to Wi-Fi Bridge. Devices equipped with the RS-232C serial interfaces can join a Ethernet LAN or wireless LAN. Devices with an Ethernet port are also transformed to a wireless network devices. Medical devices, printers, scanners or virtually any other device with a serial port or an Ethernet port can now be enabled with secure and robust LAN network capability. The SD-330AC-1402 can be simply added to US government facilities to enhance device networking connectivity.
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Low-Temperature Impact Device
DWC-1
This low-temperature impact device is compliance with standard requirement of IEC60245, IEC60227, IEC60540, GB5013-2008, GB5023-2008 and GBT2951-2008. It’s used to test all kinds of PVC sheathed cable, wire, soft wire and no sheath of parallel soft PVC insulated impact resistance at low temperature. Specification: • Working temperature: -15℃±1℃ • Impact height: 10~200mm adjustable • Length of specimen: 5D~150D • Material: 304 stainless steel • Completion time once: 3~5s • Completion number of units for once: ≥2pcs • Weight: 100/200/300/400/500/600/750/1000/1250/1500g • Low temperature box to match additionally
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IoT Devices Penetration Testing
There is a rising concern that IoT devices are being developed rapidly without appropriate consideration of the profound security challenges involved, as demonstrated by the various IoT devices hacked in recent years— automobiles, cameras, children's toys, thermostats, and medical devices.With more than a decade of specialized cyber security testing experience combined with our extensive research and development, we can assess and identify both common and complex security vulnerabilities that may be residing within your whole IoT ecosystem.
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Component Test Fixture For N1413 With B2980 Series
N1428A
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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IEC60529 Ipx56 Water Spray Test Device
IPX56A
Shenzhen Chuangxin Instruments Co., Ltd.
The ipx5/6 rain testing machine is designed according to IEC60529 standard.
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Connected Devices
enable communication between devices. We provide connectivity for sensor applications and input devices via mobile communication and develop custom IoT solutions. Capturing, transferring and visualizing data increases your productivity and creates transparency.
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Acoustic Wave Device
Murata offers high-performance acoustic wave radio frequency (RF) devices including filters, duplexers, diplexers, resonators, and frequency control devices. This allows us to provide a wide range of acoustic wave-based RF devices in a one-stop service to all RF engineers.
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Pull Out Device
BCL-1
This Pull out device BCL-1 is designed and manufactured according to relevant standard requirements of IEC884-1/ GB2099.1-2008 and other electrical accessories standards, Mainly used to test the needed maximum force when the plug pull out from socket and the minimum force when single stage plug pull out from socket, and to inspect whether the socket can withstand the lateral stress imposed by electric plug into the socket. This device is applied to plugs and sockets which rated voltage no more than 250V and rated current no more than 16A.Specifications: • Weights: 36N*1, 5.4N*1, 5N*2, 4N*1, 2.6N*1; • Standard testing plug: each one for Dipolar 10A, tripolar 10A and 16A • Standard test bolt: Each one for 1.5N and 2N • 1 set of clamping device • 1 set of Weights tray • Lateral stress weights 5N*1 • 1 set of lateral stress bar
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PCI Express 3.0 Test Platform with SMBus Support
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Protection Device Testing
The Motwane Manufacturing Company
Power system protection is a branch of electrical power engineering that focuses on protecting electrical power systems to detect and isolate faulty parts. The objective is to keep the power system stable by separating only the defective components while keeping the rest of the network in operation. The device protects the transmission lines, generator transformer, and other electrical apparatus from multiple faults.
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Laser/LED Devices
Whether you manufacture or sell CD and DVD drives, laser pointers, or Blu Ray discs - you are probably more than aware of the potential hazards of high-powered, bundled radiation in laser products. As an independent testing institute, TÜV Rheinland can check your products for full compliance. We can classify and certify your products in accordance with international standards and the prescribed DIN EN 60825 norm.
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Proving Devices
Martindale Electric Proving Devices - safely prove the operation of voltage indicators and test lamps
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Recorder Carrier Device
RCD
The RCD is a carrier signal demodulator for SCADA and Fault Data Recording. the RCD demodulates the carrier to indicate the presence of a relative level of a singal
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Flash Storage Device
Axiomtek provides various industrial-grade flash storage device for customers to simplify and shorten the system design time.
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Power Device Analyzer
bsw TestSystems & Consulting AG
Semiconductor manufacturers need accurate data on the exact electrical characteristics of their components as a basis for further optimization.
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RF Shielded Test Enclosure, I/O Intensive Device Tests
JRE 1720
Like its other brothers in the JRE test line, it features rugged welded aluminum construction with superb RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan. A JRE exclusive, our triple door locking mechanism allows easy single handle door operation. Ventilation is standard with our JRE exclusive honeycomb style vents in enclosure rear and door.
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Programmable Serial Device
HR-16P
The HR-16P is a programmable RS-232 serial device designed to control any device with a serial port based on sensing level changes (open-to-close and close-to-open, or digital high to low and vice versa).
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Metrology Device
XPLOR 100
XPLOR 100 is a state of the art, fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.
