PVA TePla Analytical Systems GmbH
We are a leading international high-tech company specializing in metrology and material solutions. We develop and manufacture innovative systems for the production, refinement, and inspection of advanced materials − serving industries from semiconductors to aerospace technology.
- +49 (641) 68690-0
- info@pvatepla.com
- Im Westpark 10–12
Wettenberg, 73463
Germany
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Product
SAM Line
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PVA TePla Analytical Systems GmbH
The SAM Line offers easy-to-use scanning acoustic microscopes for process control and quality assurance as well as for research applications. The individual models are derived from a component platform that complies with industry standards and incorporates cutting-edge production and manufacturing technologies. Thanks to their new high-frequency and transducer technology, our acoustic microscopes enable detailed acoustic analysis in the ultrasound range up to 400 MHz.
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Product
SAM Software
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PVA TePla Analytical Systems GmbH
The high performance of our systems derives not least from their interaction with our specially developed software. This enables the comprehensive and precise mapping and analysis of all SAM data software.
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Product
SAM Premium Line
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PVA TePla Analytical Systems GmbH
The SAM Premium Line combines acoustic microscopy and optical microscopy. It enables the scanner to be combined with both an inversion as well as a reflected-light microscope. The technology used in the SAM Premium Line is based on a core platform that employs the latest production and research technology. The individual systems are characterized by high throughput, high flexibility and a wide scanning range. They can be expanded to suit customer requirements and specified for the most diverse applications.
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Product
SAM Auto Line
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PVA TePla Analytical Systems GmbH
The fully automated acoustic microscopes from the SAM Auto Line enable simple detection of cavities, voids, bubbles, inclusions, and delamination and are ideally suitable for wafer inspection, bond checking, and MEMS inspection. An automatic defect-review software package performs a fully automated evaluation of the entire wafer. The results can be issued as klarf files and VEGA MAP. A GEM/SECS connection is also possible.
