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ATCA 5U 4 Slot replicated Mesh - dual shelf managers
109ATCA504-3000R
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The 5U 4 slot ATCA backplane is a replicated Mesh with dual shelf managers. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Slide Screw Tuners
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Slide screw tuners are particularly suited to establishing impedances for device characterization, or for any other application requiring a precisely repeatable mismatch condition. This is due to the precision with which a specific matching condition can be repeated if the tuner has calibrated position indicators.
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Active Device Characterization Solution Up To 50 GHz For 5G
N5245BM
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The N5245BM provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 50 GHz for 5G applications.
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Spectroscopic Ellipsometer
PH-SE
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The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
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High Power White Light LED Light Sources
LS-HP1
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The LS-HP1 is a series of high-power, high brightness light sources for liquid light guides (LLG). It is characterized by its outstanding luminance and thus delivers very high light output from liquid light guides.The LS-HP1 works with the latest generation of high-power LEDs with up to 100W power from an area of less than 15mm² and is significantly brighter than a conventional halogen light bulb with 150W. The LS-HP1 is available for liquid light guides with core diameters of 3 or 5mm.
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Phase Noise Analyzer and VCO Tester
FSWP
Phase Noise Analyzer
The R&S®FSWP phase noise analyzer and VCO tester features very high sensitivity thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise and amplitude noise in mere seconds on highly stable sources such as those in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.
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Scanning XPS Microprobe
PHI VersaProbe III
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The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
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Controlled Environment Probe Station
CG-196
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Everbeing controlled environment probe station allows vacuum and cryogenic probing down to 77K with liquid nitrogen or high temperature probing up to 1273K. Efficient in characterizing your devices at extreme temperatures, vacuum, specific gas, etc.
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Signal Path Analyzers
HL2200 Series
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HYPERLABS HL2200 Series Signal Path Analyzers™ provide high-performance test and measurement capabilities for a fraction of the cost of traditional benchtop systems. These differential, multi-channel instruments are ideal for interconnect characterization, debugging cable assemblies, coupon testing, controlled impedance analysis, and other applications requiring a fast rise time.
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Modulation Distortion Up To 125 GHz
S930712B
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S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Multi-Fabric Switch
PEX431
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Designed to enable the development of complex, scalable, high performance 3U VPX systems in today’s increasingly-connected military/aerospace world, the PEX431 is characterized by significant flexibility. The PEX431 Multi-Fabric Switch and XMC Carrier Card allow designers to build complex VPX systems with multiple single board computers and multiple I/O modules. PEX431 supports PCIe switching, GigE switching and the ability to host a XMC mezzanine.
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Bit Error Ratio Testers
M8000 Series
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Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
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Optical Return Loss (ORL) Meter
OPTOWARE-S300 (FOTS-ORL Meter Systyem)
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The Optical Return Loss(ORL) Meter is an efficient system for the characterization and test of optical components and systems to be performed in high quality.
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Power Management Analyzer Test Suites for 802.3at, 802.3bt, & Hybrid PSEs
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While most PSE ports are part of multi-port PSE, behaviors of such systems of PSE ports are beyond the scope of IEEE 802.3 specifications. Sifos offers two fully automated analyzer suites that uniquely characterize PSE port administration and power management behaviors including PD admittance policies, PSE capacity management, LLDP policies, and powering stability. Each of these suites are built upon Live PD Emulation, a feature that enables each test port to independently and continuously emulate user-described PD’s.
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Secondary Ion Mass Spectrometry (SIMS Analysis)
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Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Differential Scanning Calorimeter
DSC-60 Plus Series
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DSC (Differential Scanning Calorimeter) is an indispensable thermal analyzer for materials characterization in R&D and quality control applications in such areas as polymers, pharmaceuticals, electronic parts , foods , etc . It offers the sensitivity and easy operation required for the development of high-performance, highly functional new materials.
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PathWave BenchVue Electronic Load App
BV0012B
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Easily control your dynamic electronic loads, build automated tests and visualize measurements over time for better device characterization.
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Functional Analyzers
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Functional analyzers characterize the key properties of flour and grains to help manufacturers produce consistently high-quality baked goods and snack foods. Widely used in the wheat breeding, milling, and baking industries, our unique analyzers measure starch damage, sprout damage, solvent retention capacity, and impurities in flour and grain, providing multiple indicators for quality control.
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Biosafety Testing
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Biological products derived from mammalian cell lines pose an inherent risk for the introduction of microbial or viral contaminants. In addition, the manufacturing process or product itself may introduce impurities that must be characterized.
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Metrology
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KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
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Product
OTDR
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Wuhan Sunma Technology Co., Ltd.
OTDR, short for optical time-domain reflectometer, is an optoelectronic instrument used to characterize an optical fiber. It can offer you an overview of the whole system you test and can be used for estimating the fiber length and overall attenuation, including splice and mated-connector losses. It can also be used to locate faults, such as breaks, and to measure optical return loss.
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Product
Modulation Distortion Up To And Beyond 125 GHz
S930713B
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S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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SignalShark® - Real-Time Outdoor Remote Analyzer
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Real-Time Outdoor Remote Analyzer for the Detection, Analysis, Classification and Localization of RF Signals between 8 kHz and 8 GHz. Supports automatic direction finding and localization via AoA and TDOA. For fixed installation or semi-static use on demand. Solves complex measurement and analysis tasks reliably and quickly with outstanding RF performance. Windows 10-based open platform for third-party applications. The "SignalShark 3330 Outdoor Unit" series is characterized by a robust and weatherproof die-cast aluminum housing with IP65 protection class, which is also used as a heat sink. The compact size allows the receiver to be mounted close to the antennas, keeping the antenna cables short and the resulting sensitivity high.
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PNA-X Microwave Network Analyzer, 13.5 GHz
N5241B
Network Analyzer
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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PXI Vector Network Analyzers
Vector Network Analyzer
Our PXI vector network analyzers (VNAs) perform fast, accurate measurements and reduce your cost-of-test. Simultaneously characterize many devices — two-port or multiport — using a single PXI chassis. By combining independent, two-port network analyzer modules into one chassis your multisite, multi-DUT, and multiport test applications scale flexibly. Use all ports to simultaneously measure your devices with multiport error correction.
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X-ray Diffraction (XRD) Instruments
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X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
test
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
Pulse Generator
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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Economy Mechanical Calibration Kit, DC To 26.5 GHz, 3.5 Mm
85052D
Mechanical Calibration Kit
The Keysight 85052D economy mechanical calibration kit contains precision standard devices to characterize the systematic errors of Keysight network analyzers in the 3.5 mm interface. This kit also contains adapters to change the gender of the test port and a torque wrench for proper connection. Connector gauges may be ordered separately.
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Product
BSDL File Validation
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Corelis offers services to validate the accuracy of Boundary-Scan Description Language (BSDL) files that characterize the boundary-scan functionality of semiconductor devices. These services include validation of a device's BSDL file while the chip is still in development and BSDL file accuracy verification against actual silicon.
