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Product
Film and Paper Thickness Gauges
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Economical, Accurate, Easy-to-Operate, our line of off-line paper / film thickness gauges are manufactured to meet TAPPI specifications for paper or ASTM specifications for film.
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Product
Drop Dart Impact Tester
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Qualitest offers a Drop Dart Impact Tester which is simple to use as a stand-alone, non-instrumented tester. It is used to measure impact resistance of film, sheet, and laminated materials.
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Product
Thickness Gauges for Plastic films & Paper
CHY-CA
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CHY-CA is a highly precise thickness gauge with mechanical contact method, which can be used to measure the thickness of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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Product
Pinhole Detector
NOVOTEST ED-3D
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NOVOTEST ED-3D Pinhole Detector was designed for rapid non-destructive testing of the continuity of coating (e.g. porosity of film) with thickness up to 500mkm according to ASTM G62-A.Pinhole Detector is designed for testing the porosity of partially painted places and other discontinuities of protective dielectric coatings on metal products by putting low voltage through a sponge which is soaked in a liquid electrolyte with high penetrating properties.
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Product
2-MGEM Optical Anisotropy Factor Measurement System
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The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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Product
Programmable Step Attenuator, DC to 40 GHz, 0 to 70 dB, 10 dB Steps
84907L
Attenuator
The Keysight 84907L programmable step attenuator offers coaxial measurements to 40 GHz in a compact, rugged design. It offers repeatability of better than 0.03 dB, excellent life greater than 5 million switching cycles per section) and an attenuation range of 0 to 70 dB in 10-dB steps. This latest design evolution sets new standards for size and performance. High attenuation accuracy and low SWR are achieved through the use of miniature thin-film attenuation cards composed of high-stability tantalum nitride film of saphire substrate. Insertion loss is outstanding, with with only 2,4 dB of loss at 40 GHz. The compact size of the unit, 35% smaller than the Keysight 8495/7 (26.5 GHz) family, allows for easy integration into instruments and ATE systems.
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Product
Parylene Deposition Equipment
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SCS offers Parylene deposition systems that range from a portable laboratory unit to production models for high-volume manufacturing applications. SCS Parylene deposition systems are designed for accurate and repeatable operation, featuring closed-loop monomer pressure control, which ensures deposition of the polymer film at a precise rate. Whether researching new coating applications or developing structures out of Parylene in the laboratory, or coating components in a production environment, SCS leads the industry with its state-of-the-art Parylene deposition systems.
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Product
Sputter Coater & Freeze Fracture Solutions
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To obtain high-quality images of samples with scanning (SEM) or transmission electron microscopy (TEM), your samples need to be conductive to avoid charging. If a sample does not have a high enough conductivity, then you can quickly cover it with a conductive layer using the method of sputter coating. Also, a carbon or e-beam evaporator coating can be used. Such coatings protect the sample, allow enhancing of the EM image contrast, or can act as a TEM-grid support film for small scale samples.
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Product
Scatterometer with Thin Film Measurement Capabilities
OptiPrime-X Series
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The n&k OptiPrime-X series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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Product
Metrology System
Echo
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The Echo system is a comprehensive in-line metal film metrology tool for single and multi-layer metal film measurements in leading-edge logic, memory, advanced packaging, and specialty semiconductor devices.
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Product
Layer Release Systems
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EVG's IR LayerRelease Technology is a fully front-end-compatible layer release technology that features an infrared (IR) laser that can pass through silicon, which is transparent to the IR laser wavelength. Coupled with the use of specially formulated inorganic layers, this technology enables an IR laser-initiated release of any ultra-thin film or layer from silicon carriers with nanometer precision.
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Product
Fixed Attenuator Pads
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SemiGen RF/microwave fixed attenuator pads feature precise resistor films and superior metalization resulting in superior performance and consistency. Our advanced thin-film technology allows our parts to have full side wraps for SMT installation and a complete grounding backside for ease in attachment, as no ground bonding is requried. Top side contacts for the input and output make these ideal for standard RF/microwave assembly techniques. They are available as MIL PRF 38534 “H” & “K” space screened units. Custom values are easy to fabricate and design allowing users to design in a specific value of choice.
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Product
500 N Screw Flat Grips
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500 N (110 lbf) screw flat grips are for use with low-capacity AGS-X series and EZ-X series load cells and come with flat grip faces. Similar to standard screw flat grips, these grips are versatile and are used for static tensile testing a wide range of materials, including rubbers, plastics, textiles, cloth, and paper, in film form.
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Product
High Isolation 1310/1550nm WDM
HWD1315
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Hangzhou Huatai Optic Tech. Co., Ltd.
HWD1315 high isolation WDM is based on mature thin film filtering tech, metal sealing technology package. HWD1315 is used in combination and separation of 1310nm and 1550nm band optical signal. Its wide bandwidth, flatness, low insertion loss and isolation are higher than the average MWDM devices and so on.
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Product
Tension Meters
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Guangzhou Amittari Instruments Co.Ltd
The Belt Tension Meter Mainly use for automotive belt tension measurement, also can measure and adjust ribbon, filamentous, linear, reticular and other wide objects tension. Applicable to the automotive, textiles, wire and cable, metal wire, plastic film, paper, printing, film industries etc.
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Product
Refrigerator Type Constant Temperature And Humidity Chamber
THC Series
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Optimal chamber for testing materials with mechanical properties sensitive to temperature and humidity effects, such as fibers, paper, or films. Temperature regulation: Automatic control by heater and refrigerator.
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Product
Large Area Mapping Spectroscopic Ellipsometers for Flat Panel Display and Photovoltaic Industries
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HORIBA Scientific’s large area spectroscopic ellipsometers are designed to provide thin film control solutions in flat panel display and photovoltaic manufacturing.A large mapping system allows thin film measurements at every location on the panel. Our large area spectroscopic ellipsometers are driven by our DeltaPsi2 software platform, which provides reliable recipes for routine thin film measurements. Automatic recipes fully automate measurement+modelling+mapping+results. Automatic reporting, data reprocessing, import/export package are some of the many functionalities of DeltaPsi2.
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Product
High-power Benchtop Sequential WDXRF Spectrometer
Supermini200
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Elemental analysis of solids, liquids, powders, alloys and thin films. The new Supermini200 has improved software capabilities as well as a better footprint. As the world''s only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD)..
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Product
Spectroradiometer
SpectraScan® PR-670
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The SpectraScan® Spectroradiometer PR-670 is JADAK’s enhanced economical portable solution for spectral based photometric and colorimetric light measurements, designed for applications requiring precise light measurements from a range of light sources, such as display monitors and projectors, reflective surfaces, and industrial applications (visual display testing, LED testing, film and video post-production, auto/aerospace displays, and dental color testing).
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Product
Cameras
VEO
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The Phantom VEO camera series was designed to work well in nearly any application. The rugged body construction and custom sensor deliver the superior imaging quality that Phantom cameras are known for. These cameras can be found in science laboratories, outdoor areas, and on film production sets.
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Product
RF Front-end
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The RF integrated passive device (RF IPD) uses a high-resistivity substrate to integrate quality factor components such as capacitors and indictors. Many functions like impedance matching networks, harmonic filters, couplers, baluns, and power combiners/splitters can be designed using IPD technology. ST's IPDs are manufactured using thick film and HiRes Si or glass wafer manufacturing technology and photolithography processing.
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Product
PCIe Gen3 4K Compact, High Speed Camera for Testing
CB120MG-CM-X8G3
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4K, compact, high speed camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Product
Cross Sections and Metallography
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Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
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Product
Heat Distribution Measurement Film
Thermoscale
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Measuring heat distribution—from points on a graph to entire surfaces.Thermoscale is a epoch-making new film that enables anyone to measure heat distribution easily by observing variations in density and hue.
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Product
Falling Dart Impact Tester
FDI-01
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Jinan Leading Instruments Co., Ltd.
FDI-01 Falling Dart Impact Testeris applicable in the impact result and energy measurement of the falling dartfrom a certain height against plastic films and sheets with a thickness less than1mm, whichwould result in 50% tested specimen failure.
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Product
Low Noise Amplifier
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Low noise amplifiers, or LNAs, are designed and manufactured by utilizing the most advanced PHEMT or MMIC devices, thin film technologies, and an improved DC power supply to deliver a low noise performance with broad operating bandwidths and good gain flatness. While standard models focus on general purpose applications, additional models with differing frequency ranges, gains and noise figures are listed on the website. Custom designs are also offered to meet any user’s specific needs.
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Product
Tensile Testing Machines
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Is an intelligent tensile testing machine specializing in testing the mechanical properties of various flexible packaging materials. It is suitable for test the peel force, heat seal strength, tearing resistance, deformation, puncture resistance, open force, low speed unwinding force etc of plastic film, composite film, soft packaging materials, adhesives, rubber, paper fiber and other products.
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Product
Quantum Efficiency Measurement Systems
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Newest generation of quantum efficiency (yield) measurement tool, which allows the user to determine QE of powders, liquids, solids and films. An optically optimized geometry using an integration hemisphere and low stray light array spectrometer enables world class measurements and new applications.
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Product
All Sky Imagers
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Instruments that use black and white film to capture images of the entire sky at regular intervals, providing valuable insights into global auroras such as the auroral oval and auroral substorms.
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Product
Scrub Test Panels
4695
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In a typical scrub test, the coating is applied to the Leneta Scrub Test Panel at a specified film thickness, allowed to dry and then subjected to scrubbing with a straight-line scrub tester.
