Semiconductor Technology, Micro Scriber + Flatness, Bow, Warp, Curvature, Glass Thickness

Semiconductor Technology, Micro Scriber + Flatness, Bow, Warp, Curvature, Glass Thickness

Non contact automated 2D- or 3D measurement of warp, bow, slope and surface curvature with software module for calculation of thin film stress (wafer stress) of wafers and glass substrates.

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