Applied Image, Inc.
APPLIED IMAGE Inc. is a world leader in the design and manufacture of precision-imaged optical components intended for a wide range of applications and industries that require NIST-traceable standards and/or precision-imaged components to test, calibrate, align, control or measure their optical or photonics systems. In addition to its large catalog of standard products, APPLIED IMAGE specializes in designing and manufacturing custom components, imaged to the strictest tolerances. Its mission is to provide the highest-quality products and customer service to consistently meet and exceed the expectations of its customers such as NASA (Mars Rover) and Goddard (International Space Station).
- (585) 482-0300
- (585) 288-5989
- info@appliedimage.com
- 1653 East Main Street
Rochester, NY 14609
United States of America
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Product
Optical Apertures
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The APPLIED IMAGE Optical Aperture reticles are available in sizes from 10μm (0.01mm) to 1,000μm (1.0mm) center openings (noted by -10, -25, -30 etc.), on either Chrome on Glass or Chrome on Opal material, with an overall size of 25.4mm (1.0 inch) diameter.
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Product
NBS Targets
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NBS Targets by Applied Image - NBS-1952 Resolution Test Chart, ANSI/ISEA Z87.1-2020 Test Resolution Standard
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Product
Siemens/RIT/Other Targets
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Siemens/RIT/Other Targets by Applied Image - RIT Alphanumeric Chart, Siemens/Star Sector Target, Resolution 2-Cycle Long Test Chart, Sayce Target, Resolution Linear Test Chart, Ultra-High Resolution Target, Digital/Electronic Pixel Target
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Product
AIIM Test Charts (Scanner/Microfilm/Digital/ Copier)
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AIIM Test Charts (Scanner/Microfilm/Digital/ Copier) by Applied Image - Motion-Rotary Target, Planetary-Static Target, Small Area Target/AIIM MS-303-1980, Small Scanner Resolution Target , Copier Test Array, Rotary Test Target/AIIM X113, Film Strip Target, Eastman Kodak Copier/Scanner Digital Test Target, Small Color MTF Target
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Product
EIA Test Charts
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EIA Test Charts by Applied Image - EIA Halftone Gray Scale Chart, EIA Video Resolution Pattern
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Product
Optical Slits
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The APPLIED IMAGE Optical Slit reticles are available in sizes from 10μm (0.01mm) to 1,000μm (1.0mm) widths, on either Chrome on Glass or Chrome on Opal material, with an overall size of 25.4mm (1.0 inch) diameter.
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Product
Robotics and Machine Vision Standards
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Accuracy in machine vision systems is critical to achieving strategic goals regarding quality, efficiency, and consistency. Use our ACCUplace product lines to calibrate vision systems’ distortion, placement/alignment, or other field parameters in systems used for guidance, identification, gauging, and inspection. Using our specialized ACCUedge® technology, our Robotic and Machine Vision Standards are manufactured with line-edge quality that is second to none in the industry, providing the precision needed to calibrate almost any system. Should you need to alter feature patterns, size, or substrate to fit your needs, fill out our Optical Components and Standards form to start the conversation.
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Product
Reticles, Optical Slits, Optical Apertures
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With over 30 years of experience in the manufacturing of high precision Reticles, Slits, Apertures, and Pinholes, APPLIED IMAGE has gained a reputation for delivering precise and accurate parts. We have supplied thousands of these parts to be used in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
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Product
Conformance Calibration Standard Test Card for ITF-14 (Interleaved 2 of 5) Symbol Verifiers
AI-CCS-ITF-14
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This test card is ideal for testing verifiers, scanners, and other ITF-14 (Interleaved 2 of 5) barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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Product
Imaging Gauge Software Test System
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The IMAGING GAUGETM quality analysis system was developed by APPLIED IMAGE to address the growing need to standardize the evaluation of camera image quality. The system includes a Test Chart manufactured using our ACCUedge® technology, along with unique Image Analysis Software, used together to analyze the quality of the imaging system, and then provide a summary report on the various image quality metrics. Our goal is to provide a simple to use, unique image analysis system, that can be utilized by R&D, scientists, system integrators, technicians and field operators to evaluate the camera quality or imaging system.
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Product
Image Analysis & Stage Micrometers
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The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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Product
Stage Micrometer Measuring Scales
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The SM Series of Stage Micrometer Calibration Standards is ideally suited for calibrating optical, imaging, video as well as reticle based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Our SM series covers a range of low to high power systems, and can always be custom manufactured to perfectly fit your needs.
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Product
Standard Step Tablets, Gray Scales & Density Reference Charts
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Standard Step Tablets, Gray Scales & Density Reference Charts are available in a wide variety of patterns, designs and sizes to fit a multitude of today’s application needs. Our gray scales and density patches are measured on a variety of NIST traceable instrumentation, including some of the most sophisticated microdensitometers available to the industry. They are imaged on either Photo Paper (RM) or Film (TM) to function for reflective or transmissive applications.
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Product
SINE (Sinusoidal) Targets & Arrays
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Sinusoidal Target Arrays have been recognized as a superior test method for a variety of applications, from moiré contouring to reliable MTF Evaluation of materials, lenses, cameras, and electro-optical systems (Follow the hyperlink to learn about using Sinusoids for MTF eval). Sinusoidal Pattern Arrays are manufactured on two different materials for both reflective and transmissive applications. Because of the inherent limitations of reflective materials, the maximum spatial frequency of the reflective pattern arrays is limited to 20 cycles per mm, while the transmission film arrays are offered in various sizes up to 256 cycles per mm. In addition, the sinusoidal arrays are available in a Single Frequency Grating or with Multi-Frequency Gratings. If instead of continuous sinusoidal frequency, you are looking for a square wave frequency design, then look to the Ronchi Gratings page. Should you need to alter the size of the pattern or the substrate, fill out our Custom Test Targets and Charts form and start the conversation.
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Product
Image Analysis Micrometers
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For calibrating and analyzing microscopy measurement systems, the IAM line of Image Analysis Micrometers are perfectly suited. Calibrated to NIST Standards, and imaged with the best line edge quality in the industry, the IAM series is a diversified line of slides that function in areas of color calibration (IAM-9C), Optical Magnification, Frame Distortion, and other applications. Custom features, substrates, sizes and designs are available as custom solutions.
