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Flexible Packaging Testing Service
Guangzhou Biaoji Packaging Equipment Co., Ltd.
Flexible Packaging Testing Service mainly included OTR barrier test service,WVTR Testing Service, COF Coefficient of Friction test, lamination bond strength, material analysis, physical properties, tear strength , tensile strength, puncture, slip, blocking, scuffing, film thickness variation etc.
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Spectroscopic Ellipsometers
SENresearch 4.0
The SENresearch 4.0 is the new SENTECH spectroscopic ellipsometer. Every individual SENresearch 4.0 spectroscopic ellipsometer is a customer-specific configuration of spectral range, options and field upgradable accessories. SENresearch 4.0 uses fast FTIR ellipsometry for the NIR up to 2,500 nm or 3,500 nm, respectively. It provides broadest spectral range with best S/N ratio and highest, selectable spectral resolution. Silicon films up to 200 µm thickness can be measured. The measurement speed of FTIR ellipsometry compares to diode array configurations, which are also selectable up to 1,700 nm. The new motorized Pyramid Goniometer features an angle range from 20 deg to 100 deg. Optical encoders ensure highest precision and long term stability of angle settings. The spectroscopic ellipsometer arms can be moved independently for scatterometry and angle resolved transmission measurements.
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DC Resistance Tester
DCSS502BC
Resistance meter is designed to measure copper resistance of transformers, wires, cables, other conductors and other coil products etc. It is widely used of low resistance measurement of switches, heater wires, transformers, relays, motors, electric films and PC circuit boards, wires, cables, etc. With reliable Good/ NG judgement, it is a premier resistance meter for the use in production line or QC department.
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Diversity Transmitter
D4T
The D4 digital 4-channel wireless system was designed as a special purpose system for location production in film and television.
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Strip Sample Cutter
The model DT1010 is a dual-blade sample cutter designed for laboratory and plant floor use. It features high-quality hardened ground steel blades and a heavy-duty base. Available in a variety of configurations, for precision cutting of strips of plastic film, plastic sheet, paper, laminations, foils, and other sheet materials
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Tearing Tester
TGT-01
Jinan Leading Instruments Co., Ltd.
TGT-01 Tearing Tester is applicable in thetearing test of films, sheets, flexible PVC, PVDC, waterproof films, wovenmaterials, polypropylene, polyester, paper, cardboard, textile and non-woven,etc.
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Color Proof Station
TU311
TESTEX Testing Equipment Systems Ltd.
Color Proof Station is designed especially for color comparison between objects and samples during the printing process. It adopts CPL asymmetrical color proof light tool and can illuminate two working surfaces, i.e. the vertical surface with the samples and the horizontal surface with objects. The drawer beneath the working table can house films, PS plate. It is equipped with rolling track, which enables it to slide under weight
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Multiple Angle Laser Ellipsometer
PH-LE
The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
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Static Generators, Charging Bars and Pinners
The Generator/Bar System enables you to bond similar or dissimilar materials and holds materials in place, eliminates air pockets and wrinkles in multi-layer products, prevents plastic films from wandering on rewinders or shrinking on cooling cylinders, and increase production speeds.
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Ozone Generators & Systems
MKS offers a wide range of ozone generators and modular delivery systems which produce ultra-pure, reliable ozone gas. In the clean semiconductor environment, Ozone reacts with a wide range of precursor gases resulting in the creation of Al2O3, ZrO2, HfO2, and La2O3 metal oxides to enable thin film deposition processes like Atomic Layer Deposition (ALD) and Etch (ALE). MKS’ generator uses Grade 6 gas, enabling the creation of higher film density improving product yield. Photovoltaic and Display manufacturing leverage semiconductor best practices and utilize ozone to create enhanced thin film barriers, improving product performance and reliability.
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Programmable Step Attenuator, DC to 40 GHz, 0 to 11 dB, 1 dB steps
84904L
The Keysight 84904L programmable step attenuator offers coaxial measurements to 40 GHz in a compact, rugged design. It offers repeatability of better than 0.03 dB, excellent life (greater than 5 million switching cycles per section) and an attenuation range of 0 to 11 dB in 1-dB steps. This latest design evolution sets new standards for size and performance. High attenuation accuracy and low SWR are achieved through the use of miniature thin-film attenuation cards composed of high-stability tantalum nitride film of saphire substrate. Insertion loss is outstanding, with with only 2.4 dB of loss at 40 GHz. The compact size of the unit, 35% smaller than the Keysight 8495/7 (26.5 GHz) family, allows for easy integration into instruments and ATE systems.
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Thickness Gauges for Plastic films & Paper
CHY-CA
CHY-CA is a highly precise thickness gauge with mechanical contact method, which can be used to measure the thickness of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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High Temperature Chip Resistors
ERJ-Hxx Series
Panasonic Industrial Devices Sales Company of America
Panasonic’s ERJ-Hxx Series Automotive Grade Thick Film Chip Resistors feature a maximum Category Temperature of 175°C and a maximum Rated Operating Temperature of 105°C. The ERJ-Hxx Series is AEC-Q200 compliant, ensuring strict quality control standards are in place to enforce optimal quality and reliability. The ERJ-Hxx Series Resistors offer a small size, higher power Resistor alternative that provides enhanced flexibility of PCB design by reducing solder-joint crack risk. This series is ideal for use in automotive, ICT, general industrial applications, and more.
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Guardian HD Web Profiling Series
Accurate moisture, coat weight and film thickness profile measurement for process control in paper and film converting applications.
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Spectrodensitometers
Shenzhen ThreeNH Technology Co., Ltd.
3NH offers the best spectrodensitometers on the market. Spectrodensitometers are suitable for using in ink printing, in film processing, textile printing and dyeing, plastic electronics and other industries for color measurement and quality control;especially suitable for the measurement and quality control of optical density and dot enlargement in ink printing.
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Scatterometer with Thin Film Measurement Capabilities
OptiPrime-X Series
The n&k OptiPrime-X series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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Aluminum Film Index Tester
DRK120
Shandong Drick Instruments Co., Ltd.
DRK120 aluminum film thickness tester is new instruments as the development of new packaging material. It is used to test aluminum coating in the barrier film, which is around 35NM thickness. This aluminum coating improves the barrier property a lot, because common gas and aromatic gas couldn’t dissolve in metal. The aluminum coating could protect packing material and avoid light. So thickness test and control of aluminum film is very important, the thickness of aluminum will affect the barrier property of film a lot.
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Gas Permeability Tester with Differential Pressure Method
GPT-203
GPT-203 Gas Permeability Tester is based on the differential pressure method and is professionally applicable to the determination of permeance and permeability of plastic films, composite films, high barrier materials, sheeting, metal foils.
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Other Power Electronic Capacitors
AC/DC Power Film Capacitors, DC Pulse Current Capacitors, DC Filter Capacitors, Pulse Grade Capacitors, Motor Run Capacitors, Feed-Thru Capacitors and other Customized Capacitors
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Substrate Thickness, Warp, and TTV Measurement
413 Series
Substrate Thickness, Warp, and TTV Measurement- with or without Tape- for Wafer Backgrind and Etch Thinning processes.Non-contact Echoprobe Technology.Thin film and surface roughness options.
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Process XRR, XRF, and XRD metrology FAB tool
MFM310
Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
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Cryogenic Temperature Sensors
Cernox®
Cernox® thin film resistance cryogenic temperature sensors offer significant advantages over comparable bulk or thick film resistance sensors. The smaller package size of these thin film sensors makes them useful in a broader range of experimental mounting schemes, and they are also available in chip form. They are easily mounted in packages designed for excellent heat transfer, yielding a characteristic thermal response time much faster than possible, with bulk devices requiring strain-free mounting. Additionally, Cernox sensors have been proven very stable over repeated thermal cycling and under extended exposure to ionizing radiation.
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Thickness Measurement Products
Our film thickness measurement products are available for every application. We stock most of the products listed below for fast delivery. Browse through them or contact one of our Application Engineers, who can immediately assist you with your film thickness measurement needs.
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Spectroradiometer
SpectraScan® PR-735
The SpectraScan® Spectroradiometer PR-735 is JADAK’s enhanced sensitivity portable solution for spectral based photometric and colorimetric light measurements, designed for applications requiring precise light measurements from a range of light sources, such as display monitors and projectors, reflective surfaces, and industrial applications (visual display testing, LED testing, film and video post-production, auto/aerospace displays, and dental color testing).
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Line Scan Camera
Piranha4 Polarization
The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
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Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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Explosion Proof In-line Hydrogen Process Analyzer
HY-OPTIMA™ 2700 Series
The HY-OPTIMA™ 2700 Series uses a solid-state, non consumable sensor that is configured to operate in process gas streams. The H2scan thin film technology provides a direct hydrogen measurement that is not cross sensitive to other gases. The HY-OPTIMA™ 2700 Series is ideal for applications where real-time, hydrogen specific measurements can enhance process plant efficiencies, diagnostics and maintenance management.
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Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
