Process XRR, XRF, and XRD metrology FAB tool
MFM310 - Rigaku Corp.
Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
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XRD System
SmartLab® - Rigaku Corp.
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Windows-Based Software Suite for Rigaku's X-Ray Diffractometers
SmartLab Studio II - Rigaku Corp.
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X-Ray Seamless Pixel Array Detector
XSPA-400 ER - Rigaku Corp.
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Compact Photon Counting X-Ray Detector
HyPix-3000 - Rigaku Corp.