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Product
Thin Film Chip Resistors, High Voltage Type
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Panasonic Industrial Devices Sales Company of America
Thin Film Chip Resistors, High Voltage Type by Panasonic
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Product
DC Resistance Tester
DCSS502BC
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Resistance meter is designed to measure copper resistance of transformers, wires, cables, other conductors and other coil products etc. It is widely used of low resistance measurement of switches, heater wires, transformers, relays, motors, electric films and PC circuit boards, wires, cables, etc. With reliable Good/ NG judgement, it is a premier resistance meter for the use in production line or QC department.
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Product
Coefficient Of Friction Tester
COF-02
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Jinan Leading Instruments Co., Ltd.
COF-02 Coefficientof Friction Tester is applicablein static and kinetic coefficient of friction tests of plastic films, sheets,rubber, paper, PP woven bags, fabric style, metal-plastic composite strips/belts for communication cable, conveyor belts, wood, coatings, brakepads, windshield wipers, shoe materials and tyres, etc. With the materialsmoothness testing, users can control and adjust material quality technicalindexes to meet application demands. Besides, this tester is applicable for thesmoothness measurement of cosmetics, eye drop and other daily chemistry.
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Product
Affordable EDXRF Analyzers
NEX QC Series
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Applied Rigaku Technologies, Inc
NEX QC is the lowest cost variant of a line of affordable benchtop EDXRF spectrometers designed for rapid qualitative and quantitative analysis of elements from sodium (Na) to uranium (U) in solids, liquids, alloys, powders, and thin films. For more demanding applications, or for situations where short analysis time is critical, we recommend the NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics.
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Product
Advanced Packaging & TSV
FilmTek 2000M TSV
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Scientific Computing International
Advanced semiconductor packaging metrology system providing an unmatched combination of speed, accuracy, and precision for high-throughput measurements of resist thickness, through silicon vias (TSVs), Cu-pillars, bumps, redistribution layer (RDL) and other packaging processes.
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Product
Pulsed-DC Systems
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Extend process innovation with Advanced Energy’s comprehensive pulsed-DC suite. Minimize arcing, enhance deposition rate, improve film flatness and packing density.
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Product
Moisture Permeability Tester
DRK501F
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Shandong Drick Instruments Co., Ltd.
The principle of moisture permeable cup weighing method is to measure the transmittance of water vapor to film, sheet, paper and other materials by weighing the weight of moisture permeable cup.
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Product
ACCUplace BullsEye /Recognition Grid
AP-B Series
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A unique concept in imaging calibration technology, The ACCUplace Bulls Eye / Recognition Grid allows the end user to calibrate magnification at multiple power levels, as well as test the system’s ability to recognize and locate distinctive shapes within shapes by focusing on the concentric circles.Each Bulls Eye / Recognition Grid target has individual patterns consisting of 5 concentric circles with 0.50mm line width and 0.50mm spacing between circles (10mm Pitch) with a 0.100mm center dot. In addition, each row and column is labeled with X & Y coordinates. The AP-B series is offered on four standard substrates; Chrome on Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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Product
Other Power Electronic Capacitors
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AC/DC Power Film Capacitors, DC Pulse Current Capacitors, DC Filter Capacitors, Pulse Grade Capacitors, Motor Run Capacitors, Feed-Thru Capacitors and other Customized Capacitors
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Product
Camera Endpoint Monitor based on Real Time Laser Interferometry
LEM Series
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Our Real Time Interferometric Process Monitor provides high precision detection of film thickness and trench depth during the etching/deposition process.Depending on applications, LEM camera includes a 670 or 905 or 980 nm laser and when mounted on any dry etch/deposition process chamber with a direct top view of the wafer this generates a small laser spot on the sample surface.Interference occurs when monochromatic light hits the sample surface, resulting in different optical path lengths due to film thickness and height variations in the film.This allows the etch/deposition rate and thus thickness to be monitored in real time, also fringes counting or more complex analysis, providing enhanced process control Endpoint for a wide variety of processes. Additionally interfaces can be detected by their change in reflectivity.
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Product
Metrology
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Optical critical dimension (OCD) metrology and film metrology require accuracy and repeatability. Onto Innovation's techniques are well-established and trusted by semiconductor manufacturers around the globe.
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Product
Falling Dart Impact Tester
DRK135A
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Shandong Drick Instruments Co., Ltd.
DRK135A Falling Dart Impact Tester is applicable in the impact result and energy measurement of the falling dart from a certain height against plastic films and sheets with thickness less than 1mm, which would result in 50% tested specimen failure.
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Product
Reticle Manufacturing
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An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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Product
Multiple Angle Reflectometry
FilmTek 4000
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Scientific Computing International
Fully-automated wafer metrology optimized for photonic integrated circuit manufacturing. Delivers unmatched measurement accuracy, with a 100x performance advantage over the best non-contact method and 10x that of the best prism coupler contact systems. Designed to enable optical component manufacturers to increase functional yield of their products, reliably and at lower cost.
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Product
Thick Film Passive Element
GBR-183
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GBR-183 series resistors are made in a thick film technology, on ceramic substrates(Al2O3 -96%). Thick film resistors are characterized by a higher stability, and lower noises than a typical carbon resistors. The whole of resistor is encapsulated with epoxy resin by fluidization process. GBR-183 series elements are used both for general, and professional applications.
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Product
6-Axis Robotic Automated Testing System
AT6
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The Instron AT6 is a flexible, robot-assisted testing solution featuring six axes of motion, purpose-built to automate tensile, compression, flexural, and lap shear testing in alignment with widely used ASTM and ISO standards. Its modular design accommodates a broad array of materials—including metals, polymers, elastomers, films, composites, and sutures—at force capacities up to 600 kN. Capable of processing up to 500 specimens without operator intervention, the AT6 enables true unattended or “lights-out” operation, significantly increasing throughput around the clock. Optional modules include stations for specimen measurement, automated strain measurement, environmental temperature chambers, and multiple test frames for simultaneous testing. The system also integrates smoothly with auxiliary devices such as durometers, hardness testers, and surface roughness testers, making it a robust solution for high-volume, high-efficiency testing environments.
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Product
ADT-01 Primary Adhesive Tester
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Jinan Leading Instruments Co., Ltd.
ADT-01 Primary Adhesive Tester is applicable in primary adhesive tests of pressure sensitive adhesive tapes, adhesive bandage (plaster), label, protective films and other products.
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Product
Film Capacitors
Automotive, Industrial and Infrastructure Use
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Panasonic Industrial Devices Sales Company of America
Film Capacitors for high voltage and high current applications. Used as smoothers, filters and snubbers in HEV/EV and industrial inverters.
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Product
Transducer / Transmitter
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General purpose industrial pressure transducer provides outstanding integrity concerning high shock, vibration and pressure cycling. Utilizing high-performance ASIC, digital compensation provides excellent temperature performance, while the thin film sensor enables long-term stability.
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Product
Digital Camera Hop Transmitter
DCHT
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The DCHT portable digital stereo transmitter is designed for use in film and TV production as both a wireless audio link from a bag or cart system to cameras and as a portable IFB transmitter paired with the Duet digital wireless M2R receiver packs. The DCHT accepts two channels of mic or line level analog signals or an AES digital signal from a mixer and transmits to the receiver or receivers in a purely digital format. The digital architecture of the new DCHT is a third-generation design with specially developed, high-efficiency circuitry for extended operating time on two AA batteries.
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Product
Programmable Step Attenuator, DC to 26.5 GHz, 0 to 70 dB, 10 dB steps
84907K
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The Keysight 84907K programmable step attenuator offers coaxial measurements to 26.5 GHz in a compact, rugged design. It offers repeatability of better than 0.03 dB, excellent life (greater than 5 million switching cycles per section) and an attenuation range of 0 to 70 dB in 10-dB steps. This latest design evolution sets new standards for size and performance. High attenuation accuracy and low SWR are achieved through the use of miniature thin-film attenuation cards composed of high-stability tantalum nitride film of saphire substrate. Insertion loss is outstanding, with less than 2 dB of loss at 26.5 GHz. The compact size of the unit, 35 percent smaller than the Keysight 8495/7 26.5 GHz) family, allows for easy integration into instruments and ATE systems.
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Product
Low Noise Amplifier
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Low noise amplifiers, or LNAs, are designed and manufactured by utilizing the most advanced PHEMT or MMIC devices, thin film technologies, and an improved DC power supply to deliver a low noise performance with broad operating bandwidths and good gain flatness. While standard models focus on general purpose applications, additional models with differing frequency ranges, gains and noise figures are listed on the website. Custom designs are also offered to meet any user’s specific needs.
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Product
Explosion Proof In-line Hydrogen Process Analyzer
HY-OPTIMA™ 2700 Series
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The HY-OPTIMA™ 2700 Series uses a solid-state, non consumable sensor that is configured to operate in process gas streams. The H2scan thin film technology provides a direct hydrogen measurement that is not cross sensitive to other gases. The HY-OPTIMA™ 2700 Series is ideal for applications where real-time, hydrogen specific measurements can enhance process plant efficiencies, diagnostics and maintenance management.
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Product
Spectroradiometer
Spectrascan® PR 788
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The SpectraScan® Spectroradiometer PR-788 Extended Dynamic Range is JADAK’s ultra-sensitivity portable solution for spectral based photometric and colorimetric light measurements, designed for applications requiring precise light measurements from a range of light sources, such as display monitors and projectors, reflective surfaces, and industrial applications (visual display testing, LED testing, film and video post-production, auto/aerospace displays, and dental color testing).
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Product
Non-Contacting Video Extensometer
AVE3
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The AVE3 is Instron’s most advanced extensometer, engineered for high-precision, non-contact strain measurement across a wide range of mechanical tests—including tension, compression, and flexure. Its adaptable design accommodates various specimen types, sizes, and elongation ranges, making it ideal for everything from delicate films to robust metals. By eliminating the need for clip-on devices, the AVE3 streamlines setup and ensures uninterrupted data collection through specimen failure, even in high-energy break scenarios, such as composites. Compatible with environmental chambers and fluid baths, it supports non-ambient testing with ease. With compliance to ISO 9513 and ASTM E83 and a fast 500 Hz data rate, the AVE3 delivers reliable performance for demanding testing standards.
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Product
Customized Ellipsometers
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~0.1 nm thickness difference can be seen by IE-1000.Thickness distribution of thin film can be imaged.Thickness and optical images of semiconductor device, display, and bio samples.IE-1000 can show the images which can not be seen by conventional microscope.Defect of semiconductor and display can be seen directly.Easy and fast operation.
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Product
For AIM-65 And AIM-75S
8" AG+AR Screen Protection Film
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Surface Hardness: 2 ~ 3HReflection Rate: 0.15%Haze: 15%Dimensions: 212 x 128 x 0.15 mm/ 8.35 x 5.04 x 0.006 inWeight: 0.009 kg/0.02 lb
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Product
Micro-spot DUV Spectroscopic Reflectometry
FilmTek 2000 PAR
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Scientific Computing International
A low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. Utilizes patented parabolic mirror technology to measure wavelengths from DUV to NIR with a spot size as small as 13µm. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter.
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Product
Measuring And Inspection Systems For Extrusion, Injection Molding & Calendering Of Plastics And Films
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Measuring and inspection systems from Micro-Epsilon are used in the plastics processing industry in order to ensure efficient production.
